C. Pickering

1.6k total citations
40 papers, 1.3k citations indexed

About

C. Pickering is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, C. Pickering has authored 40 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 21 papers in Materials Chemistry and 10 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in C. Pickering's work include Thin-Film Transistor Technologies (14 papers), Silicon Nanostructures and Photoluminescence (13 papers) and Silicon and Solar Cell Technologies (12 papers). C. Pickering is often cited by papers focused on Thin-Film Transistor Technologies (14 papers), Silicon Nanostructures and Photoluminescence (13 papers) and Silicon and Solar Cell Technologies (12 papers). C. Pickering collaborates with scholars based in United Kingdom, India and France. C. Pickering's co-authors include Leigh Canham, M.I.J. Beale, R. Greef, D. J. Robbins, J.M. Keen, Wai Yie Leong, Peter J. G. Pearson, M. R. Houlton, R. T. Carline and A. G. Cullis and has published in prestigious journals such as Nature, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

C. Pickering

38 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. Pickering United Kingdom 16 1.0k 1.0k 764 257 110 40 1.3k
V. Petrova-Koch Germany 17 1.5k 1.5× 1.6k 1.6× 1.1k 1.5× 231 0.9× 92 0.8× 53 1.8k
H. Münder Germany 19 866 0.9× 976 1.0× 733 1.0× 291 1.1× 29 0.3× 41 1.2k
J. M. Macaulay United States 11 663 0.7× 878 0.9× 500 0.7× 161 0.6× 125 1.1× 21 995
A. Halimaoui France 24 1.9k 1.9× 1.9k 1.9× 1.6k 2.0× 293 1.1× 74 0.7× 85 2.3k
G. Pirio United Kingdom 11 355 0.4× 1.2k 1.2× 456 0.6× 329 1.3× 90 0.8× 20 1.4k
I. Balberg Israel 16 898 0.9× 921 0.9× 238 0.3× 211 0.8× 40 0.4× 53 1.2k
L. Nilsson Switzerland 8 304 0.3× 1.1k 1.1× 398 0.5× 228 0.9× 83 0.8× 9 1.2k
K. Barla France 18 1.3k 1.3× 1.2k 1.2× 930 1.2× 298 1.2× 39 0.4× 45 1.6k
G.N. van den Hoven Netherlands 23 1.4k 1.4× 1.1k 1.1× 258 0.3× 537 2.1× 107 1.0× 48 1.8k
B. Salem France 22 1.3k 1.2× 649 0.6× 707 0.9× 752 2.9× 19 0.2× 148 1.6k

Countries citing papers authored by C. Pickering

Since Specialization
Citations

This map shows the geographic impact of C. Pickering's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Pickering with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Pickering more than expected).

Fields of papers citing papers by C. Pickering

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Pickering. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Pickering. The network helps show where C. Pickering may publish in the future.

Co-authorship network of co-authors of C. Pickering

This figure shows the co-authorship network connecting the top 25 collaborators of C. Pickering. A scholar is included among the top collaborators of C. Pickering based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Pickering. C. Pickering is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Fleischer, Anne, et al.. (2024). Interdisciplinary Cancer Rehabilitation eHealth Impact on Quality of Life. Archives of Physical Medicine and Rehabilitation. 105(4). e169–e169.
2.
Pickering, C., et al.. (2002). Non-destructive characterisation of doped Si and SiGe epilayers using FTIR spectroscopic ellipsometry (FTIR-SE). Materials Science and Engineering B. 89(1-3). 146–150. 3 indexed citations
3.
Balmer, R.S., et al.. (2002). Modelling of high temperature optical constants and surface roughness evolution during MOVPE growth of GaN using in-situ spectral reflectometry. Journal of Crystal Growth. 245(3-4). 198–206. 29 indexed citations
4.
Pickering, C.. (2001). Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces. Surface and Interface Analysis. 31(10). 927–937. 6 indexed citations
5.
Robbins, David J., et al.. (2000). In situ optical monitoring for SiGe epitaxy. Journal of Crystal Growth. 209(2-3). 290–296. 2 indexed citations
6.
Carline, R. T., et al.. (1998). Rapid non-invasive temperature measurement of complex Si structures using. 310–314. 1 indexed citations
7.
Pickering, C., et al.. (1995). Real-time monitoring of Si1–xGex heteroepitaxial growth using laser light scattering and spectroscopic ellipsometry. physica status solidi (a). 152(1). 95–102. 3 indexed citations
8.
Pickering, C. & R. T. Carline. (1994). Dielectric function spectra of strained and relaxed Si1−xGex alloys (x=0–0.25). Journal of Applied Physics. 75(9). 4642–4647. 39 indexed citations
9.
Pickering, C., Leigh Canham, & D. Brumhead. (1993). Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures. Applied Surface Science. 63(1-4). 22–26. 39 indexed citations
10.
Pickering, C., et al.. (1992). Characterization studies of low pressure chemical vapour deposition SICARB layers for wide band gap emitters. Materials Science and Engineering B. 11(1-4). 131–137. 2 indexed citations
11.
Pickering, C., et al.. (1992). SiGe materials characterized by high resolution Raman spectroscopy and spectroscopic ellipsometry. Thin Solid Films. 222(1-2). 73–77. 6 indexed citations
12.
Robbins, David, A. J. Pidduck, J. L. Glasper, Iain M. Young, & C. Pickering. (1989). The measurement of surface boron on silicon wafers annealed in vacuum and gas ambients. Thin Solid Films. 183(1-2). 299–306. 10 indexed citations
13.
Pidduck, A. J., David J. Robbins, D. B. Gasson, C. Pickering, & J. L. Glasper. (1989). In Situ Laser Light Scattering: II . Relationship to Silicon Surface Topography. Journal of The Electrochemical Society. 136(10). 3088–3094. 15 indexed citations
14.
Goodes, Stephen R., Tim Jenkins, M.I.J. Beale, J. D. Benjamin, & C. Pickering. (1988). The characterisation of porous silicon by Raman spectroscopy. Semiconductor Science and Technology. 3(5). 483–487. 50 indexed citations
15.
Pickering, C., et al.. (1988). NON-DESTRUCTIVE CHARACTERISATION OF DEVICE PROCESSING OF SILICON-ON-SAPPHIRE (SOS) WAFERS. Le Journal de Physique Colloques. 49(C4). C4–55.
16.
Robbins, David J., A. J. Pidduck, A. G. Cullis, et al.. (1987). In-situ light scattering studies of substrate cleaning and layer nucleation in silicon MBE. Journal of Crystal Growth. 81(1-4). 421–427. 22 indexed citations
17.
Pickering, C., Steve Dixon, D. B. Gasson, David J. Robbins, & Andrèa M. Hodge. (1987). Angle-resolved light scattering studies of silicon-on-sapphire. Journal of Crystal Growth. 84(1). 180–183. 5 indexed citations
18.
19.
Pickering, C., M.I.J. Beale, D. J. Robbins, Peter J. G. Pearson, & R. Greef. (1984). Optical studies of the structure of porous silicon films formed in p-type degenerate and non-degenerate silicon. Journal of Physics C Solid State Physics. 17(35). 6535–6552. 250 indexed citations
20.
Pickering, C., et al.. (1977). Variation of carrier concentration in Pb0.8Sn0.2Te with annealing and growth temperature. Journal of Physics D Applied Physics. 10(6). L73–L77. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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