Michaël Abraham

1.3k citations
78 papers · 1.0k indexed · h-index 17

Michaël Abraham

75 papers receiving 962 citations

Peers

Michaël Abraham
Comparison fields: 5 of 80
  • Atomic and Molecular Physics, and Optics 397
  • Surfaces, Coatings and Films 68
  • Condensed Matter Physics 93
  • Electrical and Electronic Engineering 401
  • Materials Chemistry 302
Replace O. Crégut with:
O. Crégut France
W. F. Tseng United States
А.С. Трифонов Russia
C. Goletti Italy
J. C. Rivoal France
Riccardo Sabatini United States
Kui Han China
Yun-Ghi Yeo United Kingdom
М. В. Лебедев Russia
I. Vilfan Slovenia
Michaël Abraham relative to O. Crégut France O. Crégut's profile →
Citations per field
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O. Crégut · 1×
Citations per year

Countries citing papers authored by Michaël Abraham

Since Specialization
Citations

This map shows the geographic impact of Michaël Abraham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michaël Abraham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michaël Abraham more than expected).

Fields of papers citing papers by Michaël Abraham

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michaël Abraham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michaël Abraham. The network helps show where Michaël Abraham may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Michaël Abraham, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Michaël Abraham Line = papers co-authored together Michaël Abraham links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20218
2 20190
3 201831
4 20124
5 20125
6 20118
7 20115
8 201020
9 20096
10 20087
11 200812
12 199920
13 19985
14 199611
15 19954
16 199314
17 19927
18 19892
19 19866
20 19867

About Michaël Abraham

Michaël Abraham is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Physical and Theoretical Chemistry, having authored 78 papers that have together received 1.0k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (9 papers), Optical Coatings and Gratings (8 papers), Photonic and Optical Devices (7 papers), Near-Field Optical Microscopy (7 papers), Semiconductor Lasers and Optical Devices (6 papers), Logic, Reasoning, and Knowledge (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Molecular Junctions and Nanostructures (5 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (397 citations), Surfaces, Coatings and Films (68 citations) and Condensed Matter Physics (93 citations). Michaël Abraham has collaborated with scholars based in Germany, Israel and Austria. Frequent co-authors include Richard Berkovits, Suzanne E. Mohney, A. Tadjeddine, F. Laeri, Ferdi Schüth, Oliver Krauß, G. Ihlein, U. Vietze, W. Göpel and Bart Limburg. Their work appears in journals such as Surface Science, European Journal of Organic Chemistry, Journal of Micromechanics and Microengineering, Journal of Applied Physics and Physical review. B, Condensed matter.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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