H. van Doveren

528 total citations
10 papers, 462 citations indexed

About

H. van Doveren is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, H. van Doveren has authored 10 papers receiving a total of 462 indexed citations (citations by other indexed papers that have themselves been cited), including 6 papers in Surfaces, Coatings and Films, 5 papers in Electrical and Electronic Engineering and 4 papers in Radiation. Recurrent topics in H. van Doveren's work include Electron and X-Ray Spectroscopy Techniques (6 papers), Plasma Diagnostics and Applications (3 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). H. van Doveren is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (6 papers), Plasma Diagnostics and Applications (3 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). H. van Doveren collaborates with scholars based in Netherlands, Finland and United States. H. van Doveren's co-authors include J. Verhoeven and has published in prestigious journals such as Surface Science, Journal of Non-Crystalline Solids and Journal of Electron Spectroscopy and Related Phenomena.

In The Last Decade

H. van Doveren

10 papers receiving 440 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
H. van Doveren Netherlands	8	275	154	81	77	75	10	462
Yoshizo Kitami Japan	12	338 1.2×	206 1.3×	54 0.7×	118 1.5×	50 0.7×	31	593
M. Henriot France	9	347 1.3×	168 1.1×	78 1.0×	71 0.9×	102 1.4×	11	505
Deborah P. Partlow United States	9	385 1.4×	337 2.2×	117 1.4×	122 1.6×	111 1.5×	19	810
N. Zacchetti Italy	12	555 2.0×	226 1.5×	59 0.7×	52 0.7×	36 0.5×	16	718
H. Goretzki Austria	13	437 1.6×	111 0.7×	63 0.8×	55 0.7×	61 0.8×	25	723
I. Manassidis United Kingdom	6	386 1.4×	174 1.1×	22 0.3×	36 0.5×	109 1.5×	7	509
J.‐P. Jacobs Netherlands	11	583 2.1×	169 1.1×	52 0.6×	123 1.6×	63 0.8×	18	748
G. Praline United States	6	372 1.4×	105 0.7×	61 0.8×	25 0.3×	103 1.4×	7	461
Markus Hund Germany	14	346 1.3×	106 0.7×	79 1.0×	65 0.8×	49 0.7×	19	608
S. Sinha India	9	217 0.8×	117 0.8×	26 0.3×	97 1.3×	49 0.7×	23	464

Countries citing papers authored by H. van Doveren

Since Specialization

Citations

This map shows the geographic impact of H. van Doveren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. van Doveren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. van Doveren more than expected).

Fields of papers citing papers by H. van Doveren

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. van Doveren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. van Doveren. The network helps show where H. van Doveren may publish in the future.

Co-authorship network of co-authors of H. van Doveren

This figure shows the co-authorship network connecting the top 25 collaborators of H. van Doveren. A scholar is included among the top collaborators of H. van Doveren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. van Doveren. H. van Doveren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

10 of 10 papers shown

1.

Doveren, H. van. (1984). Laser mass spectroscopy. Spectrochimica Acta Part B Atomic Spectroscopy. 39(12). 1513–1516. 7 indexed citations

2.

Verhoeven, J. & H. van Doveren. (1982). An XPS investigation of the interaction of CH4, C2H2, C2H4 and C2H6 with a barium surface. Surface Science. 123(2-3). 369–383. 30 indexed citations

3.

Verhoeven, J. & H. van Doveren. (1982). Interactions of residual gases with a barium getter film as measured by AES and XPS. Journal of Vacuum Science and Technology. 20(1). 64–74. 20 indexed citations

4.

Verhoeven, J. & H. van Doveren. (1981). Some observations on evaporation phenomena of oxide cathodes by an AES-based vapour collect method. Applications of Surface Science. 8(1-2). 95–107. 4 indexed citations

5.

Doveren, H. van, et al.. (1980). Decrease of the alkali signal during auger analysis of glasses. Journal of Non-Crystalline Solids. 37(1). 111–124. 34 indexed citations

6.

Verhoeven, J. & H. van Doveren. (1980). XPS studies on Ba, BaO and the oxidation of Ba. Applications of Surface Science. 5(4). 361–373. 68 indexed citations

7.

Doveren, H. van & J. Verhoeven. (1980). XPS spectra of Ca, Sr, Ba and their oxides. Journal of Electron Spectroscopy and Related Phenomena. 21(3). 265–273. 283 indexed citations

8.

Verhoeven, J. & H. van Doveren. (1980). Investigations on barium getter films by AES and XPS. Applications of Surface Science. 6(3-4). 225–240. 7 indexed citations

9.

Verhoeven, J. & H. van Doveren. (1979). A vapour collect method based on Auger spectroscopy. Microchimica Acta. 71(5-6). 331–344. 2 indexed citations

10.

Doveren, H. van, et al.. (1977). The grain boundary composition of MnZn ferrites with CaO, SiO2 and TiO2 additions. 3(3). 122–123. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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