Erik Stijns
- Electrical and Electronic Engineering
- Materials Chemistry
- Mechanical Engineering
- Computer Vision and Pattern Recognition top 10%
- Atomic and Molecular Physics, and Optics
- Co-authors
- Shi PanHerman TerrynSake Van GilsChristophe Le PenAnnick HubinMorgan R. AlexanderV. GoossensTh. Dimogerontakis
- Topics
- Photonic and Optical Devices (8 papers)Surface Roughness and Optical Measurements (7 papers)Corrosion Behavior and Inhibition (5 papers)
- Partner nations
- BelgiumNetherlandsPoland
In The Last Decade
Erik Stijns
24 papers receiving 392 citations
Peers
Comparison fields: 5 of 59
- Electrical and Electronic Engineering 162
- Materials Chemistry 154
- Mechanical Engineering 112
- Computer Vision and Pattern Recognition 89
- Atomic and Molecular Physics, and Optics 77
Countries citing papers authored by Erik Stijns
This map shows the geographic impact of Erik Stijns's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Erik Stijns with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Erik Stijns more than expected).
Fields of papers citing papers by Erik Stijns
This network shows the impact of papers produced by Erik Stijns. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Erik Stijns. The network helps show where Erik Stijns may publish in the future.
Co-authorship network of co-authors of Erik Stijns
This figure shows the co-authorship network connecting the top 25 collaborators of Erik Stijns. A scholar is included among the top collaborators of Erik Stijns based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Erik Stijns. Erik Stijns is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 15 | |
| 3 | 14 | |
| 4 | 5 | |
| 5 | 29 | |
| 6 | Colour properties of barrier anodic oxide films on aluminium and titanium studied with total reflectance and spectroscopic ellipsometry | 1 |
| 7 | 10 | |
| 8 | 1 | |
| 9 | 11 | |
| 10 | Polarizing holographic optical elements in Du Pont’s Omnidex Films | 1 |
| 11 | 12 | |
| 12 | 7 | |
| 13 | 5 | |
| 14 | 66 | |
| 15 | 7 | |
| 16 | 1 | |
| 17 | 9 | |
| 18 | 1 | |
| 19 | 2 | |
| 20 | 0 |
About Erik Stijns
Erik Stijns is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Atomic and Molecular Physics, and Optics, having authored 27 papers that have together received 408 indexed citations. Recurring topics across this work include Photonic and Optical Devices (8 papers), Surface Roughness and Optical Measurements (7 papers) and Corrosion Behavior and Inhibition (5 papers). The work is most often cited by research in Metals and Alloys (17 citations), Surfaces, Coatings and Films (31 citations) and Computer Vision and Pattern Recognition (89 citations). Erik Stijns has collaborated with scholars based in Belgium, Netherlands and Poland. Frequent co-authors include Shi Pan, Herman Terryn, Sake Van Gils, Christophe Le Pen, Annick Hubin, Morgan R. Alexander, V. Goossens, Th. Dimogerontakis, P. Skeldon and G.E. Thompson. Their work appears in journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.