I. Heyvaert

611 total citations
12 papers, 497 citations indexed

About

I. Heyvaert is a scholar working on Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Electrical and Electronic Engineering. According to data from OpenAlex, I. Heyvaert has authored 12 papers receiving a total of 497 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Atomic and Molecular Physics, and Optics, 5 papers in Condensed Matter Physics and 3 papers in Electrical and Electronic Engineering. Recurrent topics in I. Heyvaert's work include Surface and Thin Film Phenomena (5 papers), Magnetic properties of thin films (4 papers) and Force Microscopy Techniques and Applications (3 papers). I. Heyvaert is often cited by papers focused on Surface and Thin Film Phenomena (5 papers), Magnetic properties of thin films (4 papers) and Force Microscopy Techniques and Applications (3 papers). I. Heyvaert collaborates with scholars based in Belgium, Germany and France. I. Heyvaert's co-authors include Y. Bruynseraede, J. Krim, C. Van Haesendonck, L. Hellemans, C. Van Haesendonck, E. Osquiguil, Anja Vinckier, Chris Van Haesendonck, Yves Engelborghs and L. Stockman and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Ultramicroscopy.

In The Last Decade

I. Heyvaert

12 papers receiving 474 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
I. Heyvaert Belgium 9 253 202 150 130 121 12 497
Y. H. Phang United States 8 466 1.8× 205 1.0× 278 1.9× 219 1.7× 209 1.7× 10 787
J. Kuběna Czechia 11 230 0.9× 178 0.9× 134 0.9× 258 2.0× 136 1.1× 39 540
W. Hösler Germany 13 298 1.2× 255 1.3× 78 0.5× 220 1.7× 268 2.2× 24 685
Matthew Pelliccione United States 7 172 0.7× 75 0.4× 114 0.8× 255 2.0× 159 1.3× 12 465
T.J. Bullough United Kingdom 16 405 1.6× 180 0.9× 90 0.6× 234 1.8× 399 3.3× 66 677
R. P. U. Karunasiri United States 5 60 0.2× 148 0.7× 128 0.9× 159 1.2× 95 0.8× 7 349
B. Y. Mueller Germany 8 317 1.3× 55 0.3× 173 1.2× 104 0.8× 126 1.0× 14 522
Leroy L. Chang United States 4 434 1.7× 100 0.5× 37 0.2× 221 1.7× 282 2.3× 5 629
J.‐K. Zuo United States 14 482 1.9× 325 1.6× 141 0.9× 275 2.1× 173 1.4× 34 855
Matthew Wormington United States 11 222 0.9× 64 0.3× 100 0.7× 176 1.4× 281 2.3× 44 597

Countries citing papers authored by I. Heyvaert

Since Specialization
Citations

This map shows the geographic impact of I. Heyvaert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I. Heyvaert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I. Heyvaert more than expected).

Fields of papers citing papers by I. Heyvaert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by I. Heyvaert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I. Heyvaert. The network helps show where I. Heyvaert may publish in the future.

Co-authorship network of co-authors of I. Heyvaert

This figure shows the co-authorship network connecting the top 25 collaborators of I. Heyvaert. A scholar is included among the top collaborators of I. Heyvaert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with I. Heyvaert. I. Heyvaert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

12 of 12 papers shown
1.
Li, Hua, et al.. (2000). Characterization of WF6/N2/H2 plasma enhanced chemical vapor deposited WxN films as barriers for Cu metallization. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(1). 242–251. 16 indexed citations
2.
Heyvaert, I., M. Van Hove, Ann Witvrouw, et al.. (2000). Effect of oxide and W-CMP on the material properties and electromigration behaviour of layered aluminum metallisations. Microelectronic Engineering. 50(1-4). 291–299. 7 indexed citations
3.
Heyvaert, I., J. Krim, C. Van Haesendonck, & Y. Bruynseraede. (1996). Surface morphology and kinetic roughening of Ag on Ag(111) studied with scanning tunneling microscopy. Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics. 54(1). 349–353. 11 indexed citations
4.
Heyvaert, I., K. Temst, C. Van Haesendonck, & Y. Bruynseraede. (1996). Comparative study of the interface roughness of Ag/Au and Cu/Au multilayers with scanning tunneling microscopy and x-ray diffraction. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 1121–1125. 9 indexed citations
5.
Vinckier, Anja, et al.. (1995). Immobilizing and imaging microtubules by atomic force microscopy. Ultramicroscopy. 57(4). 337–343. 50 indexed citations
6.
Wagner, Patrick, Urban Frey, G. Jakob, et al.. (1994). Characterization of epitaxial Bi2Sr2CaCu2O8+? thin films. Journal of Superconductivity. 7(1). 217–219. 4 indexed citations
7.
Gao, Z.X., I. Heyvaert, B. Wuyts, et al.. (1994). Evidence for a ‘‘brick wall’’ microstructure in epitaxial YBa2Cu3Ox films. Applied Physics Letters. 65(6). 770–772. 3 indexed citations
8.
Krim, J., I. Heyvaert, C. Van Haesendonck, & Y. Bruynseraede. (1993). Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces. Physical Review Letters. 70(1). 57–60. 280 indexed citations
9.
Wagner, Patrick, Urban Frey, H. Adrian, et al.. (1993). Preparation and structural characterization of thin epitaxial Bi2Sr2CaCu2O8+δ films with Tc in the 90 K range. Physica C Superconductivity. 215(1-2). 123–131. 46 indexed citations
10.
Heyvaert, I., E. Osquiguil, C. Van Haesendonck, & Y. Bruynseraede. (1992). Etching of screw dislocations in YBa2Cu3O7 films with a scanning tunneling microscope. Applied Physics Letters. 61(1). 111–113. 33 indexed citations
11.
Stockman, L., et al.. (1992). Topographic study of thin gold films grown on SiO2. Ultramicroscopy. 42-44. 1317–1320. 10 indexed citations
12.
Hellemans, L., et al.. (1991). Can atomic force microscopy tips be inspected by atomic force microscopy?. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(2). 1309–1312. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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