G. Jungk

516 total citations
53 papers, 400 citations indexed

About

G. Jungk is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, G. Jungk has authored 53 papers receiving a total of 400 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 29 papers in Atomic and Molecular Physics, and Optics and 14 papers in Materials Chemistry. Recurrent topics in G. Jungk's work include Thin-Film Transistor Technologies (10 papers), Semiconductor Quantum Structures and Devices (8 papers) and Silicon Nanostructures and Photoluminescence (7 papers). G. Jungk is often cited by papers focused on Thin-Film Transistor Technologies (10 papers), Semiconductor Quantum Structures and Devices (8 papers) and Silicon Nanostructures and Photoluminescence (7 papers). G. Jungk collaborates with scholars based in Germany, Austria and Russia. G. Jungk's co-authors include Robert L. Johnson, M. Cardona, L. Däweritz, L. Schrottke, N. Esser, T. Wethkamp, A. Röseler, H. Angerer, K. Wilmers and W. Richter and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

G. Jungk

50 papers receiving 332 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
G. Jungk Germany	11	242	203	167	70	65	53	400
Seijiro Furukawa Japan	14	429 1.8×	207 1.0×	227 1.4×	50 0.7×	61 0.9×	37	560
E. Koppensteiner Austria	13	276 1.1×	294 1.4×	191 1.1×	80 1.1×	71 1.1×	27	458
K. Werner Netherlands	13	424 1.8×	308 1.5×	131 0.8×	74 1.1×	67 1.0×	36	509
K. E. Strege United States	11	358 1.5×	343 1.7×	116 0.7×	45 0.6×	50 0.8×	18	508
S. H. McFarlane United States	11	199 0.8×	178 0.9×	93 0.6×	136 1.9×	97 1.5×	22	368
Ray Kaplan United States	7	244 1.0×	235 1.2×	162 1.0×	199 2.8×	54 0.8×	9	482
J. H. Dinan United States	10	262 1.1×	190 0.9×	132 0.8×	29 0.4×	52 0.8×	21	357
John E. Davey United States	15	363 1.5×	305 1.5×	182 1.1×	26 0.4×	79 1.2×	39	510
E. I. Alessandrini United States	10	167 0.7×	149 0.7×	130 0.8×	67 1.0×	36 0.6×	24	325
McD. Robinson United States	13	305 1.3×	141 0.7×	163 1.0×	127 1.8×	79 1.2×	30	456

Countries citing papers authored by G. Jungk

Since Specialization

Citations

This map shows the geographic impact of G. Jungk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Jungk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Jungk more than expected).

Fields of papers citing papers by G. Jungk

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Jungk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Jungk. The network helps show where G. Jungk may publish in the future.

Co-authorship network of co-authors of G. Jungk

This figure shows the co-authorship network connecting the top 25 collaborators of G. Jungk. A scholar is included among the top collaborators of G. Jungk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Jungk. G. Jungk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Jungk, G., et al.. (1999). Ellipsometric Investigations on SiO2/Si: The Interface Response. physica status solidi (b). 215(1). 731–736. 2 indexed citations

Wethkamp, T., K. Wilmers, N. Esser, et al.. (1998). Spectroscopic ellipsometry measurements of Al Ga1−N in the energy range 3–25 eV. Thin Solid Films. 313-314. 745–750. 50 indexed citations

Jungk, G., M. Ramsteiner, & R. Hey. (1995). Ellipsometric investigations and luminescence properties of semiconductor microcavities. Il Nuovo Cimento D. 17(11-12). 1519–1526. 1 indexed citations

Frey, Alexander, G. Jungk, & R. Hey. (1994). Position-dependent exciton-photon mode splitting in a microcavity. Applied Physics Letters. 64(17). 2214–2216. 8 indexed citations

Ramsteiner, M., J. Wagner, D. Behr, et al.. (1994). Raman spectroscopic study on the wirelike incorporation of Si dopant atoms on GaAs(001) vicinal surfaces. Applied Physics Letters. 64(4). 490–492. 12 indexed citations

Ramsteiner, M., J. Wagner, G. Jungk, et al.. (1994). Raman scattering investigation on the ordered incorporation of Si dopant atoms on GaAs(001) vicinal surfaces during MBE growth. Solid-State Electronics. 37(4-6). 605–608. 1 indexed citations

Behr, D., J. Wagner, J. Schmitz, et al.. (1994). Resonant Raman scattering and spectral ellipsometry on InAs/GaSb superlattices with different interfaces. Applied Physics Letters. 65(23). 2972–2974. 25 indexed citations

Jungk, G.. (1993). Possibilities and limitations of ellipsometry. Thin Solid Films. 234(1-2). 428–431. 13 indexed citations

Jungk, G. & U. Woggon. (1991). Critical remarks on quantum-size effects in embedded microcrystals. Superlattices and Microstructures. 9(3). 401–405. 4 indexed citations

10.

Jungk, G.. (1988). Optical Bistability in Composite Media. physica status solidi (b). 146(1). 335–340. 5 indexed citations

11.

Jungk, G.. (1980). Many‐Particle Effects at the E₁‐Transition in Silicon. physica status solidi (b). 99(2). 643–650. 11 indexed citations

12.

Däweritz, L., et al.. (1978). Growth and properties of AlxGa1–xN epitaxial layers. physica status solidi (a). 49(2). 629–636. 27 indexed citations

13.

Jungk, G.. (1977). Determination of optical constants matching methods. physica status solidi (a). 42(1). 267–272. 4 indexed citations

14.

Jungk, G.. (1976). Determination of optical constants. A null-method for non-absorbing surface films. physica status solidi (a). 34(1). 69–72. 6 indexed citations

15.

Friedrich, Heide & G. Jungk. (1968). Generation‐Recombination Statistics in Semiconductors‐A Model with Two Centres. physica status solidi (b). 27(1). 237–248. 2 indexed citations

16.

Jungk, G., et al.. (1966). Energieabhängigkeit der Diffusionslänge in Halbleitern. physica status solidi (b). 13(1).

17.

Jungk, G., et al.. (1964). Zur Messung der Diffusionslänge der Minoritätsträger in Halbleitern. physica status solidi (b). 5(1). 169–174. 16 indexed citations

18.

Jungk, G., et al.. (1963). Stationäre Photoleitung und p‐n‐Photoeffekt in SiC. physica status solidi (b). 3(4). 735–743. 1 indexed citations

19.

Jungk, G., et al.. (1962). Photo‐EMK bei Störstellen‐ und Grundgitteranregung im SiC. physica status solidi (b). 2(4). 473–478. 7 indexed citations

20.

Jungk, G., et al.. (1961). Hall‐Effekt und Leitfähigkeit von Germanium‐Aufdampfschichten. Annalen der Physik. 462(3-4). 210–215. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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