J. K. Weiss

617 total citations
23 papers, 451 citations indexed

About

J. K. Weiss is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, J. K. Weiss has authored 23 papers receiving a total of 451 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Surfaces, Coatings and Films, 13 papers in Structural Biology and 9 papers in Electrical and Electronic Engineering. Recurrent topics in J. K. Weiss's work include Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Electron Microscopy Techniques and Applications (13 papers) and X-ray Spectroscopy and Fluorescence Analysis (5 papers). J. K. Weiss is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Electron Microscopy Techniques and Applications (13 papers) and X-ray Spectroscopy and Fluorescence Analysis (5 papers). J. K. Weiss collaborates with scholars based in United States, Austria and Czechia. J. K. Weiss's co-authors include W.J. de Ruijter, David J. Smith, M. Gajdardziska‐Josifovska, Jian‐Min Zuo, Jeff Drucker, M. R. Scheinfein, R. W. Carpenter, Peter Rez, Amith Darbal and C. B. Vartuli and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

J. K. Weiss

23 papers receiving 426 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. K. Weiss United States	10	270	217	156	135	99	23	451
E. Völkl Germany	8	330 1.2×	199 0.9×	206 1.3×	103 0.8×	128 1.3×	17	481
W.D. Rau Germany	8	433 1.6×	294 1.4×	172 1.1×	247 1.8×	146 1.5×	16	595
Ryusuke Sagawa Japan	7	318 1.2×	249 1.1×	77 0.5×	111 0.8×	198 2.0×	27	494
H. Ryll Germany	8	399 1.5×	323 1.5×	105 0.7×	124 0.9×	233 2.4×	22	572
D. Maneuski United Kingdom	12	162 0.6×	168 0.8×	89 0.6×	206 1.5×	183 1.8×	49	512
T. Mulvey United Kingdom	12	123 0.5×	198 0.9×	93 0.6×	150 1.1×	135 1.4×	49	457
Marcel Möller Germany	10	313 1.2×	127 0.6×	319 2.0×	179 1.3×	55 0.6×	16	589
Takahisa Doi Japan	14	88 0.3×	135 0.6×	336 2.2×	136 1.0×	31 0.3×	29	464
C. M. Scoby United States	11	232 0.9×	132 0.6×	207 1.3×	232 1.7×	156 1.6×	15	533
G.F. Missiroli Italy	8	183 0.7×	114 0.5×	272 1.7×	68 0.5×	62 0.6×	16	398

Countries citing papers authored by J. K. Weiss

Since Specialization

Citations

This map shows the geographic impact of J. K. Weiss's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. K. Weiss with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. K. Weiss more than expected).

Fields of papers citing papers by J. K. Weiss

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. K. Weiss. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. K. Weiss. The network helps show where J. K. Weiss may publish in the future.

Co-authorship network of co-authors of J. K. Weiss

This figure shows the co-authorship network connecting the top 25 collaborators of J. K. Weiss. A scholar is included among the top collaborators of J. K. Weiss based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. K. Weiss. J. K. Weiss is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Daniel, R., J. K. Weiss, Amith Darbal, et al.. (2016). Cross-sectional stress distribution in Al x Ga 1-x N heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction. Materials & Design. 106. 476–481. 11 indexed citations

Weiss, J. K., et al.. (2014). Highly Automated Electron Energy-Loss Spectroscopy Elemental Quantification. Microscopy and Microanalysis. 20(3). 798–806. 2 indexed citations

Yedra, Lluís, Pau Torruella, Alberto Eljarrat, et al.. (2014). Precessed electron beam electron energy loss spectroscopy of graphene: Beyond channelling effects. Applied Physics Letters. 105(5). 2 indexed citations

Darbal, Amith, et al.. (2014). Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs. Microscopy and Microanalysis. 20(S3). 1066–1067. 12 indexed citations

Darbal, Amith, et al.. (2013). Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession. Microscopy and Microanalysis. 19(S2). 702–703. 8 indexed citations

Gajdardziska‐Josifovska, M., J. K. Weiss, & J. M. Cowley. (1995). Studies of Mo/Si multilayers with coherent electron beams. Ultramicroscopy. 58(1). 65–78. 5 indexed citations

Gajdardziska‐Josifovska, M., et al.. (1993). Accurate measurements of mean inner potential of crystal wedges using digital electron holograms. Ultramicroscopy. 50(3). 285–299. 128 indexed citations

Drucker, Jeff, et al.. (1993). Electron coincidence spectroscopy studies of secondary and Auger electron generation mechanisms. Journal of Applied Physics. 74(12). 7329–7339. 17 indexed citations

Ruijter, W.J. de & J. K. Weiss. (1993). Detection limits in quantitative off-axis electron holography. Ultramicroscopy. 50(3). 269–283. 89 indexed citations

10.

Smith, David J., et al.. (1993). Progress towards quantitative high-resolution electron microscopy. Ultramicroscopy. 52(3-4). 591–601. 10 indexed citations

11.

Weiss, J. K., et al.. (1993). Applications of electron holography to the study of interfaces. Ultramicroscopy. 50(3). 301–311. 31 indexed citations

12.

Rez, Peter, et al.. (1992). The thickness determination of organic crystals under low dose conditions using electron energy loss spectroscopy. Microscopy Research and Technique. 21(2). 166–170. 5 indexed citations

13.

Scheinfein, M. R., et al.. (1992). The Origins of High Spatial Resolution Secondary Electron Microscopy. MRS Proceedings. 295. 2 indexed citations

14.

Weiss, J. K., et al.. (1992). A computer system for imaging and spectroscopy in analytical electron microscopy. Ultramicroscopy. 41(4). 291–301. 7 indexed citations

15.

Ruijter, W.J. de & J. K. Weiss. (1992). Methods to measure properties of slow-scan CCD cameras for electron detection. Review of Scientific Instruments. 63(10). 4314–4321. 69 indexed citations

16.

Horita, Zenji, et al.. (1992). Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis. Ultramicroscopy. 45(2). 263–265. 6 indexed citations

17.

Weiss, J. K. & R. W. Carpenter. (1992). Factors limiting the spatial resolution and sensitivity of EELS microanalysis in a STEM. Ultramicroscopy. 40(3). 339–351. 2 indexed citations

18.

Weiss, J. K., et al.. (1991). A study of small electron probe formation in a field emission gun TEM/STEM. Ultramicroscopy. 36(4). 319–329. 11 indexed citations

19.

Gajdardziska‐Josifovska, M., J. K. Weiss, & J. M. Cowley. (1991). Energy-filtered convergent beam RHEED rocking curves from cleaved (100) surface of MgO. Proceedings annual meeting Electron Microscopy Society of America. 49. 626–627. 1 indexed citations

20.

Youngman, R.A., et al.. (1989). Inversion Domain Boundaries and Oxygen Accommodation in Aluminum Nitride. MRS Proceedings. 167. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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