H. J. Frankena
- Electrical and Electronic Engineering
- Biomedical Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Mechanical Engineering top 10%
- Computer Vision and Pattern Recognition top 5%
- Co-authors
- Hedser van BrugOliver FähnleAdrianus T. de HoopF.H. GroenC. Martijn de SterkeLei ShiM.K. SmitPiet Demeester
- Topics
- Photonic and Optical Devices (11 papers)Advanced Measurement and Metrology Techniques (9 papers)Surface Roughness and Optical Measurements (8 papers)
- Journals
- Journal of Lightwave TechnologyReview of Scientific InstrumentsJournal of the Optical Society of America A
- Partner nations
- NetherlandsBelgiumUkraine
In The Last Decade
H. J. Frankena
43 papers receiving 687 citations
Peers
Comparison fields: 5 of 61
- Electrical and Electronic Engineering 298
- Biomedical Engineering 258
- Atomic and Molecular Physics, and Optics 237
- Mechanical Engineering 222
- Computer Vision and Pattern Recognition 208
Countries citing papers authored by H. J. Frankena
This map shows the geographic impact of H. J. Frankena's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. J. Frankena with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. J. Frankena more than expected).
Fields of papers citing papers by H. J. Frankena
This network shows the impact of papers produced by H. J. Frankena. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. J. Frankena. The network helps show where H. J. Frankena may publish in the future.
Co-authorship network of co-authors of H. J. Frankena
This figure shows the co-authorship network connecting the top 25 collaborators of H. J. Frankena. A scholar is included among the top collaborators of H. J. Frankena based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. J. Frankena. H. J. Frankena is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 23 | |
| 2 | 3 | |
| 3 | 22 | |
| 4 | 1 | |
| 5 | 37 | |
| 6 | 0 | |
| 7 | 7 | |
| 8 | 5 | |
| 9 | Compact integrated InP-based add-drop multiplexer | 3 |
| 10 | 9 | |
| 11 | 17 | |
| 12 | 3 | |
| 13 | 2 | |
| 14 | 14 | |
| 15 | 14 | |
| 16 | 12 | |
| 17 | 12 | |
| 18 | 3 | |
| 19 | 25 | |
| 20 | 2 |
About H. J. Frankena
H. J. Frankena is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Atomic and Molecular Physics, and Optics, having authored 45 papers that have together received 765 indexed citations. Recurring topics across this work include Photonic and Optical Devices (11 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). The work is most often cited by research in Ecological Modeling (74 citations), Surfaces, Coatings and Films (83 citations) and Computer Vision and Pattern Recognition (208 citations). H. J. Frankena has collaborated with scholars based in Netherlands, Belgium and Ukraine. Frequent co-authors include Hedser van Brug, Oliver Fähnle, Adrianus T. de Hoop, F.H. Groen, C. Martijn de Sterke, Lei Shi, M.K. Smit, Piet Demeester, Y.S. Oei and E.G. Metaal. Their work appears in journals such as Journal of Lightwave Technology, Review of Scientific Instruments and Journal of the Optical Society of America A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.