H.‐D. Geiler
- Computational Mechanics top 10%
- Laser Material Processing Techniques 15
- Ion-surface interactions and analysis 5
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- Silicon and Solar Cell Technologies 11
- Thin-Film Transistor Technologies 8
- Integrated Circuits and Semiconductor Failure Analysis 7
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- Silicon Nanostructures and Photoluminescence 5
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- Thermography and Photoacoustic Techniques 11
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- Advanced Surface Polishing Techniques 5
H.‐D. Geiler
37 papers receiving 313 citations
Peers
Comparison fields: 5 of 40
- Computational Mechanics 136
- Electrical and Electronic Engineering 203
- Materials Chemistry 160
- Mechanics of Materials 75
- Biomedical Engineering 81
Countries citing papers authored by H.‐D. Geiler
This map shows the geographic impact of H.‐D. Geiler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.‐D. Geiler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.‐D. Geiler more than expected).
Fields of papers citing papers by H.‐D. Geiler
This network shows the impact of papers produced by H.‐D. Geiler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.‐D. Geiler. The network helps show where H.‐D. Geiler may publish in the future.
Co-authorship network
The 24 scholars most cited alongside H.‐D. Geiler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 5 | |
| 2 | 2008 | 0 | |
| 3 | 2008 | 1 | |
| 4 | 2006 | 17 | |
| 5 | 2002 | 12 | |
| 6 | 2002 | 13 | |
| 7 | 2002 | 0 | |
| 8 | 1999 | 11 | |
| 9 | 1997 | 3 | |
| 10 | 1996 | 7 | |
| 11 | 1995 | 9 | |
| 12 | 1994 | 1 | |
| 13 | 1991 | 6 | |
| 14 | 1989 | 1 | |
| 15 | 1989 | 4 | |
| 16 | 1989 | 0 | |
| 17 | 1982 | 4 | |
| 18 | 1982 | 18 | |
| 19 | 1982 | 1 | |
| 20 | 1981 | 2 |
About H.‐D. Geiler
H.‐D. Geiler is a scholar working on Nuclear Energy and Engineering, Computational Mechanics, Mechanics of Materials, Electrical and Electronic Engineering and Biophysics, having authored 42 papers that have together received 346 indexed citations. Recurring topics across this work include Laser Material Processing Techniques (15 papers), Silicon and Solar Cell Technologies (11 papers), Thermography and Photoacoustic Techniques (11 papers), Thin-Film Transistor Technologies (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Ion-surface interactions and analysis (5 papers), Advanced Surface Polishing Techniques (5 papers) and Silicon Nanostructures and Photoluminescence (5 papers). The work is most often cited by research in Computational Mechanics (136 citations), Electrical and Electronic Engineering (203 citations), Materials Chemistry (160 citations), Mechanics of Materials (75 citations) and Biomedical Engineering (81 citations). H.‐D. Geiler has collaborated with scholars based in Germany, France and Canada. Frequent co-authors include G. Götz, E. Glaser, Matthias Wagner, G. Andrä, K. Hehl, D. Stock, M. Jurisch, Marvin R Paulsen, E. Daub and U. Just. Their work appears in journals such as Applied Surface Science, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Materials Science in Semiconductor Processing, Journal of Applied Physics and Measurement Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.