H. Vanderstraeten

882 total citations · 1 hit paper
19 papers, 763 citations indexed

About

H. Vanderstraeten is a scholar working on Atomic and Molecular Physics, and Optics, Computational Mechanics and Electrical and Electronic Engineering. According to data from OpenAlex, H. Vanderstraeten has authored 19 papers receiving a total of 763 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Atomic and Molecular Physics, and Optics, 7 papers in Computational Mechanics and 7 papers in Electrical and Electronic Engineering. Recurrent topics in H. Vanderstraeten's work include Semiconductor materials and interfaces (9 papers), Ion-surface interactions and analysis (6 papers) and Surface and Thin Film Phenomena (6 papers). H. Vanderstraeten is often cited by papers focused on Semiconductor materials and interfaces (9 papers), Ion-surface interactions and analysis (6 papers) and Surface and Thin Film Phenomena (6 papers). H. Vanderstraeten collaborates with scholars based in Belgium, United States and Germany. H. Vanderstraeten's co-authors include Iván K. Schuller, Y. Bruynseraede, Eric E. Fullerton, A. Vantomme, Y. Bruynseraede, D. Neerinck, G. Langouche, Jean‐Pierre Locquet, M. F. Wu and Karen Maex and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

H. Vanderstraeten

19 papers receiving 727 citations

Hit Papers

Structural refinement of superlattices from x-ray diffrac... 1992 2026 2003 2014 1992 100 200 300 400 500

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H. Vanderstraeten Belgium 9 458 309 278 242 170 19 763
K. Röll Germany 14 391 0.9× 235 0.8× 159 0.6× 122 0.5× 171 1.0× 51 611
Chin‐An Chang United States 16 483 1.1× 263 0.9× 250 0.9× 147 0.6× 457 2.7× 47 841
K. Y. Ahn United States 18 443 1.0× 398 1.3× 317 1.1× 222 0.9× 456 2.7× 67 1000
M. Tessier France 18 572 1.2× 446 1.4× 233 0.8× 165 0.7× 349 2.1× 64 808
J. L. Sacedón Spain 18 455 1.0× 157 0.5× 346 1.2× 144 0.6× 387 2.3× 80 910
H. Zillgen Germany 10 442 1.0× 224 0.7× 127 0.5× 163 0.7× 121 0.7× 16 576
H. Feil Netherlands 13 270 0.6× 175 0.6× 234 0.8× 95 0.4× 345 2.0× 18 697
Y. Cheng United States 8 236 0.5× 162 0.5× 177 0.6× 111 0.5× 110 0.6× 18 491
A. Rocher France 17 603 1.3× 169 0.5× 302 1.1× 152 0.6× 532 3.1× 74 917
M. Yu United States 10 441 1.0× 307 1.0× 214 0.8× 113 0.5× 72 0.4× 18 607

Countries citing papers authored by H. Vanderstraeten

Since Specialization
Citations

This map shows the geographic impact of H. Vanderstraeten's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Vanderstraeten with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Vanderstraeten more than expected).

Fields of papers citing papers by H. Vanderstraeten

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Vanderstraeten. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Vanderstraeten. The network helps show where H. Vanderstraeten may publish in the future.

Co-authorship network of co-authors of H. Vanderstraeten

This figure shows the co-authorship network connecting the top 25 collaborators of H. Vanderstraeten. A scholar is included among the top collaborators of H. Vanderstraeten based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Vanderstraeten. H. Vanderstraeten is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Fullerton, Eric E., Iván K. Schuller, H. Vanderstraeten, & Y. Bruynseraede. (1992). Structural refinement of superlattices from x-ray diffraction. Physical review. B, Condensed matter. 45(16). 9292–9310. 592 indexed citations breakdown →
2.
Langouche, G., H. Vanderstraeten, R. E. Silverans, et al.. (1992). Identification of the Ohmic-contact formation mechanism in the Au/Te/Au/GaAs system. Physical review. B, Condensed matter. 45(20). 11863–11875. 3 indexed citations
3.
Wu, M. F., A. Vantomme, G. Langouche, H. Vanderstraeten, & Y. Bruynseraede. (1991). Strain and orientation in epitaxial CoSi2(111) layers formed by ion implantation. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 54(4). 444–452. 15 indexed citations
4.
Vantomme, A., et al.. (1991). Structural properties of thin silicide layers formed by high-dose metal implantation. Applied Surface Science. 53. 278–282. 3 indexed citations
5.
Vanderstraeten, H., D. Neerinck, K. Temst, et al.. (1991). Low-angle X-ray diffraction of multilayered structures. Journal of Applied Crystallography. 24(5). 571–575. 11 indexed citations
6.
Vanderstraeten, H., Y. Bruynseraede, M. F. Wu, A. Vantomme, & G. Langouche. (1991). Determination of different orientations in epitaxial silicide layers using X-ray diffraction. Journal of Physics D Applied Physics. 24(6). 937–941. 1 indexed citations
7.
Schuller, Iván K., Eric E. Fullerton, H. Vanderstraeten, & Y. Bruynseraede. (1991). Quantitative X-Ray Structure Determination of Superlattices and Interfaces. MRS Proceedings. 229. 5 indexed citations
8.
Vantomme, A., et al.. (1991). Orientation and strain of single and double CoSi2 epitaxial layers formed by ion implantation. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 59-60. 680–684. 8 indexed citations
9.
Wu, M. F., A. Vantomme, G. Langouche, et al.. (1990). Antiparallel crystal orientation in CoSi2 epitaxial bilayers formed by ion implantation. Applied Physics Letters. 57(19). 1973–1975. 24 indexed citations
10.
Langouche, G., H. Vanderstraeten, R. E. Silverans, et al.. (1990). On the Ohmic Contact Formation Mechanism in the Au/Te/N-GaAs System. MRS Proceedings. 181. 3 indexed citations
11.
Schuller, Iván K., M. Grimsditch, F. A. Chambers, et al.. (1990). Coherency of interfacial roughness in GaAs/AlAs superlattices. Physical Review Letters. 65(10). 1235–1238. 31 indexed citations
12.
Vanderstraeten, H., et al.. (1990). Aligned and twinned orientations in epitaxial CoSi2 layers. Applied Physics Letters. 57(2). 135–137. 25 indexed citations
13.
Neerinck, D., H. Vanderstraeten, L. Stockman, et al.. (1990). Finite size effects in crystalline/amorphous multilayers. Journal of Physics Condensed Matter. 2(18). 4111–4118. 9 indexed citations
14.
Neerinck, D., K. Temst, H. Vanderstraeten, et al.. (1990). Critical fields of weakly and strongly coupled superconducting multilayers. Journal of Physics Condensed Matter. 2(29). 6287–6292. 3 indexed citations
15.
Schuller, Iván K., et al.. (1990). Structural refinement of superlattices from x-ray diffraction. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1324. 212–212. 7 indexed citations
16.
Neerinck, D., K. Temst, H. Vanderstraeten, et al.. (1989). Structural and Electronic Properties of Pb/Cu Multilayers. MRS Proceedings. 160. 5 indexed citations
17.
Vanderstraeten, H., et al.. (1987). Crystallization and Melting in Multilayered Structures. MRS Proceedings. 103. 1 indexed citations
18.
Locquet, Jean‐Pierre, D. Neerinck, H. Vanderstraeten, et al.. (1987). Superconductivity in Coupled Pb/Ge and Pb/C Multilayers. Japanese Journal of Applied Physics. 26(S3-2). 1431–1431. 16 indexed citations
19.
Janssen, Pieter & H. Vanderstraeten. (1987). Fir laser stabilization using stark effect: Data on CH3Br and CH3Cl. International Journal of Infrared and Millimeter Waves. 8(4). 415–429. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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