I.V. Mitchell

822 total citations
41 papers, 669 citations indexed

About

I.V. Mitchell is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, I.V. Mitchell has authored 41 papers receiving a total of 669 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 15 papers in Atomic and Molecular Physics, and Optics and 14 papers in Computational Mechanics. Recurrent topics in I.V. Mitchell's work include Ion-surface interactions and analysis (13 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (7 papers). I.V. Mitchell is often cited by papers focused on Ion-surface interactions and analysis (13 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (7 papers). I.V. Mitchell collaborates with scholars based in Canada, United States and United Kingdom. I.V. Mitchell's co-authors include W.N. Lennard, P.R. Norton, M‐A. Nicolet, Joel M. Harris, Ronald S. Nowicki, H.R. Andrews, D. Ward, Robert B. Walker, B. W. Farmery and R.S. Nelson and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Physical Review A.

In The Last Decade

I.V. Mitchell

41 papers receiving 620 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
I.V. Mitchell Canada 13 302 195 189 140 116 41 669
G. Kuri India 18 440 1.5× 245 1.3× 252 1.3× 218 1.6× 156 1.3× 67 842
Y. Chen United States 16 675 2.2× 272 1.4× 146 0.8× 145 1.0× 61 0.5× 32 831
H. T. Tohver United States 13 476 1.6× 131 0.7× 128 0.7× 59 0.4× 86 0.7× 24 622
V. E. Puchin Latvia 11 314 1.0× 119 0.6× 228 1.2× 52 0.4× 79 0.7× 16 500
Hiroo Kato Japan 19 524 1.7× 365 1.9× 251 1.3× 66 0.5× 29 0.3× 61 904
Herbert N. Hersh United States 16 625 2.1× 321 1.6× 241 1.3× 84 0.6× 85 0.7× 37 935
T W Ryan United Kingdom 14 371 1.2× 108 0.6× 153 0.8× 51 0.4× 70 0.6× 33 589
Daiichiro Sekiba Japan 17 418 1.4× 261 1.3× 213 1.1× 161 1.1× 30 0.3× 67 736
M.A. Karolewski Canada 12 255 0.8× 123 0.6× 185 1.0× 201 1.4× 28 0.2× 50 535
T. E. Madey United States 12 326 1.1× 194 1.0× 158 0.8× 46 0.3× 29 0.3× 26 566

Countries citing papers authored by I.V. Mitchell

Since Specialization
Citations

This map shows the geographic impact of I.V. Mitchell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I.V. Mitchell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I.V. Mitchell more than expected).

Fields of papers citing papers by I.V. Mitchell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by I.V. Mitchell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I.V. Mitchell. The network helps show where I.V. Mitchell may publish in the future.

Co-authorship network of co-authors of I.V. Mitchell

This figure shows the co-authorship network connecting the top 25 collaborators of I.V. Mitchell. A scholar is included among the top collaborators of I.V. Mitchell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with I.V. Mitchell. I.V. Mitchell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ruffell, S., et al.. (2005). Solid phase epitaxial regrowth of amorphous layers in silicon created by low energy phosphorus implantation: A medium energy ion scattering study. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 242(1-2). 591–594. 4 indexed citations
2.
Haysom, Joan E., A. Delâge, Jian‐Jun He, et al.. (1999). Experimental analysis and modeling of buried waveguides fabricated by quantum-well intermixing. IEEE Journal of Quantum Electronics. 35(9). 1354–1363. 4 indexed citations
3.
Alkemade, P.F.A., et al.. (1996). Spectra of secondary electrons induced by channeled and nonchanneled ions in Si and Al. Physical Review A. 53(2). 886–894. 6 indexed citations
4.
Mitchell, I.V., et al.. (1996). Electrical isolation of pin photodiode devices by oxygen ion bombardment. Canadian Journal of Physics. 74(S1). 59–63. 1 indexed citations
5.
Huang, L. J., W. M. Lau, Hong Tang, et al.. (1996). Structure of the SiNx/GaAs (110) interface modified with ultrathin Si and sulfur passivation. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(4). 2895–2900. 2 indexed citations
6.
Lennard, W.N., et al.. (1994). Azimuthally averaged backscattering yield near the 〈100〉 axis in Si. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 90(1-4). 161–165. 15 indexed citations
7.
Chang, Wen-Hsin, et al.. (1994). Analysis and removal of impurities and defects in reactive ion etched silicon using a novel depth-profiling technique. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 12(4). 2357–2362. 4 indexed citations
8.
Mitchell, I.V., et al.. (1993). Implant-damage isolation of InP and InGaAsP. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 11(4). 1016–1021. 10 indexed citations
9.
Simpson, P. J., et al.. (1992). Ion Implantation Damage in Silicon Studied Using Slow Positrons, RBS and Infrared Absorption. Materials science forum. 105-110. 1439–1442. 1 indexed citations
10.
Mitchell, I.V., et al.. (1991). The initial oxidation of Zr(0001): 0 to 0.5 monolayers. Surface Science. 245(3). 373–379. 54 indexed citations
11.
Mitchell, I.V.. (1990). Pillared layered structures : current trends and applications. Elsevier eBooks. 192 indexed citations
12.
Alkemade, P.F.A., et al.. (1990). Ion-induced Auger electron studies on Al(110). Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 45(1-4). 637–640. 6 indexed citations
13.
Tong, S. Y., W.N. Lennard, P.F.A. Alkemade, & I.V. Mitchell. (1990). Absolute surface carbon coverage determination via the 12C(3He, p)14N reaction. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 45(1-4). 91–94. 12 indexed citations
14.
Simpson, P. J., Peter J. Schultz, I.V. Mitchell, T. E. Jackman, & G. C. Aers. (1989). Defects in MBE-grown Silicon Epilayers Studied with Variable-Energy Positrons. MRS Proceedings. 163. 3 indexed citations
15.
Lennard, W.N., David Phillips, I.V. Mitchell, H.R. Andrews, & D. Ward. (1984). Dependence of specific energy loss on target thickness for low velocity ions: 16O → C. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 2(1-3). 153–155. 5 indexed citations
16.
Shepherd, F. R., W. D. Westwood, P. J. Scanlon, et al.. (1981). Effect of ion implantation on CdSe thin film transistors. Journal of Vacuum Science and Technology. 18(3). 899–902. 1 indexed citations
17.
Ward, D., et al.. (1979). Systematics for the Z1-oscillation in stopping powers of various solid materials. Canadian Journal of Physics. 57(5). 645–656. 83 indexed citations
18.
Mitchell, I.V., et al.. (1979). Modeling UHV systems with polystyrene. Journal of Vacuum Science and Technology. 16(1). 88–89. 4 indexed citations
19.
Nowicki, Ronald S., Joel M. Harris, M‐A. Nicolet, & I.V. Mitchell. (1978). Studies of the Ti-W/Au metallization on aluminum. Thin Solid Films. 53(2). 195–205. 63 indexed citations
20.
Mitchell, I.V., et al.. (1971). Gas incorporation in sputtered and evaporated gold films. Vacuum. 21(12). 591–595. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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