C. K. Safeer
- Atomic and Molecular Physics, and Optics top 5%
- Materials Chemistry top 10%
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics top 10%
- Co-authors
- Luis E. HuesoFranz HerlingNerea OntosoFèlix CasanovaJosep Ingla‐AynésGilles GaudinS. AuffretM. Reyes Calvo
- Topics
- Graphene research and applications (8 papers)Quantum and electron transport phenomena (8 papers)Magnetic properties of thin films (6 papers)
- Cited by
- Atomic and Molecular Physics, and OpticsCondensed Matter PhysicsElectronic, Optical and Magnetic Materials
- Partner nations
- SpainUnited KingdomFrance
In The Last Decade
C. K. Safeer
14 papers receiving 641 citations
Peers
Comparison fields: 5 of 22
- Atomic and Molecular Physics, and Optics 552
- Materials Chemistry 360
- Electrical and Electronic Engineering 191
- Electronic, Optical and Magnetic Materials 170
- Condensed Matter Physics 157
Countries citing papers authored by C. K. Safeer
This map shows the geographic impact of C. K. Safeer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. K. Safeer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. K. Safeer more than expected).
Fields of papers citing papers by C. K. Safeer
This network shows the impact of papers produced by C. K. Safeer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. K. Safeer. The network helps show where C. K. Safeer may publish in the future.
Co-authorship network of co-authors of C. K. Safeer
This figure shows the co-authorship network connecting the top 25 collaborators of C. K. Safeer. A scholar is included among the top collaborators of C. K. Safeer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. K. Safeer. C. K. Safeer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 10 | |
| 2 | 20 | |
| 3 | 9 | |
| 4 | 2 | |
| 5 | 26 | |
| 6 | 9 | |
| 7 | 16 | |
| 8 | 22 | |
| 9 | 91 | |
| 10 | 175 | |
| 11 | 5 | |
| 12 | 107 | |
| 13 | 143 | |
| 14 | 19 |
About C. K. Safeer
C. K. Safeer is a scholar working on Atomic and Molecular Physics, and Optics, Materials Chemistry and Electronic, Optical and Magnetic Materials, having authored 14 papers that have together received 654 indexed citations. Recurring topics across this work include Graphene research and applications (8 papers), Quantum and electron transport phenomena (8 papers) and Magnetic properties of thin films (6 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (552 citations), Condensed Matter Physics (157 citations) and Electronic, Optical and Magnetic Materials (170 citations). C. K. Safeer has collaborated with scholars based in Spain, United Kingdom and France. Frequent co-authors include Luis E. Hueso, Franz Herling, Nerea Ontoso, Fèlix Casanova, Josep Ingla‐Aynés, Gilles Gaudin, S. Auffret, M. Reyes Calvo, Ioan Mihai Miron and S. Pizzini. Their work appears in journals such as Physical Review Letters, Advanced Materials and Nature Communications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.