Haihong Pan
- Automotive Engineering top 0.5%
- Electrical and Electronic Engineering top 5%
- Control and Systems Engineering top 5%
- Safety, Risk, Reliability and Quality top 2%
- Computer Vision and Pattern Recognition top 5%
- Co-authors
- Lin ChenZhiqiang LüHaiyan WeiYijue WangHuimin WangJun DaiYuntao ZhouJingjing An
- Topics
- Advanced Battery Technologies Research (19 papers)Advancements in Battery Materials (11 papers)Electric Vehicles and Infrastructure (7 papers)
- Cited by
- Automotive EngineeringSafety, Risk, Reliability and QualityElectrical and Electronic Engineering
- Partner nations
- ChinaUnited KingdomUnited States
In The Last Decade
Haihong Pan
42 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 113
- Automotive Engineering 1.1k
- Electrical and Electronic Engineering 1.0k
- Control and Systems Engineering 353
- Safety, Risk, Reliability and Quality 235
- Computer Vision and Pattern Recognition 214
Countries citing papers authored by Haihong Pan
This map shows the geographic impact of Haihong Pan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Haihong Pan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Haihong Pan more than expected).
Fields of papers citing papers by Haihong Pan
This network shows the impact of papers produced by Haihong Pan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Haihong Pan. The network helps show where Haihong Pan may publish in the future.
Co-authorship network of co-authors of Haihong Pan
This figure shows the co-authorship network connecting the top 25 collaborators of Haihong Pan. A scholar is included among the top collaborators of Haihong Pan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Haihong Pan. Haihong Pan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 0 | |
| 5 | 0 | |
| 6 | 5 | |
| 7 | 2 | |
| 8 | 0 | |
| 9 | 1 | |
| 10 | 3 | |
| 11 | 3 | |
| 12 | 54 | |
| 13 | 44 | |
| 14 | 161 | |
| 15 | 2 | |
| 16 | 56 | |
| 17 | 15 | |
| 18 | 268 | |
| 19 | 102 | |
| 20 | 83 |
About Haihong Pan
Haihong Pan is a scholar working on Automotive Engineering, Ecological Modeling and Control and Systems Engineering, having authored 50 papers that have together received 1.6k indexed citations. Recurring topics across this work include Advanced Battery Technologies Research (19 papers), Advancements in Battery Materials (11 papers) and Electric Vehicles and Infrastructure (7 papers). The work is most often cited by research in Automotive Engineering (1.1k citations), Safety, Risk, Reliability and Quality (235 citations) and Electrical and Electronic Engineering (1.0k citations). Haihong Pan has collaborated with scholars based in China, United Kingdom and United States. Frequent co-authors include Lin Chen, Zhiqiang Lü, Haiyan Wei, Yijue Wang, Huimin Wang, Huimin Wang, Lin Chen, Jun Dai, Yuntao Zhou and Jingjing An. Their work appears in journals such as Scientific Reports, IEEE Transactions on Power Electronics and IEEE Access.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.