C. Punset
Impact in
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- Plasma Applications and Diagnostics
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- Plasma Diagnostics and Applications
- Electrohydrodynamics and Fluid Dynamics
- Aerosol Filtration and Electrostatic Precipitation
- Electrostatic Discharge in Electronics
- Semiconductor materials and devices
Papers in
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- Plasma Diagnostics and Applications 6
- Electrohydrodynamics and Fluid Dynamics 3
- Thin-Film Transistor Technologies 1
- Electromagnetic Compatibility and Noise Suppression 1
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- Plasma Applications and Diagnostics 4
- Co-authors
- Jean-Pierre Bœuf (6 shared papers)H.‐G. Purwins (2 shared papers)L. C. Pitchford (2 shared papers)E. Ammelt (1 shared paper)Henri Doyeux (1 shared paper)Jungwon Kang (1 shared paper)
- Journals
- Journal of Applied Physics (4 papers)IEEE Transactions on Plasma Science (1 paper)Journal de Physique IV (Proceedings) (1 paper)
In The Last Decade
C. Punset
6 papers receiving 449 citations
Peers
Comparison fields: 5 of 23
- Radiology, Nuclear Medicine and Imaging 343
- Electrical and Electronic Engineering 444
- Condensed Matter Physics 30
- Surfaces, Coatings and Films 14
- Computer Networks and Communications 40
Countries citing papers authored by C. Punset
This map shows the geographic impact of C. Punset's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Punset with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Punset more than expected).
Fields of papers citing papers by C. Punset
This network shows the impact of papers produced by C. Punset. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Punset. The network helps show where C. Punset may publish in the future.
Co-authors
The 6 scholars most cited alongside C. Punset, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 133 | |
| 2 | 1999 | 119 | |
| 3 | 1999 | 93 | |
| 4 | 1999 | 88 | |
| 5 | 1997 | 39 | |
| 6 | 2002 | 8 |
About C. Punset
C. Punset is a scholar working on Electrical and Electronic Engineering, Radiology, Nuclear Medicine and Imaging, Atomic and Molecular Physics, and Optics, Materials Chemistry and Infectious Diseases, having authored 6 papers that have together received 480 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (6 papers), Plasma Applications and Diagnostics (4 papers), Electrohydrodynamics and Fluid Dynamics (3 papers), High voltage insulation and dielectric phenomena (1 paper), Atomic and Molecular Physics (1 paper), Thin-Film Transistor Technologies (1 paper) and Electromagnetic Compatibility and Noise Suppression (1 paper). The work is most often cited by research in Radiology, Nuclear Medicine and Imaging (343 citations), Electrical and Electronic Engineering (444 citations), Condensed Matter Physics (30 citations), Surfaces, Coatings and Films (14 citations) and Computer Networks and Communications (40 citations). C. Punset has collaborated with scholars based in France and Germany. Frequent co-authors include Jean-Pierre Bœuf, H.‐G. Purwins, L. C. Pitchford, E. Ammelt, Henri Doyeux and Jungwon Kang. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Plasma Science and Journal de Physique IV (Proceedings).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.