Bei Sun
Impact in
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- Fault Detection and Control Systems
- Advanced Control Systems Optimization
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- Industrial Vision Systems and Defect Detection
Papers in
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- Fault Detection and Control Systems 45
- Advanced Control Systems Optimization 28
- Process Optimization and Integration 9
- Industrial Technology and Control Systems 6
- Advanced Algorithms and Applications 5
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- Mineral Processing and Grinding 27
- Co-authors
- Chunhua Yang (27 shared papers)Yonggang Li (40 shared papers)Chunhua Yang (20 shared papers)Weihua Gui (12 shared papers)Hongqiu Zhu (12 shared papers)Yalin Wang (15 shared papers)Keke Huang (10 shared papers)Weihua Gui (7 shared papers)
- Journals
- IEEE Transactions on Instrumentation and Measurement (6 papers)Journal of Process Control (5 papers)IEEE Transactions on Industrial Informatics (4 papers)Process Safety and Environmental Protection (4 papers)Information Sciences (3 papers)
- Partner nations
- ChinaUnited KingdomFinland
In The Last Decade
Bei Sun
89 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 99
- Control and Systems Engineering 548
- Industrial and Manufacturing Engineering 116
- Mechanical Engineering 380
- Analytical Chemistry 76
- Statistics, Probability and Uncertainty 52
Countries citing papers authored by Bei Sun
This map shows the geographic impact of Bei Sun's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bei Sun with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bei Sun more than expected).
Fields of papers citing papers by Bei Sun
This network shows the impact of papers produced by Bei Sun. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bei Sun. The network helps show where Bei Sun may publish in the future.
Co-authors
The 25 scholars most cited alongside Bei Sun, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 105 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 95 | |
| 2 | 2019 | 76 | |
| 3 | 2022 | 72 | |
| 4 | 2021 | 51 | |
| 5 | 2017 | 46 | |
| 6 | 2022 | 46 | |
| 7 | 2022 | 45 | |
| 8 | 2013 | 39 | |
| 9 | 2019 | 35 | |
| 10 | 2018 | 32 | |
| 11 | 2011 | 31 | |
| 12 | 2022 | 29 | |
| 13 | 2019 | 28 | |
| 14 | 2020 | 27 | |
| 15 | 2020 | 22 | |
| 16 | 2022 | 22 | |
| 17 | 2021 | 22 | |
| 18 | 2021 | 21 | |
| 19 | 2018 | 21 | |
| 20 | 2014 | 19 |
About Bei Sun
Bei Sun is a scholar working on Control and Systems Engineering, Mechanical Engineering, Artificial Intelligence, Biomedical Engineering and Analytical Chemistry, having authored 105 papers that have together received 1.2k indexed citations. Recurring topics across this work include Fault Detection and Control Systems (45 papers), Advanced Control Systems Optimization (28 papers), Mineral Processing and Grinding (27 papers), Spectroscopy and Chemometric Analyses (10 papers), Process Optimization and Integration (9 papers), Industrial Technology and Control Systems (6 papers), Advanced Algorithms and Applications (5 papers) and Industrial Vision Systems and Defect Detection (5 papers). The work is most often cited by research in Control and Systems Engineering (548 citations), Industrial and Manufacturing Engineering (116 citations), Mechanical Engineering (380 citations), Analytical Chemistry (76 citations) and Statistics, Probability and Uncertainty (52 citations). Bei Sun has collaborated with scholars based in China, United Kingdom and Finland. Frequent co-authors include Chunhua Yang, Yonggang Li, Chunhua Yang, Weihua Gui, Hongqiu Zhu, Yalin Wang, Keke Huang, Weihua Gui, I.K. Craig and Zhen Zuo. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, Journal of Process Control, IEEE Transactions on Industrial Informatics, Process Safety and Environmental Protection and Information Sciences.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.