J. J. Hinarejos
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- Surface and Thin Film Phenomena 33
- Semiconductor materials and interfaces 14
- Quantum and electron transport phenomena 9
- Magnetic properties of thin films 7
- Advanced Chemical Physics Studies 7
- Materials Chemistry top 5%
- Graphene research and applications 12
- Chemical and Physical Properties of Materials 5
- Surfaces, Coatings and Films top 10%
- Condensed Matter Physics top 10%
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- Advanced Materials Characterization Techniques 14
J. J. Hinarejos
46 papers receiving 1.8k citations
Hit Papers
Peers
Comparison fields: 5 of 49
- Atomic and Molecular Physics, and Optics 1.2k
- Materials Chemistry 1.3k
- Surfaces, Coatings and Films 72
- Electrical and Electronic Engineering 581
- Condensed Matter Physics 111
Countries citing papers authored by J. J. Hinarejos
This map shows the geographic impact of J. J. Hinarejos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. J. Hinarejos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. J. Hinarejos more than expected).
Fields of papers citing papers by J. J. Hinarejos
This network shows the impact of papers produced by J. J. Hinarejos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. J. Hinarejos. The network helps show where J. J. Hinarejos may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. J. Hinarejos, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 27 | |
| 2 | 2011 | 110 | |
| 3 | 2011 | 64 | |
| 4 | 2010 | 77 | |
| 5 | 2010 | 86 | |
| 6 | 2010 | 6 | |
| 7 | 2010 | 8 | |
| 8 | 2009 | 40 | |
| 9 | 2009 | 19 | |
| 10 | Periodically Rippled Graphene: Growth and Spatially Resolved Electronic Structurebreakdown → | 2008 | 519 |
| 11 | 2007 | 2 | |
| 12 | 2006 | 16 | |
| 13 | 2006 | 12 | |
| 14 | 2005 | 26 | |
| 15 | 2004 | 58 | |
| 16 | 2000 | 30 | |
| 17 | 1997 | 19 | |
| 18 | 1995 | 6 | |
| 19 | 1993 | 79 | |
| 20 | 1991 | 26 |
About J. J. Hinarejos
J. J. Hinarejos is a scholar working on Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Biomedical Engineering, having authored 46 papers that have together received 1.9k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (33 papers), Semiconductor materials and interfaces (14 papers), Advanced Materials Characterization Techniques (14 papers), Graphene research and applications (12 papers), Quantum and electron transport phenomena (9 papers), Magnetic properties of thin films (7 papers), Advanced Chemical Physics Studies (7 papers) and Chemical and Physical Properties of Materials (5 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.2k citations), Materials Chemistry (1.3k citations) and Surfaces, Coatings and Films (72 citations). J. J. Hinarejos has collaborated with scholars based in Spain, Germany and Argentina. Frequent co-authors include Rodolfo Miranda, Amadeo L. Vázquez de Parga, Bogdana Borca, F. Calleja, M.C.G. Passeggi, F. Guinea, E. G. Michel, J. Álvarez, Sara Barja and Manuela Garnica. Their work appears in journals such as Physical Review Letters, Advanced Materials and Physical review. B, Condensed matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.