F. Soeda

625 total citations
21 papers, 484 citations indexed

About

F. Soeda is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, F. Soeda has authored 21 papers receiving a total of 484 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Surfaces, Coatings and Films, 9 papers in Electrical and Electronic Engineering and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in F. Soeda's work include Electron and X-Ray Spectroscopy Techniques (10 papers), Ion-surface interactions and analysis (6 papers) and Surface and Thin Film Phenomena (4 papers). F. Soeda is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (10 papers), Ion-surface interactions and analysis (6 papers) and Surface and Thin Film Phenomena (4 papers). F. Soeda collaborates with scholars based in Japan and United States. F. Soeda's co-authors include A. Ishitani, Y. Nakayama, Takayuki Takahagi, K. Okuno, Shoji Nagaoka, Hideyuki Ishida, Masatsugu Shimomura, Toyoki Kunitake, Kenjiro Hayashi and Motoyoshi Hatada and has published in prestigious journals such as Analytical Chemistry, Carbon and Journal of Colloid and Interface Science.

In The Last Decade

F. Soeda

21 papers receiving 451 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Soeda Japan 12 204 187 148 113 107 21 484
J. Friedrich Germany 14 251 1.2× 153 0.8× 229 1.5× 56 0.5× 111 1.0× 34 522
J. L. Ord Canada 16 293 1.4× 255 1.4× 50 0.3× 51 0.5× 140 1.3× 43 612
Herman V. Boenig United States 7 161 0.8× 162 0.9× 130 0.9× 24 0.2× 102 1.0× 9 486
Weihuan Huang China 12 233 1.1× 135 0.7× 276 1.9× 44 0.4× 54 0.5× 21 557
Susumu Umemoto Japan 16 204 1.0× 167 0.9× 65 0.4× 23 0.2× 190 1.8× 30 548
Gilles Castelein France 15 355 1.7× 149 0.8× 146 1.0× 70 0.6× 372 3.5× 24 813
Mario Sahre Germany 14 253 1.2× 212 1.1× 39 0.3× 73 0.6× 41 0.4× 36 536
Zoran R. Vasic Australia 8 299 1.5× 192 1.0× 175 1.2× 29 0.3× 50 0.5× 13 566
Joseph Q. Pham United States 9 282 1.4× 63 0.3× 76 0.5× 31 0.3× 196 1.8× 9 523
Min Soo Lim United States 9 136 0.7× 128 0.7× 102 0.7× 63 0.6× 17 0.2× 14 380

Countries citing papers authored by F. Soeda

Since Specialization
Citations

This map shows the geographic impact of F. Soeda's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Soeda with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Soeda more than expected).

Fields of papers citing papers by F. Soeda

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Soeda. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Soeda. The network helps show where F. Soeda may publish in the future.

Co-authorship network of co-authors of F. Soeda

This figure shows the co-authorship network connecting the top 25 collaborators of F. Soeda. A scholar is included among the top collaborators of F. Soeda based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Soeda. F. Soeda is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Soeda, F., et al.. (1996). Submicron particle analysis by the Auger microprobe (FE-SAM). Applied Surface Science. 100-101. 152–155. 5 indexed citations
2.
Nakagawa, Yoshitsugu, Aya Shimizu, Naoyuki Sugiyama, F. Soeda, & A. Ishitani. (1995). Molecular-Scale Structures of Langmuir-Blodgett Films of Fatty Acids Observed by Atomic Force Microscopy. Japanese Journal of Applied Physics. 34(7S). 3898–3898. 2 indexed citations
4.
Nakagawa, Yoshitsugu, Hitomi Hayashi, Takayuki Takahagi, et al.. (1994). Atomic Force Microscopy of Solution Grown Polyethylene Single Crystals. Japanese Journal of Applied Physics. 33(6S). 3771–3771. 19 indexed citations
5.
Fujitsuka, Mamoru, Tomokazu Iyoda, Takeo Shimidzu, et al.. (1992). Mesoscopic layered structure in conducting polymer thin film fabricated by potential-programmed electropolymerization. Synthetic Metals. 53(1). 1–10. 6 indexed citations
6.
Nakayama, Yoichi, et al.. (1992). Decomposition products of EBR-9 by X-ray and EB exposure.. Journal of Photopolymer Science and Technology. 5(3). 589–592. 1 indexed citations
7.
Okuno, K., et al.. (1991). A study of the secondary-ion yield change on the GaAs surface caused by the O+2 ion-beam-induced rippling. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 9(4). 2247–2252. 50 indexed citations
8.
Fujitsuka, Mamoru, Kenichi Honda, Takeo Shimidzu, et al.. (1991). Depth profiling of layered structures in conducting polymer thin films prepared by the potential-programmed electropolymerization method. Thin Solid Films. 205(2). 258–265. 7 indexed citations
9.
Nakayama, Y., F. Soeda, A. Ishitani, & Tohru Ikegami. (1991). Surface analysis of plasma‐treated poly(ethylene terephthalate) film. Polymer Engineering and Science. 31(11). 812–817. 13 indexed citations
10.
Nakayama, Y., F. Soeda, & A. Ishitani. (1990). XPS study of the carbon fiber matrix interface. Carbon. 28(1). 21–26. 116 indexed citations
11.
Takahagi, Takayuki, Y. Nakayama, F. Soeda, & A. Ishitani. (1990). Effects of surface cleaning and X‐ray irradiation in XPS study of polymers. Journal of Applied Polymer Science. 41(7-8). 1451–1458. 21 indexed citations
12.
Yoshihara, Κ., Ryuichi Shimizu, T. Homma, et al.. (1990). The reliability of quantitative analysis with AES. Surface and Interface Analysis. 16(1-12). 140–143. 11 indexed citations
13.
Nakayama, Y., Takayuki Takahagi, F. Soeda, et al.. (1990). A study of XPS O1s spectrum of poly(ethylene terephthalate). Journal of Polymer Science Part A Polymer Chemistry. 28(7). 1813–1821. 14 indexed citations
14.
Nakayama, Y., Takayuki Takahagi, F. Soeda, & A. Ishitani. (1989). XPS study of oriented organic molecules. Journal of Colloid and Interface Science. 131(1). 153–160. 10 indexed citations
15.
Nagasawa, Y., et al.. (1988). Siウエハ上の酸化物層中のSiOHとSiHのFT-IR-ATR観察. Microchimica Acta. 1. 431–434. 5 indexed citations
16.
Nakayama, Y., et al.. (1988). XPS analysis of NH3 plasma‐treated polystyrene films utilizing gas phase chemical modification. Journal of Polymer Science Part A Polymer Chemistry. 26(2). 559–572. 98 indexed citations
17.
Nakayama, Y., Takayuki Takahagi, F. Soeda, et al.. (1988). XPS study of oriented organic molecules. Applied Surface Science. 33-34. 1307–1316. 12 indexed citations
18.
Ishida, Hideyuki, et al.. (1988). FT-IR-ATR observation of SiOH and SiH in the oxide layer on an Si wafer. Microchimica Acta. 94(1-6). 431–434. 9 indexed citations
19.
Nakayama, Y., Takayuki Takahagi, F. Soeda, et al.. (1988). XPS study of oriented organic molecules. Journal of Colloid and Interface Science. 122(2). 464–474. 18 indexed citations
20.
Soeda, F., Kenjiro Hayashi, & Akihiko Ishitani. (1982). An XPS study of Pd sputtered onto polyester film. Journal of Electron Spectroscopy and Related Phenomena. 27(3). 205–222. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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