Cen Chen
Impact in
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- Reliability and Maintenance Optimization
Papers in
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- Silicon Carbide Semiconductor Technologies 9
- Advancements in Semiconductor Devices and Circuit Design 8
- Semiconductor materials and devices 7
- Integrated Circuits and Semiconductor Failure Analysis 5
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- Reliability and Maintenance Optimization 11
- Co-authors
- Xuerong Ye (23 shared papers)Guofu Zhai (21 shared papers)In-Seop Lee (6 shared papers)Yixing Wang (3 shared papers)George Vachtsevanos (3 shared papers)Yifan Hu (7 shared papers)Junxian Shen (1 shared paper)Shengmin Zhang (1 shared paper)
- Journals
- Microelectronics Reliability (5 papers)IEEE Transactions on Power Electronics (4 papers)Biomedical Materials (2 papers)IEEE Access (2 papers)Reliability Engineering & System Safety (2 papers)
- Partner nations
- ChinaSouth KoreaUnited States
In The Last Decade
Cen Chen
46 papers receiving 553 citations
Peers
Comparison fields: 5 of 97
- Safety, Risk, Reliability and Quality 84
- Statistics, Probability and Uncertainty 47
- Control and Systems Engineering 97
- Automotive Engineering 49
- Industrial and Manufacturing Engineering 35
Countries citing papers authored by Cen Chen
This map shows the geographic impact of Cen Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Cen Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Cen Chen more than expected).
Fields of papers citing papers by Cen Chen
This network shows the impact of papers produced by Cen Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Cen Chen. The network helps show where Cen Chen may publish in the future.
Co-authors
The 25 scholars most cited alongside Cen Chen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 107 | |
| 2 | 2020 | 61 | |
| 3 | 2019 | 36 | |
| 4 | 2022 | 30 | |
| 5 | 2019 | 26 | |
| 6 | 2012 | 26 | |
| 7 | 2021 | 25 | |
| 8 | 2022 | 22 | |
| 9 | 2022 | 20 | |
| 10 | 2015 | 19 | |
| 11 | 2022 | 17 | |
| 12 | 2015 | 14 | |
| 13 | 2014 | 14 | |
| 14 | 2018 | 13 | |
| 15 | 2021 | 11 | |
| 16 | 2015 | 10 | |
| 17 | 2023 | 9 | |
| 18 | 2017 | 8 | |
| 19 | 2022 | 8 | |
| 20 | 2018 | 8 |
About Cen Chen
Cen Chen is a scholar working on Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Automotive Engineering, Control and Systems Engineering and Statistics, Probability and Uncertainty, having authored 50 papers that have together received 560 indexed citations. Recurring topics across this work include Reliability and Maintenance Optimization (11 papers), Silicon Carbide Semiconductor Technologies (9 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Advanced Battery Technologies Research (7 papers), Semiconductor materials and devices (7 papers), Probabilistic and Robust Engineering Design (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Machine Fault Diagnosis Techniques (4 papers). The work is most often cited by research in Safety, Risk, Reliability and Quality (84 citations), Statistics, Probability and Uncertainty (47 citations), Control and Systems Engineering (97 citations), Automotive Engineering (49 citations) and Industrial and Manufacturing Engineering (35 citations). Cen Chen has collaborated with scholars based in China, South Korea and United States. Frequent co-authors include Xuerong Ye, Guofu Zhai, In-Seop Lee, Yixing Wang, George Vachtsevanos, Yifan Hu, Junxian Shen, Shengmin Zhang, Xiangdong Kong and Hoong Chuin Lau. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Power Electronics, Biomedical Materials, IEEE Access and Reliability Engineering & System Safety.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.