D.J. Walkey

578 total citations
33 papers, 405 citations indexed

About

D.J. Walkey is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Control and Systems Engineering. According to data from OpenAlex, D.J. Walkey has authored 33 papers receiving a total of 405 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 7 papers in Materials Chemistry and 5 papers in Control and Systems Engineering. Recurrent topics in D.J. Walkey's work include Advancements in Semiconductor Devices and Circuit Design (15 papers), Silicon Carbide Semiconductor Technologies (14 papers) and Thermal properties of materials (7 papers). D.J. Walkey is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (15 papers), Silicon Carbide Semiconductor Technologies (14 papers) and Thermal properties of materials (7 papers). D.J. Walkey collaborates with scholars based in Canada, United States and Germany. D.J. Walkey's co-authors include T. Smy, M. Schröter, D. Marchesan, D. Celo, S. K. Dew, M.C. Maliepaard, R. Surridge, M. Nakhla, Roni Khazaka and P. Gunupudi and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and Thin Solid Films.

In The Last Decade

D.J. Walkey

33 papers receiving 372 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
D.J. Walkey Canada	13	368	70	47	37	27	33	405
Djordje Djukic Serbia	10	130 0.4×	46 0.7×	128 2.7×	46 1.2×	99 3.7×	29	318
В. В. Афанасьев Russia	7	101 0.3×	28 0.4×	34 0.7×	22 0.6×	10 0.4×	30	171
S. Kumashiro Japan	14	467 1.3×	54 0.8×	102 2.2×	6 0.2×	51 1.9×	64	523
D.H. Navon United States	17	551 1.5×	70 1.0×	149 3.2×	4 0.1×	37 1.4×	43	598
Azad Siahmakoun United States	10	174 0.5×	31 0.4×	134 2.9×	23 0.6×	46 1.7×	71	282
Michel Aubourg France	11	293 0.8×	20 0.3×	103 2.2×	5 0.1×	74 2.7×	52	358
T. Merchant United States	11	249 0.7×	143 2.0×	51 1.1×	5 0.1×	65 2.4×	15	342
M. McAllister United States	8	384 1.0×	19 0.3×	40 0.9×	3 0.1×	21 0.8×	12	426
B. González Spain	9	195 0.5×	26 0.4×	35 0.7×	4 0.1×	22 0.8×	41	321
Jean‐Marc Duchamp France	14	748 2.0×	9 0.1×	75 1.6×	9 0.2×	76 2.8×	62	800

Countries citing papers authored by D.J. Walkey

Since Specialization

Citations

This map shows the geographic impact of D.J. Walkey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.J. Walkey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.J. Walkey more than expected).

Fields of papers citing papers by D.J. Walkey

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.J. Walkey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.J. Walkey. The network helps show where D.J. Walkey may publish in the future.

Co-authorship network of co-authors of D.J. Walkey

This figure shows the co-authorship network connecting the top 25 collaborators of D.J. Walkey. A scholar is included among the top collaborators of D.J. Walkey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.J. Walkey. D.J. Walkey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Guo, Xian, D. Celo, D.J. Walkey, & T. Smy. (2006). A General Method for the Connection of a Component Thermal Model to a Board. IEEE Transactions on Advanced Packaging. 29(2). 250–263. 2 indexed citations

Walkey, D.J.. (2005). Introduction to the Special Issue on the IEEE Bipolar/BiCMOS Circuits and Technology Meeting. IEEE Journal of Solid-State Circuits. 40(10). 1995–1996. 1 indexed citations

Celo, D., P. Gunupudi, Roni Khazaka, et al.. (2005). Hierarchical thermal analysis of large IC modules. IEEE Transactions on Components and Packaging Technologies. 28(2). 207–217. 6 indexed citations

Celo, D., Xiaoming Guo, P. Gunupudi, et al.. (2005). The creation of compact thermal models of electronic components using model reduction. IEEE Transactions on Advanced Packaging. 28(2). 240–251. 22 indexed citations

Walkey, D.J., T. Smy, D. Marchesan, et al.. (2003). Extraction and modelling of thermal behavior in trench isolated bipolar structures. 97–100. 10 indexed citations

Walkey, D.J., et al.. (2002). Modeling thermal resistance in trench-isolated bipolar technologies including trench heat flow. Solid-State Electronics. 46(1). 7–17. 30 indexed citations

Walkey, D.J., et al.. (2002). Linear models for temperature and power dependence of thermal resistance in Si, InP and GaAs substrate devices. 7. 228–232. 8 indexed citations

Walkey, D.J., D. Celo, T. Smy, & R. Surridge. (2002). A thermal design methodology for multifinger bipolar transistor structures. IEEE Transactions on Electron Devices. 49(8). 1375–1383. 23 indexed citations

Voinigescu, Sorin P., D. Marchesan, M.C. Maliepaard, et al.. (2002). Process- and geometry-scalable bipolar transistor and transmission line models for Si and SiGe MMICs in the 5-22 GHz range. 307–310. 9 indexed citations

10.

Walkey, D.J., et al.. (2002). A VCVS-based equivalent circuit model for static substrate thermal coupling. 102–105. 1 indexed citations

11.

Schröter, M., et al.. (2002). Simultaneous extraction of thermal and emitter series resistances in bipolar transistors. 170–173. 23 indexed citations

12.

Walkey, D.J., et al.. (2002). Prediction of thermal resistance in trench isolated bipolar device structures. 207–210. 19 indexed citations

13.

Smy, T., D.J. Walkey, & S. K. Dew. (2001). Transient 3D heat flow analysis for integrated circuit devices using the transmission line matrix method on a quad tree mesh. Solid-State Electronics. 45(7). 1137–1148. 21 indexed citations

14.

Smy, T., et al.. (2000). A simulation study of IC layout effects on thermal management of die attached GaAs ICs. IEEE Transactions on Components and Packaging Technologies. 23(2). 341–351. 16 indexed citations

15.

Walkey, D.J., et al.. (2000). A scalable thermal model for trench isolated bipolar devices. Solid-State Electronics. 44(8). 1373–1379. 15 indexed citations

16.

Schröter, M. & D.J. Walkey. (1998). Correction To "Physical Modeling Of Lateral Scaling In Bipolar Transistors". IEEE Journal of Solid-State Circuits. 33(1). 171–171. 1 indexed citations

17.

Ahmed, Anas, D.J. Walkey, & N. G. Tarr. (1997). A CMOS integrated pulse mode alpha-particle counter for application in radon monitoring. IEEE Transactions on Nuclear Science. 44(3). 1425–1430. 3 indexed citations

18.

Walkey, D.J., et al.. (1997). Forward transient charge injection in psn diodes at medium to high injection levels. IEEE Transactions on Electron Devices. 44(1). 190–194. 6 indexed citations

19.

Walkey, D.J., et al.. (1996). Subnanosecond 300 V diffused step recovery diode. Electronics Letters. 32(16). 1513–1515. 4 indexed citations

20.

Tarr, N. G., et al.. (1995). Short-channel effects on MOSFET subthreshold swing. Solid-State Electronics. 38(3). 697–701. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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