H.‐J. Müssig

2.0k total citations
77 papers, 1.7k citations indexed

About

H.‐J. Müssig is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, H.‐J. Müssig has authored 77 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 55 papers in Electrical and Electronic Engineering, 39 papers in Materials Chemistry and 28 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in H.‐J. Müssig's work include Semiconductor materials and devices (54 papers), Semiconductor materials and interfaces (19 papers) and Electronic and Structural Properties of Oxides (19 papers). H.‐J. Müssig is often cited by papers focused on Semiconductor materials and devices (54 papers), Semiconductor materials and interfaces (19 papers) and Electronic and Structural Properties of Oxides (19 papers). H.‐J. Müssig collaborates with scholars based in Germany, Poland and Russia. H.‐J. Müssig's co-authors include J. Da̧browski, Christian Wenger, G. A. Wolff, P. Zaumseil, Thomas Schroeder, Grzegorz Łupina, H. J. Osten, W. Arabczyk, G. Lippert and Mindaugas Lukosius and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

H.‐J. Müssig

77 papers receiving 1.6k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H.‐J. Müssig Germany 26 1.2k 968 422 256 146 77 1.7k
C. N. Whang South Korea 24 1.2k 1.0× 752 0.8× 382 0.9× 209 0.8× 112 0.8× 123 1.8k
W. K. Choi Singapore 23 1.3k 1.0× 1.1k 1.1× 352 0.8× 298 1.2× 167 1.1× 78 1.9k
T.‐M. Lu United States 20 724 0.6× 579 0.6× 611 1.4× 335 1.3× 114 0.8× 76 1.4k
C. Guerret-Piécourt France 15 559 0.5× 806 0.8× 195 0.5× 130 0.5× 181 1.2× 31 1.3k
C. Mathieu France 19 806 0.7× 894 0.9× 190 0.5× 227 0.9× 78 0.5× 55 1.4k
P. Bayle‐Guillemaud France 20 855 0.7× 778 0.8× 690 1.6× 468 1.8× 94 0.6× 59 1.7k
N. David Theodore United States 23 1.2k 1.0× 677 0.7× 318 0.8× 212 0.8× 53 0.4× 106 1.6k
G. Couturier France 19 761 0.6× 778 0.8× 429 1.0× 102 0.4× 54 0.4× 75 1.4k
Erwin Hüger Germany 20 1.0k 0.8× 533 0.6× 563 1.3× 243 0.9× 45 0.3× 83 1.5k
R. Droopad United States 19 978 0.8× 1.1k 1.2× 389 0.9× 456 1.8× 91 0.6× 44 1.6k

Countries citing papers authored by H.‐J. Müssig

Since Specialization
Citations

This map shows the geographic impact of H.‐J. Müssig's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.‐J. Müssig with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.‐J. Müssig more than expected).

Fields of papers citing papers by H.‐J. Müssig

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.‐J. Müssig. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.‐J. Müssig. The network helps show where H.‐J. Müssig may publish in the future.

Co-authorship network of co-authors of H.‐J. Müssig

This figure shows the co-authorship network connecting the top 25 collaborators of H.‐J. Müssig. A scholar is included among the top collaborators of H.‐J. Müssig based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H.‐J. Müssig. H.‐J. Müssig is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Łupina, Grzegorz, O. Seifarth, Grzegorz Kozłowski, et al.. (2009). Hf- and Zr-based alkaline earth perovskite dielectrics for memory applications. Microelectronic Engineering. 86(7-9). 1842–1844. 23 indexed citations
2.
Schroeder, Thomas, A. Giussani, J. Da̧browski, et al.. (2009). Engineered Si wafers: On the role of oxide heterostructures as buffers for the integration of alternative semiconductors. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 6(3). 653–662. 26 indexed citations
3.
Lukosius, Mindaugas, Christian Wenger, Sergej Pasko, et al.. (2008). Atomic Vapor Deposition of Strontium Tantalate Films for MIM Applications. IEEE Transactions on Electron Devices. 55(8). 2273–2277. 18 indexed citations
4.
Łupina, Grzegorz, Thomas Schroeder, J. Da̧browski, et al.. (2006). Praseodymium silicate films on Si(100) for gate dielectric applications: Physical and electrical characterization. Journal of Applied Physics. 99(11). 42 indexed citations
5.
Mane, Anil U., Christian Wenger, Thomas Schroeder, et al.. (2005). A CMOS Process-Compatible Wet-Etching Recipe for the High-k Gate Dielectrics Pr[sub 2]O[sub 3] and Pr[sub 2−x]Ti[sub x]O[sub 3]. Journal of The Electrochemical Society. 152(6). C399–C399. 17 indexed citations
6.
Schroeder, Thomas, T.-L. Lee, J. Zegenhagen, et al.. (2004). Structure and thickness-dependent lattice parameters of ultrathin epitaxial Pr2O3 films on Si(001). Applied Physics Letters. 85(7). 1229–1231. 20 indexed citations
7.
Osten, H. J., et al.. (2002). Band gap and band discontinuities at crystalline Pr2O3/Si(001) heterojunctions. Applied Physics Letters. 80(2). 297–299. 83 indexed citations
8.
Müssig, H.‐J., et al.. (2001). Can Si(113) wafers be an alternative to Si(001)?. Microelectronic Engineering. 56(1-2). 195–203. 17 indexed citations
9.
Dąbrowski, J., R. Casali, H.‐J. Müssig, et al.. (2000). Mechanism of dopant segregation to SiO2/Si(001) interfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(4). 2160–2164. 17 indexed citations
10.
Da̧browski, J., et al.. (1998). Surface reconstruction suggests a nucleation mechanism in bulk: Sb/Si(113) and {113} planar defects. Surface Science. 411(1-2). 54–60. 19 indexed citations
11.
Arabczyk, W., et al.. (1998). Separation of the bulk and surface components in Auger electron spectroscopy. Applied Surface Science. 135(1-4). 59–64. 2 indexed citations
12.
Müssig, H.‐J., et al.. (1996). Low coverage adsorption of Sb4 on Si(113) studied by scanning tunneling microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 982–987. 9 indexed citations
13.
Wolff, G. A., et al.. (1996). Structural models for Sb on Si(113): an experimental and theoretical STM study. Surface Science. 357-358. 667–672. 11 indexed citations
14.
Da̧browski, J., H.‐J. Müssig, & G. A. Wolff. (1994). Atomic Structure of Clean Si(113) Surfaces: Theory and Experiment. Physical Review Letters. 73(12). 1660–1663. 163 indexed citations
15.
Arabczyk, W., et al.. (1991). Phosphorus segregation on iron (111) surfaces studied by AES, XPS, and LEED. Surface Science Letters. 251-252. A360–A360. 2 indexed citations
16.
Müssig, H.‐J., et al.. (1985). LEED‐AES investigation on the influence of thermally segregated chromium on the oxidation of an iron‐chromium alloy. Crystal Research and Technology. 20(2). 219–226. 4 indexed citations
17.
Müssig, H.‐J., et al.. (1981). Auger electron spectroscopic studies of the water vapour adsorption on the (100) surface of austenitic chromium‐nickel steel. Kristall und Technik. 16(11). 1315–1321. 3 indexed citations
18.
Müssig, H.‐J., et al.. (1980). Nitrogen segregation on the (100) surface of an austenitic chromium‐nickel steel studied by LEED and AES. Kristall und Technik. 15(4). 455–461. 7 indexed citations
19.
Adolphi, B. & H.‐J. Müssig. (1978). LEED‐AES‐Untersuchungen der Oxydation von austenitischen Cr‐Ni‐Stählen an der (100)‐Ebene. Kristall und Technik. 13(3). 317–330. 10 indexed citations
20.
Adolphi, B., H.‐J. Müssig, & Hans Joachim Schöpe. (1973). LEED‐Auger‐Untersuchungen an der (100)‐Fläche austenitischer Chrom‐Nickel‐Stähle. Kristall und Technik. 8(10). 1181–1187. 3 indexed citations

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