F. Firszt
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Mechanics of Materials top 5%
- Biomedical Engineering
- Co-authors
- H. ΜęczyńskaS. ŁęgowskiW. PaszkowiczJ. SzatkowskiK. StrzałkowskiJ. ZakrzewskiA.A. WronkowskaMichael Pawlak
- Topics
- Chalcogenide Semiconductor Thin Films (92 papers)Semiconductor Quantum Structures and Devices (55 papers)Advanced Semiconductor Detectors and Materials (50 papers)
In The Last Decade
F. Firszt
123 papers receiving 875 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 702
- Materials Chemistry 484
- Atomic and Molecular Physics, and Optics 379
- Mechanics of Materials 206
- Biomedical Engineering 109
Countries citing papers authored by F. Firszt
This map shows the geographic impact of F. Firszt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Firszt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Firszt more than expected).
Fields of papers citing papers by F. Firszt
This network shows the impact of papers produced by F. Firszt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Firszt. The network helps show where F. Firszt may publish in the future.
Co-authorship network of co-authors of F. Firszt
This figure shows the co-authorship network connecting the top 25 collaborators of F. Firszt. A scholar is included among the top collaborators of F. Firszt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Firszt. F. Firszt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 6 | |
| 2 | 3 | |
| 3 | 5 | |
| 4 | 27 | |
| 5 | 5 | |
| 6 | 13 | |
| 7 | 19 | |
| 8 | 1 | |
| 9 | 2 | |
| 10 | 3 | |
| 11 | 6 | |
| 12 | 5 | |
| 13 | 1 | |
| 14 | 7 | |
| 15 | Photoelectric and photothermal properties of selected II-VI mixed crystals | 1 |
| 16 | 2 | |
| 17 | 9 | |
| 18 | 4 | |
| 19 | STUDY OF ZN1-XMGXSE AND ZN1-XBEXSE SEMICONDUCTING CRYSTALLS BY RAMAN SCATTERING | 1 |
| 20 | 24 |
About F. Firszt
F. Firszt is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Materials Chemistry, having authored 130 papers that have together received 902 indexed citations. Recurring topics across this work include Chalcogenide Semiconductor Thin Films (92 papers), Semiconductor Quantum Structures and Devices (55 papers) and Advanced Semiconductor Detectors and Materials (50 papers). The work is most often cited by research in Electrical and Electronic Engineering (702 citations), Atomic and Molecular Physics, and Optics (379 citations) and Materials Chemistry (484 citations). F. Firszt has collaborated with scholars based in Poland, Taiwan and France. Frequent co-authors include H. Μęczyńska, S. Łęgowski, W. Paszkowicz, J. Szatkowski, K. Strzałkowski, J. Zakrzewski, A.A. Wronkowska, Michael Pawlak, T. L. Chu and Shirley S. Chu. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.