I.J. Saunders
Impact in
-
- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
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- Crystallization and Solubility Studies
- Solidification and crystal growth phenomena
Papers in
- Co-authors
- D. SayahA. MzerdB.K. JonesJeroen HeijmansWill SaundersJurek BrzeskiHedser van BrugMichael Goodwin
- Journals
- IEEE Electron Device Letters (1 paper)Materials Chemistry and Physics (1 paper)Journal of Physics D Applied Physics (1 paper)Solid-State Electronics (1 paper)Applied Physics Letters (1 paper)
- Partner nations
- United KingdomNetherlandsUnited States
In The Last Decade
I.J. Saunders
17 papers receiving 477 citations
Peers
Comparison fields: 5 of 54
- Atomic and Molecular Physics, and Optics 212
- Materials Chemistry 252
- Electrical and Electronic Engineering 264
- Instrumentation 13
- Ceramics and Composites 18
Countries citing papers authored by I.J. Saunders
This map shows the geographic impact of I.J. Saunders's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I.J. Saunders with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I.J. Saunders more than expected).
Fields of papers citing papers by I.J. Saunders
This network shows the impact of papers produced by I.J. Saunders. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I.J. Saunders. The network helps show where I.J. Saunders may publish in the future.
Co-authorship network
The 21 scholars most cited alongside I.J. Saunders, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2010 | 7 | |
| 2 | 2010 | 6 | |
| 3 | 2006 | 8 | |
| 4 | Nanometer Accuracy Non-contact Measurement of Free-form Optical Surfaces | 2005 | 0 |
| 5 | 2005 | 15 | |
| 6 | 2005 | 3 | |
| 7 | 2004 | 5 | |
| 8 | 1992 | 2 | |
| 9 | 1990 | 8 | |
| 10 | 1983 | 1 | |
| 11 | 1983 | 3 | |
| 12 | 1980 | 16 | |
| 13 | 1979 | 351 | |
| 14 | 1975 | 15 | |
| 15 | 1973 | 1 | |
| 16 | 1969 | 53 | |
| 17 | 1968 | 5 | |
| 18 | 1967 | 19 |
About I.J. Saunders
I.J. Saunders is a scholar working on Instrumentation, Surfaces, Coatings and Films, Radiation, Computational Mechanics and Electrical and Electronic Engineering, having authored 18 papers that have together received 518 indexed citations. Recurring topics across this work include Semiconductor materials and devices (4 papers), Advanced Measurement and Metrology Techniques (3 papers), Semiconductor materials and interfaces (3 papers), Advanced Surface Polishing Techniques (3 papers), Adaptive optics and wavefront sensing (2 papers), Quantum Dots Synthesis And Properties (2 papers), Nuclear Physics and Applications (2 papers) and Chalcogenide Semiconductor Thin Films (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (212 citations), Materials Chemistry (252 citations), Electrical and Electronic Engineering (264 citations), Instrumentation (13 citations) and Ceramics and Composites (18 citations). I.J. Saunders has collaborated with scholars based in United Kingdom, Netherlands and United States. Frequent co-authors include D. Sayah, A. Mzerd, B.K. Jones, Jeroen Heijmans, Will Saunders, Jurek Brzeski, Hedser van Brug, Michael Goodwin, Eli Atad‐Ettedgui and Roger Haynes. Their work appears in journals such as IEEE Electron Device Letters, Materials Chemistry and Physics, Journal of Physics D Applied Physics, Solid-State Electronics and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.