F. Pichoir
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
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- X-ray Spectroscopy and Fluorescence Analysis
Papers in
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- Surface and Thin Film Phenomena 3
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- Electron and X-Ray Spectroscopy Techniques 3
- Co-authors
- J. L. Pouchou (5 shared papers)
- Journals
- Scanning (1 paper)Scanning microscopy (1 paper)Le Journal de Physique Colloques (2 papers)Proceedings annual meeting Electron Microscopy Society of America (1 paper)
- Partner nations
- France
In The Last Decade
F. Pichoir
5 papers receiving 108 citations
Peers
Comparison fields: 5 of 30
- Surfaces, Coatings and Films 52
- Radiation 23
- Structural Biology 2
- Ceramics and Composites 7
- Metals and Alloys 3
Countries citing papers authored by F. Pichoir
This map shows the geographic impact of F. Pichoir's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Pichoir with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Pichoir more than expected).
Fields of papers citing papers by F. Pichoir
This network shows the impact of papers produced by F. Pichoir. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Pichoir. The network helps show where F. Pichoir may publish in the future.
Co-authors
The 1 scholars most cited alongside F. Pichoir, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1990 | 81 | |
| 2 | Electron Probe X-Ray Microanalysis Applied to Thin Surface Films and Stratified Specimens | 1993 | 17 |
| 3 | 1984 | 7 | |
| 4 | 1984 | 6 | |
| 5 | 1990 | 1 |
About F. Pichoir
F. Pichoir is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Biomedical Engineering, Radiation and Materials Chemistry, having authored 5 papers that have together received 112 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (3 papers), Surface and Thin Film Phenomena (3 papers), Advanced Materials Characterization Techniques (3 papers), Crystallization and Solubility Studies (1 paper) and X-ray Spectroscopy and Fluorescence Analysis (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (52 citations), Radiation (23 citations), Structural Biology (2 citations), Ceramics and Composites (7 citations) and Metals and Alloys (3 citations). F. Pichoir has collaborated with scholars based in France. Frequent co-authors include J. L. Pouchou. Their work appears in journals such as Scanning, Scanning microscopy, Le Journal de Physique Colloques and Proceedings annual meeting Electron Microscopy Society of America.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.