H. van Doveren
- Materials Chemistry
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films top 10%
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Co-authors
- J. Verhoeven
- Topics
- Electron and X-Ray Spectroscopy Techniques (6 papers)Plasma Diagnostics and Applications (3 papers)X-ray Spectroscopy and Fluorescence Analysis (2 papers)
- Journals
- Surface ScienceJournal of Non-Crystalline SolidsJournal of Electron Spectroscopy and Related Phenomena
- Partner nations
- NetherlandsFinlandUnited States
In The Last Decade
H. van Doveren
10 papers receiving 440 citations
Peers
Comparison fields: 5 of 58
- Materials Chemistry 275
- Electrical and Electronic Engineering 154
- Surfaces, Coatings and Films 81
- Electronic, Optical and Magnetic Materials 77
- Atomic and Molecular Physics, and Optics 75
Countries citing papers authored by H. van Doveren
This map shows the geographic impact of H. van Doveren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. van Doveren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. van Doveren more than expected).
Fields of papers citing papers by H. van Doveren
This network shows the impact of papers produced by H. van Doveren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. van Doveren. The network helps show where H. van Doveren may publish in the future.
Co-authorship network of co-authors of H. van Doveren
This figure shows the co-authorship network connecting the top 25 collaborators of H. van Doveren. A scholar is included among the top collaborators of H. van Doveren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. van Doveren. H. van Doveren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 30 | |
| 3 | 20 | |
| 4 | 4 | |
| 5 | 34 | |
| 6 | 283 | |
| 7 | 68 | |
| 8 | 7 | |
| 9 | 2 | |
| 10 | 7 |
About H. van Doveren
H. van Doveren is a scholar working on Surfaces, Coatings and Films, Radiation and Ceramics and Composites, having authored 10 papers that have together received 462 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (6 papers), Plasma Diagnostics and Applications (3 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (81 citations), Condensed Matter Physics (74 citations) and Ceramics and Composites (36 citations). H. van Doveren has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include J. Verhoeven. Their work appears in journals such as Surface Science, Journal of Non-Crystalline Solids and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.