G. Trezzi
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 3
- Advanced X-ray Imaging Techniques 2
- Condensed Matter Physics top 5%
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 5
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- Magnetic properties of thin films 2
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- Metal and Thin Film Mechanics 2
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- Photocathodes and Microchannel Plates 2
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- Ion-surface interactions and analysis 1
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- Advanced materials and composites 1
- Co-authors
- L. BraicovichC. DalleraThorsten SchmittR. BetempsX. WangVladimir N. StrocovG. GhiringhelliM. Grioni
- Journals
- Review of Scientific Instruments (3 papers)Journal of Electron Spectroscopy and Related Phenomena (1 paper)Solid State Communications (1 paper)
- Partner nations
- ItalySwitzerland
In The Last Decade
G. Trezzi
9 papers receiving 392 citations
Peers
Comparison fields: 5 of 34
- Radiation 166
- Condensed Matter Physics 173
- Surfaces, Coatings and Films 92
- Structural Biology 7
- Electronic, Optical and Magnetic Materials 73
Countries citing papers authored by G. Trezzi
This map shows the geographic impact of G. Trezzi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Trezzi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Trezzi more than expected).
Fields of papers citing papers by G. Trezzi
This network shows the impact of papers produced by G. Trezzi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Trezzi. The network helps show where G. Trezzi may publish in the future.
Co-authorship network
The 25 scholars most cited alongside G. Trezzi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 16 | |
| 2 | 2006 | 224 | |
| 3 | 2002 | 2 | |
| 4 | 2002 | 19 | |
| 5 | 1996 | 54 | |
| 6 | 1991 | 30 | |
| 7 | 1991 | 39 | |
| 8 | 1988 | 12 | |
| 9 | 1986 | 2 |
About G. Trezzi
G. Trezzi is a scholar working on Surfaces, Coatings and Films, Structural Biology, Radiation, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 9 papers that have together received 398 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (5 papers), X-ray Spectroscopy and Fluorescence Analysis (3 papers), Magnetic properties of thin films (2 papers), Advanced X-ray Imaging Techniques (2 papers), Metal and Thin Film Mechanics (2 papers), Photocathodes and Microchannel Plates (2 papers), Ion-surface interactions and analysis (1 paper) and Advanced materials and composites (1 paper). The work is most often cited by research in Radiation (166 citations), Condensed Matter Physics (173 citations), Surfaces, Coatings and Films (92 citations), Structural Biology (7 citations) and Electronic, Optical and Magnetic Materials (73 citations). G. Trezzi has collaborated with scholars based in Italy and Switzerland. Frequent co-authors include L. Braicovich, C. Dallera, Thorsten Schmitt, R. Betemps, X. Wang, Vladimir N. Strocov, G. Ghiringhelli, M. Grioni, A. Piazzalunga and L. Patthey. Their work appears in journals such as Review of Scientific Instruments, Journal of Electron Spectroscopy and Related Phenomena, Solid State Communications, Journal of Synchrotron Radiation and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.