Charles Chiang
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Industrial Vision Systems and Defect Detection
Papers in
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- VLSI and Analog Circuit Testing 16
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- Industrial Vision Systems and Defect Detection 5
- Co-authors
- Subarna SinhaIris Hui-Ru JiangYen‐Ting YuXuan ZengDian ZhouJamil KawaJianfeng LuoFan Yang
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (3 papers)International Journal of Circuit Theory and Applications (1 paper)ACM Transactions on Design Automation of Electronic Systems (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Analog Integrated Circuits and Signal Processing (1 paper)
- Partner nations
- United StatesSwitzerlandChina
In The Last Decade
Charles Chiang
36 papers receiving 563 citations
Peers
Comparison fields: 5 of 41
- Hardware and Architecture 167
- Industrial and Manufacturing Engineering 175
- Electrical and Electronic Engineering 486
- Media Technology 53
- Statistics, Probability and Uncertainty 33
Countries citing papers authored by Charles Chiang
This map shows the geographic impact of Charles Chiang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Charles Chiang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Charles Chiang more than expected).
Fields of papers citing papers by Charles Chiang
This network shows the impact of papers produced by Charles Chiang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Charles Chiang. The network helps show where Charles Chiang may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Charles Chiang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2026 | 0 | |
| 2 | 2026 | 0 | |
| 3 | 2025 | 2 | |
| 4 | 2016 | 21 | |
| 5 | 2015 | 80 | |
| 6 | 2014 | 1 | |
| 7 | 2013 | 3 | |
| 8 | 2013 | 40 | |
| 9 | 2012 | 25 | |
| 10 | 2009 | 23 | |
| 11 | 2009 | 23 | |
| 12 | 2007 | 32 | |
| 13 | 2007 | 0 | |
| 14 | 2007 | 0 | |
| 15 | 2007 | 21 | |
| 16 | 2007 | 3 | |
| 17 | 2006 | 5 | |
| 18 | 2004 | 1 | |
| 19 | 2004 | 6 | |
| 20 | 2003 | 4 |
About Charles Chiang
Charles Chiang is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering, Electrical and Electronic Engineering, Media Technology and Statistical and Nonlinear Physics, having authored 40 papers that have together received 599 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (16 papers), VLSI and Analog Circuit Testing (16 papers), VLSI and FPGA Design Techniques (13 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Industrial Vision Systems and Defect Detection (5 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers), Semiconductor materials and devices (4 papers) and Model Reduction and Neural Networks (3 papers). The work is most often cited by research in Hardware and Architecture (167 citations), Industrial and Manufacturing Engineering (175 citations), Electrical and Electronic Engineering (486 citations), Media Technology (53 citations) and Statistics, Probability and Uncertainty (33 citations). Charles Chiang has collaborated with scholars based in United States, Switzerland and China. Frequent co-authors include Subarna Sinha, Iris Hui-Ru Jiang, Yen‐Ting Yu, Xuan Zeng, Dian Zhou, Jamil Kawa, Jianfeng Luo, Fan Yang, Qing Su and Yangfeng Su. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, International Journal of Circuit Theory and Applications, ACM Transactions on Design Automation of Electronic Systems, IEEE Transactions on Semiconductor Manufacturing and Analog Integrated Circuits and Signal Processing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.