J. Grzanna

1.2k total citations · 1 hit paper
26 papers, 954 citations indexed

About

J. Grzanna is a scholar working on Computer Vision and Pattern Recognition, Mechanical Engineering and Computational Mechanics. According to data from OpenAlex, J. Grzanna has authored 26 papers receiving a total of 954 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Computer Vision and Pattern Recognition, 11 papers in Mechanical Engineering and 10 papers in Computational Mechanics. Recurrent topics in J. Grzanna's work include Optical measurement and interference techniques (11 papers), Advanced Measurement and Metrology Techniques (10 papers) and Silicon Nanostructures and Photoluminescence (10 papers). J. Grzanna is often cited by papers focused on Optical measurement and interference techniques (11 papers), Advanced Measurement and Metrology Techniques (10 papers) and Silicon Nanostructures and Photoluminescence (10 papers). J. Grzanna collaborates with scholars based in Germany, Morocco and Spain. J. Grzanna's co-authors include R. Burow, R. Spolaczyk, K.-E. Elßner, Johannes Schwider, Günter Schulz, H. J. Lewerenz, H. Jungblut, Andreas Vogel, Katarzyna Skorupska and M. Aggour and has published in prestigious journals such as Journal of The Electrochemical Society, Journal of materials research/Pratt's guide to venture capital sources and Journal of Electroanalytical Chemistry.

In The Last Decade

J. Grzanna

24 papers receiving 868 citations

Hit Papers

Digital wave-front measuring interferometry: some systema... 1983 2026 1997 2011 1983 100 200 300 400 500
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Digital wave-front measuring interferometry: some systematic error sources
    1983 552 citations Johannes Schwider, R. Burow et al. Applied Optics profile →

Peers

J. Grzanna
C. Joenathan United States
Paul Dumas United States
R. Burow Germany
Gaoliang Dai Germany
J. E. Greivenkamp United States
K.-E. Elßner Germany
R. Spolaczyk Germany
Guipeng Tie China
Cruz Meneses-Fabián Mexico
Jungjae Park South Korea
C. Joenathan United States
J. Grzanna
Citations per year, relative to J. Grzanna J. Grzanna (= 1×) peers C. Joenathan

Countries citing papers authored by J. Grzanna

Since Specialization
Citations

This map shows the geographic impact of J. Grzanna's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Grzanna with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Grzanna more than expected).

Fields of papers citing papers by J. Grzanna

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Grzanna. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Grzanna. The network helps show where J. Grzanna may publish in the future.

Co-authorship network of co-authors of J. Grzanna

This figure shows the co-authorship network connecting the top 25 collaborators of J. Grzanna. A scholar is included among the top collaborators of J. Grzanna based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Grzanna. J. Grzanna is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Grzanna, J. & H. J. Lewerenz. (2014). Analogy between electrochemical oscillations and quantum physical processes. Journal of Physics Conference Series. 490. 12119–12119.
2.
Grzanna, J., et al.. (2010). Structure formation at the nanometric scale during current oscillations at the Si/electrolyte contact. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 8(6). 1734–1738. 6 indexed citations
3.
Grzanna, J., et al.. (2009). Stress induced one‐dimensional model for current oscillations at the Si/electrolyte contact. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 6(7). 1639–1643. 10 indexed citations
4.
Lewerenz, H. J., et al.. (2008). Photoactive nanostructure device by electrochemical processing of silicon. Journal of Electroanalytical Chemistry. 619-620. 137–142. 10 indexed citations
5.
Lewerenz, H. J., et al.. (2008). Surface chemistry and electronics of semiconductor–nanosystem junctions I: metal-nanoemitter-based solar cells. Journal of Solid State Electrochemistry. 13(2). 185–194. 6 indexed citations
6.
Grzanna, J., H. Jungblut, & H. J. Lewerenz. (2007). Nano‐ and macropores in the model for current oscillations at the Si/electrolyte contact. physica status solidi (a). 204(5). 1245–1249. 17 indexed citations
7.
Grzanna, J., H. Jungblut, & H. J. Lewerenz. (2000). A model for electrochemical oscillations at the Si∣electrolyte contact. Journal of Electroanalytical Chemistry. 486(2). 190–203. 31 indexed citations
8.
Grzanna, J., H. Jungblut, & H. J. Lewerenz. (2000). A model for electrochemical oscillations at the Si∣electrolyte contact. Journal of Electroanalytical Chemistry. 486(2). 181–189. 36 indexed citations
9.
Grzanna, J., et al.. (1997). Chemical stability of CuInS2 in oxygen at 298 K. Journal of materials research/Pratt's guide to venture capital sources. 12(2). 355–363. 5 indexed citations
10.
Vogel, Andreas, et al.. (1994). Establishing a flatness standard. Applied Optics. 33(13). 2437–2437. 27 indexed citations
11.
Grzanna, J., et al.. (1994). Thermochemistry in the system Cu–In–S at 723 K. Journal of materials research/Pratt's guide to venture capital sources. 9(1). 125–131. 21 indexed citations
12.
Grzanna, J.. (1994). Absolute testing of optical flats at points on a square grid: error propagation. Applied Optics. 33(28). 6654–6654. 16 indexed citations
13.
Grzanna, J. & Günter Schulz. (1990). Absolute testing of flatness standards at square-grid points. Optics Communications. 77(2-3). 107–112. 27 indexed citations
14.
Burow, R., et al.. (1989). Absolute sphericity measurement. Applied Optics. 28(21). 4649–4649. 46 indexed citations
15.
Schwider, Johannes, R. Burow, K.-E. Elßner, J. Grzanna, & R. Spolaczyk. (1986). Semiconductor wafer and technical flat planeness testing interferometer. Applied Optics. 25(7). 1117–1117. 18 indexed citations
16.
Schönnagel, H., et al.. (1986). A high energy laser with controlled coherence. Laser and Particle Beams. 4(3-4). 453–460. 1 indexed citations
17.
Schwider, Johannes, R. Burow, K.-E. Elßner, R. Spolaczyk, & J. Grzanna. (1985). Homogeneity testing by phase sampling interferometry. Applied Optics. 24(18). 3059–3059. 30 indexed citations
18.
Grzanna, J., et al.. (1982). Laser fusion target illumination optimization with consideration of the beam divergence. 1 indexed citations
19.
Elßner, K.-E., J. Grzanna, & Günter Schulz. (1980). Interferentielle Absolutprüfung Von Sphärizitätsnormalen. Optica Acta International Journal of Optics. 27(4). 563–580. 11 indexed citations
20.
Schwider, Johannes, J. Grzanna, R. Spolaczyk, & R. Burow. (1980). Testing Aspherics in Reflected Light Using Blazed Synthetic Holograms. Optica Acta International Journal of Optics. 27(5). 683–698. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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