Dongmei Zeng

498 citations
46 papers · 377 indexed · h-index 13
Topics
Advanced Semiconductor Detectors and Materials (27 papers)Chalcogenide Semiconductor Thin Films (17 papers)Semiconductor Quantum Structures and Devices (14 papers)
Partner nations
ChinaGermanySerbia

In The Last Decade

Dongmei Zeng

41 papers receiving 362 citations

Peers

Dongmei Zeng
Comparison fields: 5 of 46
  • Electrical and Electronic Engineering 319
  • Materials Chemistry 148
  • Atomic and Molecular Physics, and Optics 120
  • Biomedical Engineering 64
  • Radiation 49
Replace Dominik Kowal with:
Dominik Kowal Poland
R. Kaigawa Japan
Chathuranga Hettiarachchi Singapore
Sarah Deumel Germany
Jing Nie China
Xieming Xu China
Kun Liang China
Carmelita Rodà Belgium
Wei Qu China
Judith E. Huerdler Germany
Dongmei Zeng relative to Dominik Kowal Poland Dominik Kowal's profile →
Citations per field
00.5×1.5×2.3×
Dominik Kowal · 1×
Citations per year

Countries citing papers authored by Dongmei Zeng

Since Specialization
Citations

This map shows the geographic impact of Dongmei Zeng's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dongmei Zeng with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dongmei Zeng more than expected).

Fields of papers citing papers by Dongmei Zeng

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dongmei Zeng. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dongmei Zeng. The network helps show where Dongmei Zeng may publish in the future.

Co-authorship network of co-authors of Dongmei Zeng

This figure shows the co-authorship network connecting the top 25 collaborators of Dongmei Zeng. A scholar is included among the top collaborators of Dongmei Zeng based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Dongmei Zeng. Dongmei Zeng is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 1
3 0
4 1
5 1
6 1
7 0
8 1
9 3
10 1
11 2
12 2
13 2
14 0
15 9
16 6
17 3
18 32
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20 13

About Dongmei Zeng

Dongmei Zeng is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 46 papers that have together received 377 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (27 papers), Chalcogenide Semiconductor Thin Films (17 papers) and Semiconductor Quantum Structures and Devices (14 papers). The work is most often cited by research in Radiation (49 citations), Electrical and Electronic Engineering (319 citations) and Atomic and Molecular Physics, and Optics (120 citations). Dongmei Zeng has collaborated with scholars based in China, Germany and Serbia. Frequent co-authors include Wanqi Jie, Tao Wang, Jijun Zhang, Gangqiang Zha, Hai Zhou, Ge Yang, Yadong Xu, Bo Yang, Yingge Yang and Bing Chen. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Materials Science and Engineering A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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