C. Pickering

1.6k citations

40 papers · 1.3k indexed · h-index 16

Impact in

Materials Chemistry top 5%
- Silicon Nanostructures and Photoluminescence
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Thin-Film Transistor Technologies
- Silicon and Solar Cell Technologies

Papers in ⓘ

Electrical and Electronic Engineering 29
- Thin-Film Transistor Technologies 14
- Silicon and Solar Cell Technologies 12
- Semiconductor materials and devices 11
- Advanced Semiconductor Detectors and Materials 3
Computational Mechanics 10
- Surface Roughness and Optical Measurements 7

Co-authors: Leigh Canham (3 shared papers)M.I.J. Beale (4 shared papers)R. Greef (5 shared papers)D. J. Robbins (3 shared papers)J.M. Keen (2 shared papers)Wai Yie Leong (4 shared papers)Peter J. G. Pearson (3 shared papers)M. R. Houlton (1 shared paper)
Journals: Thin Solid Films (6 papers)Journal of Crystal Growth (5 papers)Materials Science and Engineering B (3 papers)Applied Surface Science (2 papers)Applied Physics Letters (2 papers)
Partner nations: United Kingdom India France

In The Last Decade

C. Pickering

38 papers receiving 1.2k citations

Peers

Countries citing papers authored by C. Pickering

Since Specialization

Citations

This map shows the geographic impact of C. Pickering's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Pickering with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Pickering more than expected).

Fields of papers citing papers by C. Pickering

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Pickering. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Pickering. The network helps show where C. Pickering may publish in the future.

Co-authors

The 25 scholars most cited alongside C. Pickering, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Pickering Line = papers co-authored together C. Pickering links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Atmospheric impregnation of porous silicon at room temperature Journal of Applied Physics ·Leigh Canham, M. R. Houlton, Wai Yie Leong, C. Pickering, J.M. Keen	1991	315
2	Optical studies of the structure of porous silicon films formed in p-type degenerate and non-degenerate silicon Journal of Physics C Solid State Physics ·C. Pickering, M.I.J. Beale, D. J. Robbins, Peter J. G. Pearson, R. Greef	1984	250
3	Luminescent anodized silicon aerocrystal networks prepared by supercritical drying Nature ·Leigh Canham, A. G. Cullis, C. Pickering, O. D. Dosser, T. I. Cox, Tom Lynch	1994	148
4	Optical properties of porous silicon films Thin Solid Films ·C. Pickering, M.I.J. Beale, D. J. Robbins, Peter J. G. Pearson, R. Greef	1985	70
5	Surface topography changes during the growth of GaAs by molecular beam epitaxy Applied Physics Letters ·G. W. Smith, A. J. Pidduck, C. R. Whitehouse, J. L. Glasper, A.M. Keir, C. Pickering	1991	59
6	The characterisation of porous silicon by Raman spectroscopy Semiconductor Science and Technology ·Stephen R. Goodes, Tim Jenkins, M.I.J. Beale, J. D. Benjamin, C. Pickering	1988	50
7	Porous silicon films: Preparation and examination with surface and optical methods Surface Science ·R. W. Hardeman, M.I.J. Beale, D. B. Gasson, J.M. Keen, C. Pickering, D. J. Robbins	1985	42
8	Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures Applied Surface Science ·C. Pickering, Leigh Canham, D. Brumhead	1993	39
9	Dielectric function spectra of strained and relaxed Si1−xGex alloys (x=0–0.25) Journal of Applied Physics ·C. Pickering, R. T. Carline	1994	39
10	Modelling of high temperature optical constants and surface roughness evolution during MOVPE growth of GaN using in-situ spectral reflectometry Journal of Crystal Growth ·R.S. Balmer, C. Pickering, A.J. Pidduck, Trevor Martin	2002	29
11	Spectroscopic ellipsometry of epitaxial Si {100} surfaces Applied Physics Letters ·V. Nayar, Wai Yie Leong, C. Pickering, A. J. Pidduck, R. T. Carline, David Robbins	1992	25
12	In-situ light scattering studies of substrate cleaning and layer nucleation in silicon MBE Journal of Crystal Growth ·David J. Robbins, A. J. Pidduck, A. G. Cullis, N. G. Chew, R. W. Hardeman, D. B. Gasson, C. Pickering, A.C. Daw, Matthew Johnson, R. Jones	1987	22
13	In situ optical monitoring of AlGaN thickness and composition during MOVPE growth of AlGaN/GaN microwave HFETs Journal of Crystal Growth ·R.S. Balmer, C. Pickering, A.M. Kier, J.C.H. Birbeck, M. K. Saker, Trevor Martin	2001	19
14	Complementary in-situ and post-deposition diagnostics of thin film semiconductor structures Thin Solid Films ·C. Pickering	1998	18
15	In Situ Laser Light Scattering: II . Relationship to Silicon Surface Topography Journal of The Electrochemical Society ·A. J. Pidduck, David J. Robbins, D. B. Gasson, C. Pickering, J. L. Glasper	1989	15
16	Determination of properties of thin thermal SiO2 on silicon by spectroscopic ellipsometry Thin Solid Films ·V. Nayar, C. Pickering, Andrèa M. Hodge	1991	15
17	Round robin investigation of silicon oxide on silicon reference materials for ellipsometry Applied Surface Science ·Jan Vanhellemont, H.E. Maes, Marc Schaekers, A. Armigliato, H. Cerva, A.G. Cullis, J. de Sande, H.W. Dinges, J. Hallais, V. Nayar, C. Pickering, J.L. Stehlé, J. van Landuyt, Christopher Walker, H. W. Werner, P. Salieri	1993	12
18	The measurement of surface boron on silicon wafers annealed in vacuum and gas ambients Thin Solid Films ·David Robbins, A. J. Pidduck, J. L. Glasper, Iain M. Young, C. Pickering	1989	10
19	Variation of carrier concentration in Pb_0.8Sn_0.2Te with annealing and growth temperature Journal of Physics D Applied Physics ·C. Pickering, W.R. Harding, N G Geeves, M. L. Young	1977	10
20	Characterisation of rough silicon surfaces using spectroscopic ellipsometry, reflectance, scanning electron microscopy and scattering measurements Materials Science and Engineering B ·C. Pickering, R. Greef, Andrèa M. Hodge	1990	10

About C. Pickering

C. Pickering is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Materials Chemistry, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 40 papers that have together received 1.3k indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (14 papers), Silicon Nanostructures and Photoluminescence (13 papers), Silicon and Solar Cell Technologies (12 papers), Semiconductor materials and devices (11 papers), Semiconductor Quantum Structures and Devices (7 papers), Surface Roughness and Optical Measurements (7 papers), Semiconductor materials and interfaces (4 papers) and Advanced Semiconductor Detectors and Materials (3 papers). The work is most often cited by research in Materials Chemistry (1.0k citations), Electrical and Electronic Engineering (1.0k citations), Biomedical Engineering (764 citations), Atomic and Molecular Physics, and Optics (257 citations) and Surfaces, Coatings and Films (48 citations). C. Pickering has collaborated with scholars based in United Kingdom, India and France. Frequent co-authors include Leigh Canham, M.I.J. Beale, R. Greef, D. J. Robbins, J.M. Keen, Wai Yie Leong, Peter J. G. Pearson, M. R. Houlton, R. T. Carline and O. D. Dosser. Their work appears in journals such as Thin Solid Films, Journal of Crystal Growth, Materials Science and Engineering B, Applied Surface Science and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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