G. T. Reid
- Computer Vision and Pattern Recognition top 5%
- Mechanical Engineering top 10%
- Media Technology top 5%
- Computational Mechanics top 10%
- Electrical and Electronic Engineering
- Co-authors
- David RobinsonPeter J. de GrootStephen MarshallOsuk Y. KwonRyszard J. PryputniewiczF. P. ChiangMaksymilian PlutaMałgorzata Kujawińska
- Topics
- Optical measurement and interference techniques (12 papers)Advanced Measurement and Metrology Techniques (8 papers)Surface Roughness and Optical Measurements (3 papers)
- Partner nations
- United Kingdom
In The Last Decade
G. T. Reid
16 papers receiving 380 citations
Peers
Comparison fields: 5 of 55
- Computer Vision and Pattern Recognition 333
- Mechanical Engineering 168
- Media Technology 87
- Computational Mechanics 85
- Electrical and Electronic Engineering 70
Countries citing papers authored by G. T. Reid
This map shows the geographic impact of G. T. Reid's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. T. Reid with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. T. Reid more than expected).
Fields of papers citing papers by G. T. Reid
This network shows the impact of papers produced by G. T. Reid. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. T. Reid. The network helps show where G. T. Reid may publish in the future.
Co-authorship network of co-authors of G. T. Reid
This figure shows the co-authorship network connecting the top 25 collaborators of G. T. Reid. A scholar is included among the top collaborators of G. T. Reid based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. T. Reid. G. T. Reid is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 137 | |
| 3 | Interferometry: Techniques and Analysis II | 3 |
| 4 | Fringe'89--Automatic processing of fringe patterns | 3 |
| 5 | 1 | |
| 6 | 4 | |
| 7 | 0 | |
| 8 | 11 | |
| 9 | 11 | |
| 10 | 8 | |
| 11 | 3 | |
| 12 | 117 | |
| 13 | 9 | |
| 14 | 61 | |
| 15 | 31 | |
| 16 | 4 | |
| 17 | 7 |
About G. T. Reid
G. T. Reid is a scholar working on Computer Vision and Pattern Recognition, Instrumentation and Computational Mechanics, having authored 17 papers that have together received 413 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (12 papers), Advanced Measurement and Metrology Techniques (8 papers) and Surface Roughness and Optical Measurements (3 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (333 citations), Media Technology (87 citations) and Instrumentation (16 citations). G. T. Reid has collaborated with scholars based in United Kingdom. Frequent co-authors include David Robinson, Peter J. de Groot, Stephen Marshall, Osuk Y. Kwon, Ryszard J. Pryputniewicz, F. P. Chiang, Maksymilian Pluta, Małgorzata Kujawińska, D.W. Heeley and Wolfgang Osten. Their work appears in journals such as Physics Today, Journal of Physics D Applied Physics and Wear.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.