Christopher Nicklaw

832 total citations
11 papers, 681 citations indexed

About

Christopher Nicklaw is a scholar working on Electrical and Electronic Engineering, Ceramics and Composites and Materials Chemistry. According to data from OpenAlex, Christopher Nicklaw has authored 11 papers receiving a total of 681 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 3 papers in Ceramics and Composites and 3 papers in Materials Chemistry. Recurrent topics in Christopher Nicklaw's work include Semiconductor materials and devices (10 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). Christopher Nicklaw is often cited by papers focused on Semiconductor materials and devices (10 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). Christopher Nicklaw collaborates with scholars based in United States, Netherlands and Italy. Christopher Nicklaw's co-authors include Ronald D. Schrimpf, Daniel M. Fleetwood, Zhong-Yi Lu, Sokrates T. Pantelides, J. Félix, Hao Xiong, K.F. Galloway, Véronique Ferlet-Cavrois, A. Virtanen and Robert A. Reed and has published in prestigious journals such as Physical Review Letters, Journal of Non-Crystalline Solids and IEEE Electron Device Letters.

In The Last Decade

Christopher Nicklaw

11 papers receiving 651 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Christopher Nicklaw United States 10 595 172 87 65 33 11 681
Shang-Yuan Ren United States 8 260 0.4× 259 1.5× 53 0.6× 183 2.8× 30 0.9× 15 395
Hiroshi Yamada‐Kaneta Japan 10 285 0.5× 200 1.2× 17 0.2× 148 2.3× 15 0.5× 53 371
Yunzhong Zhu China 12 170 0.3× 227 1.3× 29 0.3× 136 2.1× 26 0.8× 28 317
Yu. L. Kopylov Russia 13 289 0.5× 341 2.0× 193 2.2× 144 2.2× 20 0.6× 41 449
Qiang Su China 7 224 0.4× 247 1.4× 57 0.7× 76 1.2× 29 0.9× 17 358
J.R. Bosnell India 11 248 0.4× 322 1.9× 83 1.0× 81 1.2× 40 1.2× 19 404
Е. Н. Хазанов Russia 9 108 0.2× 212 1.2× 65 0.7× 120 1.8× 26 0.8× 59 310
T. Shioda Japan 9 344 0.6× 223 1.3× 31 0.4× 143 2.2× 36 1.1× 17 430
S M Vatnik Russia 16 447 0.8× 356 2.1× 145 1.7× 280 4.3× 29 0.9× 46 543
W. R. Knolle United States 12 293 0.5× 194 1.1× 21 0.2× 37 0.6× 35 1.1× 23 357

Countries citing papers authored by Christopher Nicklaw

Since Specialization
Citations

This map shows the geographic impact of Christopher Nicklaw's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Christopher Nicklaw with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Christopher Nicklaw more than expected).

Fields of papers citing papers by Christopher Nicklaw

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Christopher Nicklaw. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Christopher Nicklaw. The network helps show where Christopher Nicklaw may publish in the future.

Co-authorship network of co-authors of Christopher Nicklaw

This figure shows the co-authorship network connecting the top 25 collaborators of Christopher Nicklaw. A scholar is included among the top collaborators of Christopher Nicklaw based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Christopher Nicklaw. Christopher Nicklaw is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

11 of 11 papers shown
1.
Javanainen, Arto, Marek Turowski, K.F. Galloway, et al.. (2017). Heavy Ion Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence. IEEE Transactions on Nuclear Science. 1–1. 44 indexed citations
2.
Javanainen, Arto, K.F. Galloway, Christopher Nicklaw, et al.. (2016). Incident angle effect on heavy ion induced reverse leakage current in SiC Schottky diodes. 1–4. 5 indexed citations
3.
Javanainen, Arto, K.F. Galloway, Christopher Nicklaw, et al.. (2016). Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence. IEEE Transactions on Nuclear Science. 64(1). 415–420. 81 indexed citations
4.
Pantelides, Sokrates T., Zhong-Yi Lu, Christopher Nicklaw, et al.. (2007). The E′ center and oxygen vacancies in SiO2. Journal of Non-Crystalline Solids. 354(2-9). 217–223. 50 indexed citations
5.
Lu, Zhong-Yi, Christopher Nicklaw, Daniel M. Fleetwood, Ronald D. Schrimpf, & S. T. Pantelides. (2002). The structure, properties, and dynamics of oxygen vacancies in amorphous SiO2. APS March Meeting Abstracts. 15 indexed citations
6.
Lu, Zhong-Yi, Christopher Nicklaw, Daniel M. Fleetwood, Ronald D. Schrimpf, & Sokrates T. Pantelides. (2002). Structure, Properties, and Dynamics of Oxygen Vacancies in AmorphousSiO2. Physical Review Letters. 89(28). 285505–285505. 168 indexed citations
7.
Fleetwood, Daniel M., Hao Xiong, Zhong-Yi Lu, et al.. (2002). Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices. IEEE Transactions on Nuclear Science. 49(6). 2674–2683. 132 indexed citations
8.
Nicklaw, Christopher, Zhong-Yi Lu, Daniel M. Fleetwood, Ronald D. Schrimpf, & Sokrates T. Pantelides. (2002). The structure, properties, and dynamics of oxygen vacancies in amorphous SiO/sub 2/. IEEE Transactions on Nuclear Science. 49(6). 2667–2673. 116 indexed citations
9.
Schrimpf, Ronald D., et al.. (2001). A hydrogen-transport-based interface-trap-generation model for hot-carrier reliability prediction. IEEE Electron Device Letters. 22(6). 290–292. 15 indexed citations
10.
Nicklaw, Christopher, Sokrates T. Pantelides, Daniel M. Fleetwood, et al.. (2000). Defects and nanocrystals generated by Si implantation into a-SiO/sub 2/. IEEE Transactions on Nuclear Science. 47(6). 2269–2275. 33 indexed citations
11.
Massengill, L. W., et al.. (1998). TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs. IEEE Transactions on Nuclear Science. 45(6). 2593–2599. 22 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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