E. F. Venger

565 citations
61 papers · 440 indexed · h-index 13

E. F. Venger

55 papers receiving 395 citations

Peers

E. F. Venger
Comparison fields: 5 of 54
  • Atomic and Molecular Physics, and Optics 157
  • Materials Chemistry 198
  • Biomedical Engineering 177
  • Electrical and Electronic Engineering 191
  • Electronic, Optical and Magnetic Materials 50
Replace M. S. Leung with:
M. S. Leung United States
Mario Barozzi Italy
S. S. Kosolobov Russia
J. M. Xu Canada
R. Chung United States
E. F. Venger Ukraine
Y. C. Chou Taiwan
Jacques Richard France
Skylar Deckoff–Jones United States
F. Alsina Spain
E. F. Venger relative to M. S. Leung United States M. S. Leung's profile →
Citations per field
00.5×3.9×
M. S. Leung · 1×
Citations per year

Countries citing papers authored by E. F. Venger

Since Specialization
Citations

This map shows the geographic impact of E. F. Venger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. F. Venger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. F. Venger more than expected).

Fields of papers citing papers by E. F. Venger

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. F. Venger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. F. Venger. The network helps show where E. F. Venger may publish in the future.

Co-authorship network

The 25 scholars most cited alongside E. F. Venger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. F. Venger Line = papers co-authored together E. F. Venger links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20241
2 20231
3 20200
4 20143
5 20138
6 20070
7
ELLIPSOMETRY AND AFM STUDY OF POST-DEPOSITION TRANSFORMATIONS IN VACUUM-EVAPORATED As-S-Se FILMS
20051
8 200419
9 20041
10 200216
11 200128
12 20013
13 20003
14 200030
15 19991
16 199914
17 199830
18 19981
19 19986
20 199811

About E. F. Venger

E. F. Venger is a scholar working on Atomic and Molecular Physics, and Optics, Materials Chemistry and Electrical and Electronic Engineering, having authored 61 papers that have together received 440 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (13 papers), Silicon Nanostructures and Photoluminescence (13 papers), Nanowire Synthesis and Applications (12 papers), Semiconductor Quantum Structures and Devices (11 papers), Advanced Semiconductor Detectors and Materials (9 papers), Semiconductor materials and devices (8 papers), Quantum Dots Synthesis And Properties (6 papers) and Chalcogenide Semiconductor Thin Films (6 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (157 citations), Materials Chemistry (198 citations) and Biomedical Engineering (177 citations). E. F. Venger has collaborated with scholars based in Ukraine, Russia and Poland. Frequent co-authors include А. В. Гончаренко, V. F. Mitin, Р. В. Конакова, Н. С. Болтовец, Yu.M. Shirshov, K.V. Shportko, Б. А. Снопок, М. P. Kulish, V. N. Sokolov and Franco Pavese. Their work appears in journals such as Physical Review B, Carbon and Sensors and Actuators B Chemical.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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