I. Bartoš
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 38
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- Advanced Chemical Physics Studies 32
- Surface and Thin Film Phenomena 26
- Quantum and electron transport phenomena 6
- Structural Biology top 5%
- Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials 8
- Electrochemistry top 5%
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- Photocathodes and Microchannel Plates 15
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- Ga2O3 and related materials 12
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- X-ray Spectroscopy and Fluorescence Analysis 9
I. Bartoš
75 papers receiving 1.4k citations
Hit Papers
Peers
Comparison fields: 5 of 53
- Surfaces, Coatings and Films 292
- Atomic and Molecular Physics, and Optics 959
- Structural Biology 39
- Condensed Matter Physics 211
- Electrochemistry 102
Countries citing papers authored by I. Bartoš
This map shows the geographic impact of I. Bartoš's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I. Bartoš with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I. Bartoš more than expected).
Fields of papers citing papers by I. Bartoš
This network shows the impact of papers produced by I. Bartoš. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I. Bartoš. The network helps show where I. Bartoš may publish in the future.
Co-authorship network
The 25 scholars most cited alongside I. Bartoš, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2021 | 5 | |
| 2 | 2017 | 6 | |
| 3 | 2012 | 1 | |
| 4 | 2008 | 8 | |
| 5 | 2008 | 1 | |
| 6 | 2004 | 0 | |
| 7 | 2003 | 2 | |
| 8 | 2003 | 1 | |
| 9 | 1995 | 28 | |
| 10 | 1994 | 43 | |
| 11 | 1993 | 2 | |
| 12 | 1991 | 6 | |
| 13 | 1985 | 4 | |
| 14 | 1982 | 27 | |
| 15 | 1978 | 3 | |
| 16 | 1978 | 8 | |
| 17 | 1976 | 3 | |
| 18 | 1971 | 45 | |
| 19 | 1969 | 6 | |
| 20 | 1967 | 4 |
About I. Bartoš
I. Bartoš is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Radiation, Condensed Matter Physics and Structural Biology, having authored 79 papers that have together received 1.5k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (38 papers), Advanced Chemical Physics Studies (32 papers), Surface and Thin Film Phenomena (26 papers), Photocathodes and Microchannel Plates (15 papers), Ga2O3 and related materials (12 papers), X-ray Spectroscopy and Fluorescence Analysis (9 papers), GaN-based semiconductor devices and materials (8 papers) and Quantum and electron transport phenomena (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (292 citations), Atomic and Molecular Physics, and Optics (959 citations), Structural Biology (39 citations), Condensed Matter Physics (211 citations) and Electrochemistry (102 citations). I. Bartoš has collaborated with scholars based in Czechia, Germany and United States. Frequent co-authors include M.A. Van Hove, Jean-Paul Bibérian, Peter C. Stair, L. L. Kesmodel, R.J. Koestner, Gábor A. Somorjai, P. Jiřı́ček, Oleksandr Romanyuk, B. Velický and B. Rosenstein. Their work appears in journals such as Surface Science, physica status solidi (b), Applied Surface Science, Journal of Electron Spectroscopy and Related Phenomena and Surface Review and Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.