E. J. Ashley

1.3k total citations
20 papers, 906 citations indexed

About

E. J. Ashley is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films. According to data from OpenAlex, E. J. Ashley has authored 20 papers receiving a total of 906 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 7 papers in Computational Mechanics and 7 papers in Surfaces, Coatings and Films. Recurrent topics in E. J. Ashley's work include Surface Roughness and Optical Measurements (6 papers), Thin-Film Transistor Technologies (6 papers) and Optical Coatings and Gratings (6 papers). E. J. Ashley is often cited by papers focused on Surface Roughness and Optical Measurements (6 papers), Thin-Film Transistor Technologies (6 papers) and Optical Coatings and Gratings (6 papers). E. J. Ashley collaborates with scholars based in United States. E. J. Ashley's co-authors include Jean M. Bennett, H. E. Bennett, T. M. Donovan, M. Silver, W. E. Spicer, J.L. Stanford, W. E. Spicer, D. K. Burge, J. T. Dickinson and R. C. O’Handley and has published in prestigious journals such as Applied Surface Science, Surface Science and Physics Letters A.

In The Last Decade

E. J. Ashley

20 papers receiving 812 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. J. Ashley United States 13 432 312 286 282 173 20 906
W. Dekeyser Belgium 17 222 0.5× 499 1.6× 158 0.6× 236 0.8× 86 0.5× 42 923
F. Hottier France 13 687 1.6× 525 1.7× 265 0.9× 347 1.2× 214 1.2× 23 1.3k
Toshiro Yamashina Japan 16 342 0.8× 540 1.7× 240 0.8× 142 0.5× 95 0.5× 96 957
E. Kótai Hungary 16 534 1.2× 443 1.4× 531 1.9× 193 0.7× 125 0.7× 78 1.1k
S. Rigo France 19 1.0k 2.4× 627 2.0× 279 1.0× 148 0.5× 183 1.1× 75 1.4k
D. Dieumegard France 12 398 0.9× 634 2.0× 169 0.6× 187 0.7× 81 0.5× 35 1.1k
G. Fuchs France 18 433 1.0× 691 2.2× 687 2.4× 184 0.7× 75 0.4× 75 1.3k
A. Norman Jette United States 15 184 0.4× 323 1.0× 178 0.6× 381 1.4× 52 0.3× 46 941
L. L. Levenson United States 16 223 0.5× 355 1.1× 89 0.3× 150 0.5× 139 0.8× 58 784
S. R. Nagel United States 11 333 0.8× 215 0.7× 112 0.4× 181 0.6× 56 0.3× 30 703

Countries citing papers authored by E. J. Ashley

Since Specialization
Citations

This map shows the geographic impact of E. J. Ashley's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. J. Ashley with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. J. Ashley more than expected).

Fields of papers citing papers by E. J. Ashley

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. J. Ashley. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. J. Ashley. The network helps show where E. J. Ashley may publish in the future.

Co-authorship network of co-authors of E. J. Ashley

This figure shows the co-authorship network connecting the top 25 collaborators of E. J. Ashley. A scholar is included among the top collaborators of E. J. Ashley based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. J. Ashley. E. J. Ashley is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Dickinson, J. T., et al.. (1987). Electron enhanced sorption of fluorine by silver surfaces. Applied Surface Science. 28(3). 311–322. 6 indexed citations
2.
Dickinson, J. T., et al.. (1985). Electron-induced damage of ThF4 thin films in the presence of XeF2. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(3). 647–650. 3 indexed citations
3.
Dickinson, J. T., et al.. (1984). The chemical sputtering of silica by Ar+ ions and XeF2. Surface Science. 141(2-3). 409–416. 22 indexed citations
4.
O’Handley, R. C., D. K. Burge, S. N. Jasperson, & E. J. Ashley. (1975). Residual gas and the optical properties of silver films. Surface Science. 50(2). 407–433. 25 indexed citations
5.
Burge, D. K., H. E. Bennett, & E. J. Ashley. (1973). Effect of Atmospheric Exposure on the Infrared Reflectance of Silvered Mirrors With and Without Protective Coatings. Applied Optics. 12(1). 42–42. 27 indexed citations
6.
Bennett, Jean M. & E. J. Ashley. (1973). Investigation of Film Thickness Uniformity on Substrates Located Close to the Source Axis. Applied Optics. 12(4). 758–758. 3 indexed citations
7.
Bennett, Jean M. & E. J. Ashley. (1972). Calibration of Instruments Measuring Reflectance and Transmittance. Applied Optics. 11(8). 1749–1749. 7 indexed citations
8.
Donovan, T. M., W. E. Spicer, Jean M. Bennett, & E. J. Ashley. (1970). Optical Properties of Amorphous Germanium Films. Physical review. B, Solid state. 2(2). 397–413. 151 indexed citations
9.
Bennett, Jean M., J.L. Stanford, & E. J. Ashley. (1970). Optical Constants of Silver Sulfide Tarnish Films*. Journal of the Optical Society of America. 60(2). 224–224. 115 indexed citations
10.
Donovan, T. M., E. J. Ashley, & W. E. Spicer. (1970). A high density form of amorphous Ge. Physics Letters A. 32(2). 85–86. 61 indexed citations
11.
Koehler, W. F. & E. J. Ashley. (1970). Elliptical Evaporation Tanks with Vertical Base and Cover Plates. Applied Optics. 9(12). 2801–2801. 2 indexed citations
12.
Bennett, H. E., et al.. (1968). Verification of the Anomalous-Skin-Effect Theory for Silver in the Infrared. Physical Review. 165(3). 755–764. 85 indexed citations
13.
Donovan, T. M., E. J. Ashley, & H. E. Bennett. (1965). Errata: Effect of Surface Damage on the Reflectance of Germanium in the 2650–10 000-Å RegionReflectance of Evaporated Germanium Films. Journal of the Optical Society of America. 55(2). 210–210. 20 indexed citations
14.
Bennett, Jean M., E. J. Ashley, & H. E. Bennett. (1965). Use of an Evaporated Dielectric Film for Determining the Optical Constants of a Metal I. Applied Optics. 4(8). 961–961. 5 indexed citations
15.
Bennett, Jean M. & E. J. Ashley. (1965). Infrared Reflectance and Emittance of Silver and Gold Evaporated in Ultrahigh Vacuum. Applied Optics. 4(2). 221–221. 127 indexed citations
16.
Donovan, T. M. & E. J. Ashley. (1964). Reflectance of Evaporated Germanium Films. Journal of the Optical Society of America. 54(9). 1141–1141. 14 indexed citations
17.
Bennett, H. E., Jean M. Bennett, & E. J. Ashley. (1963). The Effect of Protective Coatings of MgF_2 and SiO on the Reflectance of Aluminized Mirrors. Applied Optics. 2(2). 156–156. 5 indexed citations
18.
Bennett, H. E., M. Silver, & E. J. Ashley. (1963). Infrared Reflectance of Aluminum Evaporated in Ultra-High Vacuum. Journal of the Optical Society of America. 53(9). 1089–1089. 127 indexed citations
19.
Donovan, T. M., E. J. Ashley, & H. E. Bennett. (1963). Effect of Surface Damage on the Reflectance of Germanium in the 2650–10 000-Å Region. Journal of the Optical Society of America. 53(12). 1403–1403. 48 indexed citations
20.
Bennett, H. E., Jean M. Bennett, & E. J. Ashley. (1962). Infrared Reflectance of Evaporated Aluminum Films. Journal of the Optical Society of America. 52(11). 1245–1245. 53 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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