Fu-Min Yeh
Impact in
- Software top 5%
- Software Reliability and Analysis Research
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- Reliability and Maintenance Optimization
Papers in ⓘ
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- VLSI and Analog Circuit Testing 4
- Embedded Systems Design Techniques 1
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- Formal Methods in Verification 5
- Journals
- IEEE Transactions on Reliability (3 papers)Electronics Letters (1 paper)VLSI design (1 paper)NTUR (臺灣機構典藏) (2 papers)
- Partner nations
- Taiwan
In The Last Decade
Fu-Min Yeh
9 papers receiving 280 citations
Peers
Comparison fields: 5 of 37
- Software 137
- Safety, Risk, Reliability and Quality 149
- Statistics, Probability and Uncertainty 72
- Hardware and Architecture 39
- Computational Theory and Mathematics 76
Countries citing papers authored by Fu-Min Yeh
This map shows the geographic impact of Fu-Min Yeh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fu-Min Yeh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fu-Min Yeh more than expected).
Fields of papers citing papers by Fu-Min Yeh
This network shows the impact of papers produced by Fu-Min Yeh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fu-Min Yeh. The network helps show where Fu-Min Yeh may publish in the future.
Co-authors
The 3 scholars most cited alongside Fu-Min Yeh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 112 | |
| 2 | 2002 | 73 | |
| 3 | 2007 | 62 | |
| 4 | 2004 | 31 | |
| 5 | 2003 | 11 | |
| 6 | 1997 | 10 | |
| 7 | 2001 | 9 | |
| 8 | 2004 | 7 | |
| 9 | 2004 | 1 |
About Fu-Min Yeh
Fu-Min Yeh is a scholar working on Hardware and Architecture, Computational Theory and Mathematics, Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering and Software, having authored 9 papers that have together received 316 indexed citations. Recurring topics across this work include Formal Methods in Verification (5 papers), Reliability and Maintenance Optimization (4 papers), VLSI and Analog Circuit Testing (4 papers), Software Reliability and Analysis Research (3 papers), Low-power high-performance VLSI design (2 papers), Radiation Effects in Electronics (2 papers), Embedded Systems Design Techniques (1 paper) and Interconnection Networks and Systems (1 paper). The work is most often cited by research in Software (137 citations), Safety, Risk, Reliability and Quality (149 citations), Statistics, Probability and Uncertainty (72 citations), Hardware and Architecture (39 citations) and Computational Theory and Mathematics (76 citations). Fu-Min Yeh has collaborated with scholars based in Taiwan. Frequent co-authors include Sy‐Yen Kuo, Shyue-Kung Lu and Ing-Yi Chen. Their work appears in journals such as IEEE Transactions on Reliability, Electronics Letters, VLSI design and NTUR (臺灣機構典藏).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.