C. W. Chen

454 total citations
17 papers, 368 citations indexed

About

C. W. Chen is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, C. W. Chen has authored 17 papers receiving a total of 368 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 11 papers in Electronic, Optical and Magnetic Materials and 5 papers in Materials Chemistry. Recurrent topics in C. W. Chen's work include Copper Interconnects and Reliability (11 papers), Semiconductor materials and devices (11 papers) and Thin-Film Transistor Technologies (3 papers). C. W. Chen is often cited by papers focused on Copper Interconnects and Reliability (11 papers), Semiconductor materials and devices (11 papers) and Thin-Film Transistor Technologies (3 papers). C. W. Chen collaborates with scholars based in Taiwan and China. C. W. Chen's co-authors include Po‐Tsun Liu, Tien‐Chun Chang, T. M. Tsai, Chun-Ting Lin, Hsuan-Han Huang, Fengyi Wu, Sien Chi, Simon M. Sze, Chia-Chien Wei and Y. S. Mor and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Thin Solid Films.

In The Last Decade

C. W. Chen

16 papers receiving 362 citations

Peers

C. W. Chen

EEE

EOMM

Shoumian Chen China

Mu-Tao Chu Taiwan

Ya‐Liang Yang Taiwan

David C. Miller United States

C. Huffman United States

D. D. Steele United States

Andrey Semichaevsky United States

В. В. Наумов Russia

Peide Han China

Shoumian Chen China

C. W. Chen

285 ×0.9

EEE

62 ×0.5

101 ×1.1

EOMM

45 ×0.9

55 ×1.2

Citations per year, relative to C. W. Chen C. W. Chen (= 1×) peers Shoumian Chen

Countries citing papers authored by C. W. Chen

Since Specialization

Citations

This map shows the geographic impact of C. W. Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. W. Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. W. Chen more than expected).

Fields of papers citing papers by C. W. Chen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. W. Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. W. Chen. The network helps show where C. W. Chen may publish in the future.

Co-authorship network of co-authors of C. W. Chen

This figure shows the co-authorship network connecting the top 25 collaborators of C. W. Chen. A scholar is included among the top collaborators of C. W. Chen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. W. Chen. C. W. Chen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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17 of 17 papers shown

Chen, C. W., et al.. (2025). Frequency-domain 4N × 2 MIMO adaptive equalizer for multi-aperture coherent digital combining FSO communication. Optics & Laser Technology. 190. 113235–113235.

Wu, Fengyi, Chun-Ting Lin, Chia-Chien Wei, et al.. (2013). Performance Comparison of OFDM Signal and CAP Signal Over High Capacity RGB-LED-Based WDM Visible Light Communication. IEEE photonics journal. 5(4). 7901507–7901507. 144 indexed citations

Chang, Tien‐Chun, et al.. (2009). Thermal analysis on the degradation of poly-silicon TFTs under AC stress. Materials Chemistry and Physics. 116(2-3). 344–347. 3 indexed citations

Chen, Yu‐Cheng, et al.. (2005). 27.2: Characterizations of Flash Memory on Glass Using LTPS TFT with an Ultra‐Low‐Roughness Poly‐Si/SiO ₂ Interface. SID Symposium Digest of Technical Papers. 36(1). 1152–1555. 5 indexed citations

Chen, C. W., et al.. (2004). Cu-penetration induced breakdown mechanism for a-SiCN. Thin Solid Films. 469-470. 388–392. 9 indexed citations

Chang, Tien‐Chun, et al.. (2004). Quasisuperlattice storage: A concept of multilevel charge storage. Applied Physics Letters. 85(2). 248–250. 16 indexed citations

Chen, C. W., Ting‐Chang Chang, Po‐Tsun Liu, T. M. Tsai, & Tseung‐Yuen Tseng. (2004). Effects of Oxygen Plasma Ashing on Barrier Dielectric SiCN Film. Electrochemical and Solid-State Letters. 8(1). G11–G11. 9 indexed citations

Chang, Tien‐Chun, T. M. Tsai, Po‐Tsun Liu, C. W. Chen, & Tseung‐Yuen Tseng. (2004). Study on the effect of electron beam curing on low-K porous organosilicate glass (OSG) material. Thin Solid Films. 469-470. 383–387. 14 indexed citations

Chang, Tien‐Chun, T. M. Tsai, Po‐Tsun Liu, et al.. (2003). CMP of ultra low-k material porous-polysilazane (PPSZ) for interconnect applications. Thin Solid Films. 447-448. 524–530. 10 indexed citations

10.

Chang, Tien‐Chun, Shubin Yan, Po‐Tsun Liu, et al.. (2003). A Novel Approach of Fabricating Germanium Nanocrystals for Nonvolatile Memory Application. Electrochemical and Solid-State Letters. 7(1). G17–G17. 42 indexed citations

11.

Chen, C. W., Tien‐Chun Chang, Po‐Tsun Liu, et al.. (2003). Investigation of the electrical properties and reliability of amorphous SiCN. Thin Solid Films. 447-448. 632–637. 22 indexed citations

12.

Chang, Ting‐Chang, Y. S. Mor, Po‐Tsun Liu, et al.. (2002). Recovering Dielectric Loss of Low Dielectric Constant Organic Siloxane during the Photoresist Removal Process. Journal of The Electrochemical Society. 149(8). F81–F81. 33 indexed citations

13.

Chang, Tien‐Chun, T. M. Tsai, Po‐Tsun Liu, et al.. (2002). The novel pattern method of low-k hybrid-organic-siloxane-polymer film using X-ray exposure. Thin Solid Films. 420-421. 403–407. 12 indexed citations

14.

Chang, Ting‐Chang, Y. S. Mor, Po‐Tsun Liu, et al.. (2002). Preventing dielectric damage of low-k organic siloxane by passivation treatment. Microelectronic Engineering. 60(3-4). 469–475. 9 indexed citations

15.

Chang, Ting‐Chang, Y. S. Mor, Po‐Tsun Liu, et al.. (2002). Trimethylchlorosilane Treatment of Ultralow Dielectric Constant Material after Photoresist Removal Processing. Journal of The Electrochemical Society. 149(10). F145–F145. 14 indexed citations

16.

Chang, Ting‐Chang, Y. S. Mor, Po‐Tsun Liu, et al.. (2001). Improvement of low dielectric constant methylsilsesquioxane by boron implantation treatment. Thin Solid Films. 398-399. 637–640. 6 indexed citations

17.

Chang, Tien‐Chun, Y. S. Mor, Po‐Tsun Liu, et al.. (2001). Enhancing the resistance of low-k hydrogen silsesquioxane (HSQ) to wet stripper damage. Thin Solid Films. 398-399. 523–526. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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