H. J. Frankena

1.0k total citations
45 papers, 765 citations indexed

About

H. J. Frankena is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanical Engineering. According to data from OpenAlex, H. J. Frankena has authored 45 papers receiving a total of 765 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 15 papers in Atomic and Molecular Physics, and Optics and 14 papers in Mechanical Engineering. Recurrent topics in H. J. Frankena's work include Photonic and Optical Devices (11 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). H. J. Frankena is often cited by papers focused on Photonic and Optical Devices (11 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). H. J. Frankena collaborates with scholars based in Netherlands, Belgium and Ukraine. H. J. Frankena's co-authors include Hedser van Brug, Oliver Fähnle, Adrianus T. de Hoop, F.H. Groen, C. Martijn de Sterke, Lei Shi, E.G. Metaal, M.K. Smit, Y.S. Oei and Piet Demeester and has published in prestigious journals such as Journal of Lightwave Technology, Review of Scientific Instruments and Journal of the Optical Society of America A.

In The Last Decade

H. J. Frankena

43 papers receiving 687 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H. J. Frankena Netherlands 15 298 258 237 222 208 45 765
Heejoo Choi United States 15 187 0.6× 320 1.2× 174 0.7× 264 1.2× 249 1.2× 85 644
Tomoaki Eiju Japan 13 285 1.0× 270 1.0× 384 1.6× 395 1.8× 689 3.3× 46 1.2k
Suezou Nakadate Japan 15 143 0.5× 174 0.7× 282 1.2× 179 0.8× 488 2.3× 38 751
Tomizo Kurosawa Japan 18 316 1.1× 296 1.1× 386 1.6× 730 3.3× 276 1.3× 71 1.1k
Antti Lassila Finland 18 207 0.7× 203 0.8× 195 0.8× 433 2.0× 185 0.9× 82 842
Christof Pruß Germany 18 210 0.7× 284 1.1× 319 1.3× 371 1.7× 440 2.1× 69 882
Rajpal S. Sirohi India 16 205 0.7× 118 0.5× 229 1.0× 249 1.1× 433 2.1× 52 641
K. Y. Cheng United States 19 353 1.2× 166 0.6× 318 1.3× 394 1.8× 39 0.2× 55 985
Yukihiro Ishii Japan 15 246 0.8× 160 0.6× 337 1.4× 283 1.3× 490 2.4× 58 769
Kazumi Murata Japan 11 178 0.6× 169 0.7× 195 0.8× 216 1.0× 347 1.7× 42 596

Countries citing papers authored by H. J. Frankena

Since Specialization
Citations

This map shows the geographic impact of H. J. Frankena's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. J. Frankena with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. J. Frankena more than expected).

Fields of papers citing papers by H. J. Frankena

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. J. Frankena. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. J. Frankena. The network helps show where H. J. Frankena may publish in the future.

Co-authorship network of co-authors of H. J. Frankena

This figure shows the co-authorship network connecting the top 25 collaborators of H. J. Frankena. A scholar is included among the top collaborators of H. J. Frankena based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. J. Frankena. H. J. Frankena is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Groen, F.H., et al.. (2000). Polarization-independent dilated InP-based space switch with low crosstalk. IEEE Photonics Technology Letters. 12(3). 284–286. 23 indexed citations
2.
Fähnle, Oliver, Hedser van Brug, & H. J. Frankena. (1999). Kinetic finishing applying a low pressure abrasive slurry jet system. AP3–AP3. 3 indexed citations
3.
Frankena, H. J., et al.. (1998). Testing aspheric surfaces: simple method with a circular stop. Applied Optics. 37(25). 5969–5969. 1 indexed citations
4.
Brug, Hedser van, et al.. (1998). Polarization phase stepping with a Savart element. Applied Optics. 37(22). 5150–5150. 22 indexed citations
5.
Oei, Y.S., M.K. Smit, F.H. Groen, et al.. (1997). First InP-based reconfigurable integrated add-drop multiplexer. IEEE Photonics Technology Letters. 9(2). 188–190. 37 indexed citations
6.
Frankena, H. J., et al.. (1997). <title>Fabrication technique for the production of on- and off-axis conic surfaces of revolution (WAGNER)</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3134. 329–339.
7.
Frankena, H. J., et al.. (1997). Application of a fully vectorial beam propagation method. Optical and Quantum Electronics. 29(2). 313–322. 7 indexed citations
8.
Fähnle, Oliver, et al.. (1997). Loose abrasive line-contact machining of aspherical optical surfaces of revolution. Applied Optics. 36(19). 4483–4483. 5 indexed citations
9.
Oei, Y.S., et al.. (1996). Compact integrated InP-based add-drop multiplexer. Ghent University Academic Bibliography (Ghent University). 3 indexed citations
10.
Frankena, H. J., et al.. (1995). Field analysis of two-dimensional focusing grating couplers. Journal of the Optical Society of America A. 12(5). 1142–1142. 9 indexed citations
11.
Brug, Hedser van, et al.. (1995). Investigation of acceleration of a vectorial beam propagation method. Pure and Applied Optics Journal of the European Optical Society Part A. 4(5). 475–478. 2 indexed citations
12.
Frankena, H. J., et al.. (1994). <title>Vectorial FDBPM 3D waveguide structures</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2212. 36–46. 3 indexed citations
13.
Frankena, H. J., et al.. (1994). <title>Profiling of aspherical surfaces using moire deflectometry</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2248. 116–124. 2 indexed citations
14.
Frankena, H. J., et al.. (1994). Real-time displacement measurement using a multicamera phase-stepping speckle interferometer. Applied Optics. 33(19). 4137–4137. 54 indexed citations
15.
Tol, J.J.G.M. van der, et al.. (1993). Modeling and characterization of an electrooptic polarization controller on LiNbO/sub 3/. Journal of Lightwave Technology. 11(7). 1151–1157. 14 indexed citations
16.
Frankena, H. J., et al.. (1991). Linear approximation for measurement errors in phase shifting interferometry. Applied Optics. 30(19). 2718–2718. 114 indexed citations
17.
Frankena, H. J., et al.. (1989). Integrated optical interferometer with a stacked waveguide structure. Applied Optics. 28(20). 4424–4424. 2 indexed citations
18.
Fenichel, Henry, H. J. Frankena, & F.H. Groen. (1984). Experiments on diffusion in liquids using holographic interferometry. American Journal of Physics. 52(8). 735–738. 12 indexed citations
19.
Sterke, C. Martijn de, et al.. (1983). Nonpolarizing beam splitter design. Applied Optics. 22(4). 595–595. 25 indexed citations
20.
Frankena, H. J., et al.. (1983). Moire method to determine separate frequency contributions in vibration patterns. Applied Optics. 22(2). 233–233. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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