Rudolf Moellers

938 total citations · 1 hit paper
16 papers, 757 citations indexed

About

Rudolf Moellers is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Mechanics of Materials. According to data from OpenAlex, Rudolf Moellers has authored 16 papers receiving a total of 757 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Computational Mechanics, 6 papers in Electrical and Electronic Engineering and 4 papers in Mechanics of Materials. Recurrent topics in Rudolf Moellers's work include Ion-surface interactions and analysis (14 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). Rudolf Moellers is often cited by papers focused on Ion-surface interactions and analysis (14 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). Rudolf Moellers collaborates with scholars based in United Kingdom, Germany and Belgium. Rudolf Moellers's co-authors include E. Niehuis, Felix Kollmer, Derk Rading, Ian S. Gilmore, Rasmus Havelund, Henrik Arlinghaus, Alexander Pirkl, Morgan R. Alexander, Stevan Horning and Dmitry Grinfeld and has published in prestigious journals such as Analytical Chemistry, Nature Methods and Applied Surface Science.

In The Last Decade

Rudolf Moellers

15 papers receiving 741 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

2017 334 citations Melissa K. Passarelli, Alexander Pirkl et al. Nature Methods profile →

Peers

Rudolf Moellers

SPECT

EEE

Sadia Rabbani United Kingdom

Sara G. Ostrowski United States

Michaeleen L. Pacholski United States

Nina Ogrinc Netherlands

Claudia Bich France

Leiliang Zheng United States

Donald M. Cannon United States

Henrik Arlinghaus Germany

David J. Aaserud United States

Christopher Mullen United States

Sadia Rabbani United Kingdom

Rudolf Moellers

631 ×1.3

423 ×1.4

SPECT

161 ×0.8

156 ×0.9

EEE

143 ×0.9

Citations per year, relative to Rudolf Moellers Rudolf Moellers (= 1×) peers Sadia Rabbani

Countries citing papers authored by Rudolf Moellers

Since Specialization

Citations

This map shows the geographic impact of Rudolf Moellers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rudolf Moellers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rudolf Moellers more than expected).

Fields of papers citing papers by Rudolf Moellers

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Rudolf Moellers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rudolf Moellers. The network helps show where Rudolf Moellers may publish in the future.

Co-authorship network of co-authors of Rudolf Moellers

This figure shows the co-authorship network connecting the top 25 collaborators of Rudolf Moellers. A scholar is included among the top collaborators of Rudolf Moellers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Rudolf Moellers. Rudolf Moellers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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16 of 16 papers shown

Kollmer, Felix, et al.. (2020). Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces. Microscopy and Microanalysis. 26(S2). 76–77. 1 indexed citations

Passarelli, Melissa K., Alexander Pirkl, Rudolf Moellers, et al.. (2017). The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power. Nature Methods. 14(12). 1175–1183. 334 indexed citations breakdown →

Gilmore, Ian S., Rasmus Havelund, Alexander Pirkl, et al.. (2017). Label-free Imaging of Biomolecules in Murine Brain Sections Using the 3D OrbiSIMS. Protocol Exchange. 1 indexed citations

Pirkl, Alexander, Rudolf Moellers, Henrik Arlinghaus, et al.. (2016). A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis. Microscopy and Microanalysis. 22(S3). 340–341. 8 indexed citations

Niehuis, E., et al.. (2014). Dual beam depth profiling of organic materials: assessment of capabilities and limitations. Surface and Interface Analysis. 46(S1). 70–73. 6 indexed citations

Niehuis, E., et al.. (2014). In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures. Microscopy and Microanalysis. 20(S3). 2086–2087. 8 indexed citations

Wehbe, Nimer, Taoufiq Mouhib, Arnaud Delcorte, et al.. (2013). Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers. Analytical and Bioanalytical Chemistry. 406(1). 201–211. 12 indexed citations

Bich, Claudia, Rasmus Havelund, Rudolf Moellers, et al.. (2013). Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples. Analytical Chemistry. 85(16). 7745–7752. 80 indexed citations

Wehbe, Nimer, J. Brison, Taoufiq Mouhib, et al.. (2012). TOF‐SIMS depth profiling of multilayer amino‐acid films using large Argon cluster Ar _n ⁺ , C ₆₀ ⁺ and Cs ⁺ sputtering ions: A comparative study. Surface and Interface Analysis. 45(1). 178–180. 15 indexed citations

10.

Kollmer, Felix, et al.. (2012). Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application. Microscopy and Microanalysis. 18(S2). 904–905.

11.

Rading, Derk, et al.. (2012). Dual beam depth profiling of polymer materials: comparison of C ₆₀ and Ar cluster ion beams for sputtering. Surface and Interface Analysis. 45(1). 171–174. 67 indexed citations

12.

Rading, Derk, et al.. (2012). Surface spectrometry using large argon clusters. Surface and Interface Analysis. 45(1). 131–133. 34 indexed citations

13.

Shard, Alexander G., Rasmus Havelund, M. P. Seah, et al.. (2012). Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study. Analytical Chemistry. 84(18). 7865–7873. 124 indexed citations

14.

Rading, Derk, Rudolf Moellers, Felix Kollmer, Wolfgang Paul, & E. Niehuis. (2010). Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions. Surface and Interface Analysis. 43(1-2). 198–200. 16 indexed citations

15.

Niehuis, E., Thomas Grehl, Felix Kollmer, et al.. (2010). MCs ⁺ depth profiling using cluster primary ions. Surface and Interface Analysis. 43(1-2). 204–206. 9 indexed citations

16.

Grehl, Thomas, et al.. (2008). Depth profiling of organic materials using improved ion beam conditions. Applied Surface Science. 255(4). 966–969. 42 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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