D.A. Redfern

428 total citations
23 papers, 325 citations indexed

About

D.A. Redfern is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Instrumentation. According to data from OpenAlex, D.A. Redfern has authored 23 papers receiving a total of 325 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 9 papers in Mechanics of Materials and 6 papers in Instrumentation. Recurrent topics in D.A. Redfern's work include Advanced Semiconductor Detectors and Materials (16 papers), Thermography and Photoacoustic Techniques (8 papers) and Advanced Optical Sensing Technologies (6 papers). D.A. Redfern is often cited by papers focused on Advanced Semiconductor Detectors and Materials (16 papers), Thermography and Photoacoustic Techniques (8 papers) and Advanced Optical Sensing Technologies (6 papers). D.A. Redfern collaborates with scholars based in Australia, United States and South Korea. D.A. Redfern's co-authors include L. Faraone, C.A. Musca, J.M. Dell, J. Antoszewski, J. R. Meyer, C. A. Hoffman, I. Vurgaftman, Jeffrey Lindemuth, E. P. Smith and Weifu Fang and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

In The Last Decade

D.A. Redfern

21 papers receiving 308 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D.A. Redfern Australia 10 256 138 65 59 57 23 325
J. Kaniewski Poland 12 307 1.2× 267 1.9× 70 1.1× 28 0.5× 15 0.3× 76 372
V. Gopal India 11 378 1.5× 195 1.4× 84 1.3× 99 1.7× 89 1.6× 36 406
H. P. Vyas India 11 287 1.1× 140 1.0× 67 1.0× 22 0.4× 31 0.5× 48 354
Francesco Sarubbi Netherlands 11 312 1.2× 80 0.6× 71 1.1× 50 0.8× 18 0.3× 24 364
H. G. Robinson United States 13 321 1.3× 180 1.3× 47 0.7× 48 0.8× 25 0.4× 34 356
Naohiro Kuze Japan 13 311 1.2× 207 1.5× 87 1.3× 19 0.3× 28 0.5× 54 388
M. F. Vilela United States 14 470 1.8× 337 2.4× 104 1.6× 52 0.9× 25 0.4× 51 510
Z. H. Ye China 6 274 1.1× 125 0.9× 56 0.9× 103 1.7× 54 0.9× 17 307
R. S. Hall United Kingdom 13 386 1.5× 220 1.6× 111 1.7× 74 1.3× 29 0.5× 22 433
G. M. Venzor United States 13 459 1.8× 257 1.9× 83 1.3× 116 2.0× 31 0.5× 35 480

Countries citing papers authored by D.A. Redfern

Since Specialization
Citations

This map shows the geographic impact of D.A. Redfern's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.A. Redfern with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.A. Redfern more than expected).

Fields of papers citing papers by D.A. Redfern

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.A. Redfern. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.A. Redfern. The network helps show where D.A. Redfern may publish in the future.

Co-authorship network of co-authors of D.A. Redfern

This figure shows the co-authorship network connecting the top 25 collaborators of D.A. Redfern. A scholar is included among the top collaborators of D.A. Redfern based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.A. Redfern. D.A. Redfern is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Fang, Weifu, Kazufumi Ito, & D.A. Redfern. (2005). A homogenization model for laser beam-induced current imaging and detection of non-uniformities in semiconductor arrays. Journal of Computational and Applied Mathematics. 194(2). 395–408. 3 indexed citations
2.
Redfern, D.A., John A. Thomas, C.A. Musca, J.M. Dell, & L. Faraone. (2005). Diffusion length measurements using laser beam induced current. 463–466. 1 indexed citations
3.
Redfern, D.A., Weifu Fang, C.A. Musca, J.M. Dell, & L. Faraone. (2005). Towards a laser beam induced current test structure for the nondestructive determination of junction depth in HgCdTe photodiodes. Journal of Bioresource Management. 169–172. 2 indexed citations
4.
Redfern, D.A., E. P. Smith, C.A. Musca, J.M. Dell, & L. Faraone. (2005). Interpretation of current flow in photodiode structures using laser beam-induced current for characterization and diagnostics. IEEE Transactions on Electron Devices. 53(1). 23–31. 28 indexed citations
5.
Redfern, D.A., C.A. Musca, J.M. Dell, & L. Faraone. (2005). Characterization of Electrically Active Defects in Photovoltaic Detector Arrays Using Laser Beam-Induced Current. IEEE Transactions on Electron Devices. 52(10). 2163–2174. 19 indexed citations
6.
Redfern, D.A., C.A. Musca, J.M. Dell, & L. Faraone. (2004). Non-contact evaluation of photodiode performance by laser beam induced current imaging. UWA Profiles and Research Repository (UWA). 45. 189–192.
7.
Redfern, D.A., C.A. Musca, J.M. Dell, & L. Faraone. (2004). Correlation of laser-beam-induced current with current-voltage measurements in HgCdTe photodiodes. Journal of Electronic Materials. 33(6). 560–571. 10 indexed citations
8.
Fang, Weifu, Kazufumi Ito, & D.A. Redfern. (2004). LBIC imaging of semiconductor arrays: the cross-sectional model. Mathematical and Computer Modelling. 40(1-2). 127–136. 2 indexed citations
9.
Redfern, D.A., Weifu Fang, Kazufumi Ito, et al.. (2003). Low temperature saturation of p–n junction laser beam induced current signals. Solid-State Electronics. 48(3). 409–414. 16 indexed citations
10.
Redfern, D.A., Kazufumi Ito, & Weifu Fang. (2002). Parameter Identification for Semiconductor Diodes by LBIC Imaging. SIAM Journal on Applied Mathematics. 62(6). 2149–2174. 20 indexed citations
11.
Kim, Young‐Ho, et al.. (2002). Analysis of hydrogenation effects on LWIR HgCdTe diode characteristics. 279–282. 1 indexed citations
12.
Nguyen, T.T., J. Antoszewski, C.A. Musca, et al.. (2002). Transport properties of reactive-ion-etching-induced p-to-n type converted layers in HgCdTe. Journal of Electronic Materials. 31(7). 652–659. 16 indexed citations
13.
Redfern, D.A., C.A. Musca, E. P. G. Smith, J.M. Dell, & L. Faraone. (2002). On the transient photoconductive decay technique for lifetime extraction in HgCdTe. 8. 275–278.
14.
Redfern, D.A., John A. Thomas, C.A. Musca, J.M. Dell, & L. Faraone. (2001). Diffusion length measurements in p-HgCdTe using laser beam induced current. Journal of Electronic Materials. 30(6). 696–703. 25 indexed citations
15.
Kim, Young Ho, et al.. (2000). Characteristics of gradually doped LWIR diodes by hydrogenation. Journal of Electronic Materials. 29(6). 859–864. 9 indexed citations
16.
Musca, C.A., D.A. Redfern, J.M. Dell, & L. Faraone. (2000). Laser beam induced current as a tool for HgCdTe photodiode characterisation. Microelectronics Journal. 31(7). 537–544. 19 indexed citations
17.
Smith, E. P., C.A. Musca, D.A. Redfern, J.M. Dell, & L. Faraone. (2000). H2-based dry plasma etching for mesa structuring of HgCdTe. Journal of Electronic Materials. 29(6). 853–858. 8 indexed citations
18.
Smith, E. P., C.A. Musca, D.A. Redfern, J.M. Dell, & L. Faraone. (1999). Reactive ion etching for mesa structuring in HgCdTe. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(5). 2503–2509. 7 indexed citations
19.
Musca, C.A., D.A. Redfern, E. P. Smith, et al.. (1999). Junction depth measurement in HgCdTe using laser beam induced current (LBIC). Journal of Electronic Materials. 28(6). 603–610. 27 indexed citations
20.
Vurgaftman, I., J. R. Meyer, C. A. Hoffman, et al.. (1998). Improved quantitative mobility spectrum analysis for Hall characterization. Journal of Applied Physics. 84(9). 4966–4973. 105 indexed citations

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