Deepak A. Ramappa

401 total citations
19 papers, 335 citations indexed

About

Deepak A. Ramappa is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Deepak A. Ramappa has authored 19 papers receiving a total of 335 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 4 papers in Materials Chemistry. Recurrent topics in Deepak A. Ramappa's work include Silicon and Solar Cell Technologies (18 papers), Semiconductor materials and interfaces (12 papers) and Thin-Film Transistor Technologies (11 papers). Deepak A. Ramappa is often cited by papers focused on Silicon and Solar Cell Technologies (18 papers), Semiconductor materials and interfaces (12 papers) and Thin-Film Transistor Technologies (11 papers). Deepak A. Ramappa collaborates with scholars based in United States, Germany and France. Deepak A. Ramappa's co-authors include Worth B. Henley, P. J. Sullivan, Min Yuan, B. Colombeau, M.K. Emsley, Todd Henry, S. Peters, Atul Gupta, R. Pinacho and J. L. Benton and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Deepak A. Ramappa

18 papers receiving 319 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Deepak A. Ramappa United States	12	313	155	47	23	18	19	335
A. Bentzen Norway	10	317 1.0×	146 0.9×	85 1.8×	26 1.1×	23 1.3×	21	351
Ralf Jonczyk United States	7	338 1.1×	148 1.0×	116 2.5×	47 2.0×	23 1.3×	20	378
N.-P. Harder Germany	11	342 1.1×	156 1.0×	116 2.5×	22 1.0×	35 1.9×	33	405
J.F. Nijs Belgium	8	331 1.1×	124 0.8×	97 2.1×	56 2.4×	18 1.0×	13	357
A. Urueña Belgium	12	419 1.3×	166 1.1×	108 2.3×	40 1.7×	33 1.8×	47	430
H. Hedemann Germany	8	304 1.0×	203 1.3×	88 1.9×	21 0.9×	10 0.6×	12	322
P. Sana United States	7	309 1.0×	95 0.6×	140 3.0×	50 2.2×	28 1.6×	15	348
J. Michel Australia	8	276 0.9×	130 0.8×	109 2.3×	25 1.1×	21 1.2×	20	308
G. Hillier United States	10	293 0.9×	155 1.0×	54 1.1×	47 2.0×	24 1.3×	25	323
A. Wolf Germany	10	327 1.0×	142 0.9×	85 1.8×	27 1.2×	40 2.2×	54	344

Countries citing papers authored by Deepak A. Ramappa

Since Specialization

Citations

This map shows the geographic impact of Deepak A. Ramappa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Deepak A. Ramappa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Deepak A. Ramappa more than expected).

Fields of papers citing papers by Deepak A. Ramappa

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Deepak A. Ramappa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Deepak A. Ramappa. The network helps show where Deepak A. Ramappa may publish in the future.

Co-authorship network of co-authors of Deepak A. Ramappa

This figure shows the co-authorship network connecting the top 25 collaborators of Deepak A. Ramappa. A scholar is included among the top collaborators of Deepak A. Ramappa based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Deepak A. Ramappa. Deepak A. Ramappa is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

Veschetti, Y., et al.. (2012). Ion Implant Doping for n-Type Cz High Efficiency Industrial Boron Emitter Solar Cells with Single Activation Process. EU PVSEC. 1897–1900. 2 indexed citations

Colombeau, B., et al.. (2012). Physical understanding of cryogenic implant benefits for electrical junction stability. Applied Physics Letters. 100(11). 18 indexed citations

Emsley, M.K., et al.. (2012). Ion-implant doped large-area n-type Czochralski high-efficiency industrial solar cells. 2254–2257. 17 indexed citations

Monna, R., et al.. (2012). Annealing, Passivation and Contacting of Ion Implanted Phosphorus Emitter Solar Cells. Energy Procedia. 27. 580–585. 12 indexed citations

Colombeau, B., Deepak A. Ramappa, Todd Henry, et al.. (2011). Benefits of Damage Engineering for PMOS Junction Stability. AIP conference proceedings. 65–68. 8 indexed citations

Bateman, Nick, et al.. (2010). High Efficiency Selective Emitter Cells Using In-Situ Patterned Ion Implantation. EU PVSEC. 1158–1162. 23 indexed citations

Gupta, Atul, et al.. (2010). High efficiency selective emitter enabled through patterned ion implantation. 1440–1445. 39 indexed citations

Ramappa, Deepak A., et al.. (2003). Non-contact, in-line monitoring of low dose and low energy ion implantation. 42. 607–610.

Gilkes, Daniele M., et al.. (2002). Effect of copper seed aging on electroplating-induced defects in copper interconnects. Journal of Electronic Materials. 31(10). 1047–1051. 8 indexed citations

10.

Ramappa, Deepak A.. (2001). Quantitative analysis of copper contamination in silicon by surface photovoltage minority carrier lifetime analysis. AIP conference proceedings. 550. 215–219. 1 indexed citations

11.

Ramappa, Deepak A.. (2000). Surface photovoltage analysis of phase transformation of copper in p-type silicon. Applied Physics Letters. 76(25). 3756–3758. 26 indexed citations

12.

Benton, J. L., et al.. (2000). Dominant iron gettering mechanism in p/p+ silicon wafers. Applied Physics Letters. 77(2). 241–243. 8 indexed citations

13.

Ramappa, Deepak A. & Worth B. Henley. (1999). Effects of Copper Contamination in Silicon on Thin Oxide Breakdown. Journal of The Electrochemical Society. 146(6). 2258–2260. 30 indexed citations

14.

Ramappa, Deepak A. & Worth B. Henley. (1999). Diffusion of Iron in Silicon Dioxide. Journal of The Electrochemical Society. 146(10). 3773–3777. 39 indexed citations

15.

Henley, Worth B., et al.. (1999). Detection of copper contamination in silicon by surface photovoltage diffusion length measurements. Applied Physics Letters. 74(2). 278–280. 44 indexed citations

16.

Ramappa, Deepak A. & Worth B. Henley. (1998). Surface photovoltage analysis of copper in p-type silicon. Applied Physics Letters. 72(18). 2298–2300. 11 indexed citations

17.

Henley, Worth B. & Deepak A. Ramappa. (1997). Iron precipitation in float zone grown silicon. Journal of Applied Physics. 82(2). 589–594. 31 indexed citations

18.

Ramappa, Deepak A. & Worth B. Henley. (1997). Stability of Iron‐Silicide Precipitates in Silicon. Journal of The Electrochemical Society. 144(12). 4353–4356. 17 indexed citations

19.

Ramappa, Deepak A. & Worth B. Henley. (1997). Iron Precipitation and Dissolution in Float-Zone Silicon. MRS Proceedings. 481. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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