Ralf Jonczyk

469 total citations
20 papers, 378 citations indexed

About

Ralf Jonczyk is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Ralf Jonczyk has authored 20 papers receiving a total of 378 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 5 papers in Materials Chemistry. Recurrent topics in Ralf Jonczyk's work include Silicon and Solar Cell Technologies (14 papers), Thin-Film Transistor Technologies (10 papers) and Semiconductor materials and interfaces (8 papers). Ralf Jonczyk is often cited by papers focused on Silicon and Solar Cell Technologies (14 papers), Thin-Film Transistor Technologies (10 papers) and Semiconductor materials and interfaces (8 papers). Ralf Jonczyk collaborates with scholars based in United States, Germany and Netherlands. Ralf Jonczyk's co-authors include J.A. Rand, G. A. Rozgonyi, Zhonghou Cai, Matthew A. Marcus, Barry Lai, Tonio Buonassisi, A. A. Istratov, M. Heuer, M. Wagener and Giso Hahn and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Thin Solid Films.

In The Last Decade

Ralf Jonczyk

19 papers receiving 362 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ralf Jonczyk United States 7 338 148 116 47 23 20 378
Paul Gundel Germany 13 437 1.3× 131 0.9× 134 1.2× 22 0.5× 22 1.0× 34 462
Friedemann D. Heinz Germany 15 649 1.9× 175 1.2× 235 2.0× 68 1.4× 58 2.5× 60 684
Franziska Wolny Germany 13 272 0.8× 187 1.3× 219 1.9× 38 0.8× 59 2.6× 28 455
Emanuele Cornagliotti Belgium 14 565 1.7× 253 1.7× 147 1.3× 50 1.1× 49 2.1× 72 585
Gabriel Micard Germany 10 326 1.0× 105 0.7× 82 0.7× 31 0.7× 54 2.3× 40 340
C. Miazza Switzerland 8 383 1.1× 41 0.3× 234 2.0× 66 1.4× 26 1.1× 15 424
Shinsuke Sadamitsu Japan 13 348 1.0× 122 0.8× 138 1.2× 54 1.1× 3 0.1× 20 376
S. Asher United States 12 640 1.9× 205 1.4× 534 4.6× 33 0.7× 22 1.0× 31 675
Z. Rouabah Algeria 11 409 1.2× 95 0.6× 327 2.8× 11 0.2× 41 1.8× 29 493
Z.T. Kuźnicki France 9 246 0.7× 110 0.7× 181 1.6× 99 2.1× 9 0.4× 65 299

Countries citing papers authored by Ralf Jonczyk

Since Specialization
Citations

This map shows the geographic impact of Ralf Jonczyk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ralf Jonczyk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ralf Jonczyk more than expected).

Fields of papers citing papers by Ralf Jonczyk

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ralf Jonczyk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ralf Jonczyk. The network helps show where Ralf Jonczyk may publish in the future.

Co-authorship network of co-authors of Ralf Jonczyk

This figure shows the co-authorship network connecting the top 25 collaborators of Ralf Jonczyk. A scholar is included among the top collaborators of Ralf Jonczyk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ralf Jonczyk. Ralf Jonczyk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hofstetter, Jasmin, et al.. (2019). Effective Lifetime Approaching 1 ms in High‐Resistivity p‐Type Kerfless Multi‐Crystalline Wafers. Solar RRL. 3(4). 1 indexed citations
2.
Jonczyk, Ralf, et al.. (2017). Next generation Direct Wafer® technology delivers low cost, high performance to silicon wafer industry. Energy Procedia. 130. 2–6. 7 indexed citations
3.
Jonczyk, Ralf, et al.. (2016). Low-cost Kerfless Wafers with Gradient Dopant Concentration Exceeding 19% Cell Efficiency in PERC Production Line. Energy Procedia. 92. 822–827. 3 indexed citations
4.
Sachs, Emanuel M., et al.. (2013). Direct Wafer™ - High Performance 156mm Silicon Wafers at Half the Cost of Sawn. EU PVSEC. 907–910. 4 indexed citations
5.
Seren, Sven, et al.. (2006). Ribbon Growth on Substrate and Molded Wafer-Two Low Cost Silicon Ribbon Materials for PV. 1330–1333. 5 indexed citations
6.
Buonassisi, Tonio, A. A. Istratov, Matthew D. Pickett, et al.. (2006). Distributions of metal impurities in multicrystalline silicon materials. 2 indexed citations
7.
Buonassisi, Tonio, A. A. Istratov, Matthew D. Pickett, et al.. (2006). Chemical natures and distributions of metal impurities in multicrystalline silicon materials. Progress in Photovoltaics Research and Applications. 14(6). 513–531. 150 indexed citations
8.
Jonczyk, Ralf, et al.. (2006). Single Wafer Casting. 1415–1416. 2 indexed citations
9.
Buonassisi, Tonio, A. A. Istratov, M. Heuer, et al.. (2005). Synchrotron-based investigations of the nature and impact of iron contamination in multicrystalline silicon solar cells. Journal of Applied Physics. 97(7). 93 indexed citations
10.
Rozgonyi, G. A., et al.. (2004). Secondary phase inclusions in polycrystalline sheet silicon. Journal of Crystal Growth. 269(2-4). 599–605. 24 indexed citations
11.
Rozgonyi, G. A., et al.. (2004). Oxygen precipitate denuded zone in polycrystalline sheet silicon. Applied Physics Letters. 85(7). 1178–1180. 2 indexed citations
12.
Mauk, Michael G., et al.. (2003). Solar-grade silicon: the next decade. 3rd World Conference onPhotovoltaic Energy Conversion, 2003. Proceedings of. 1. 939–942. 5 indexed citations
13.
Rozgonyi, G. A., et al.. (2003). Evaluation of Silicon Sheet Film Growth and Wafer Processing via Structural, Chemical and Electrical Diagnostics. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 95-96. 211–216. 2 indexed citations
14.
Jonczyk, Ralf, et al.. (2003). Thin silicon-on-ceramic solar cells. 82–85. 2 indexed citations
15.
Wagener, M., et al.. (2003). Effects of grain boundary on impurity gettering and oxygen precipitation in polycrystalline sheet silicon. Journal of Applied Physics. 94(1). 140–144. 52 indexed citations
16.
Jonczyk, Ralf, M. W. Dashiell, A. Khan, et al.. (1999). Strain modification in thin Si1−x−yGexCy alloys on (100) Si for formation of high density and uniformly sized quantum dots. Journal of Applied Physics. 85(1). 578–582. 7 indexed citations
17.
Jonczyk, Ralf, Dmitry Hits, Leonid V. Kulik, et al.. (1998). Size distribution of SiGeC quantum dots grown on Si(311) and Si(001) surfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(3). 1142–1144. 4 indexed citations
18.
Voss, Neil, R. Lange, Jennifer M. Dolan, et al.. (1998). Optical properties and band structure of Ge1−yCy and Ge-rich Si1−x−yGexCy alloys. Thin Solid Films. 313-314. 172–176. 1 indexed citations
19.
Chowdhury, Enam, M. W. Dashiell, Guohua Qiu, et al.. (1998). Structural, optical and electronic properties of oxidized AIN thin films at different temperatures. Journal of Electronic Materials. 27(7). 918–922. 9 indexed citations
20.
Jonczyk, Ralf, et al.. (1997). Electrical properties of Si1−x−yGexCy and Ge1−yCy alloys. Journal of Electronic Materials. 26(12). 1371–1375. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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