Daniel Kiefer
- Information Systems top 5%
- Management Information Systems top 10%
- Management of Technology and Innovation top 10%
- Computer Networks and Communications
- Artificial Intelligence
- Co-authors
- Michael StupperichAldo DagninoJohn H R MayDirk MuthigTuomo KähkönenMikael LindvallClemens van Dinther
- Topics
- Manufacturing Process and Optimization (3 papers)Industrial Vision Systems and Defect Detection (3 papers)Forecasting Techniques and Applications (2 papers)
- Journals
- ComputerJournal of the Association for Information SystemsProcedia CIRP
- Partner nations
- GermanyNetherlandsFinland
In The Last Decade
Daniel Kiefer
5 papers receiving 194 citations
Peers
Comparison fields: 5 of 33
- Information Systems 166
- Management Information Systems 59
- Management of Technology and Innovation 50
- Computer Networks and Communications 36
- Artificial Intelligence 35
Countries citing papers authored by Daniel Kiefer
This map shows the geographic impact of Daniel Kiefer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Daniel Kiefer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Daniel Kiefer more than expected).
Fields of papers citing papers by Daniel Kiefer
This network shows the impact of papers produced by Daniel Kiefer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Daniel Kiefer. The network helps show where Daniel Kiefer may publish in the future.
Co-authorship network of co-authors of Daniel Kiefer
This figure shows the co-authorship network connecting the top 25 collaborators of Daniel Kiefer. A scholar is included among the top collaborators of Daniel Kiefer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Daniel Kiefer. Daniel Kiefer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 1 | |
| 4 | 0 | |
| 5 | 3 | |
| 6 | 13 | |
| 7 | Machine Learning in SME: An Empirical Study on Enablers and Success Factors | 26 |
| 8 | 177 |
About Daniel Kiefer
Daniel Kiefer is a scholar working on Industrial and Manufacturing Engineering, Management Science and Operations Research and Statistics, Probability and Uncertainty, having authored 8 papers that have together received 220 indexed citations. Recurring topics across this work include Manufacturing Process and Optimization (3 papers), Industrial Vision Systems and Defect Detection (3 papers) and Forecasting Techniques and Applications (2 papers). The work is most often cited by research in Information Systems (166 citations), Management of Technology and Innovation (50 citations) and Management Information Systems (59 citations). Daniel Kiefer has collaborated with scholars based in Germany, Netherlands and Finland. Frequent co-authors include Michael Stupperich, Aldo Dagnino, John H R May, Dirk Muthig, Tuomo Kähkönen, Mikael Lindvall and Clemens van Dinther. Their work appears in journals such as Computer, Journal of the Association for Information Systems and Procedia CIRP.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.