Б. Е. Умирзаков

619 total citations
79 papers, 379 citations indexed

About

Б. Е. Умирзаков is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, Б. Е. Умирзаков has authored 79 papers receiving a total of 379 indexed citations (citations by other indexed papers that have themselves been cited), including 41 papers in Electrical and Electronic Engineering, 34 papers in Atomic and Molecular Physics, and Optics and 34 papers in Computational Mechanics. Recurrent topics in Б. Е. Умирзаков's work include Ion-surface interactions and analysis (33 papers), Semiconductor materials and interfaces (27 papers) and Semiconductor materials and devices (12 papers). Б. Е. Умирзаков is often cited by papers focused on Ion-surface interactions and analysis (33 papers), Semiconductor materials and interfaces (27 papers) and Semiconductor materials and devices (12 papers). Б. Е. Умирзаков collaborates with scholars based in Uzbekistan, Azerbaijan and Finland. Б. Е. Умирзаков's co-authors include Flyura Djurabekova, Gunel Imanova, S. H. Jabarov, Y. Miyagawa, Irina Akhmetova, А.В. Труханов, Shenghao Wang, Dilshadbek T. Usmanov, Nizom Farmonov and Ki Buem Kim and has published in prestigious journals such as SHILAP Revista de lepidopterología, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Materials Science and Engineering B.

In The Last Decade

Б. Е. Умирзаков

62 papers receiving 370 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Б. Е. Умирзаков Uzbekistan 12 203 177 170 168 86 79 379
Mansour Aouassa France 15 355 1.7× 145 0.8× 295 1.7× 92 0.5× 271 3.2× 51 536
Abdelmalek Benkouider France 11 163 0.8× 109 0.6× 150 0.9× 133 0.8× 156 1.8× 19 363
Karim Huet France 16 623 3.1× 151 0.9× 240 1.4× 162 1.0× 124 1.4× 77 734
P. I. Geshev Russia 12 132 0.7× 117 0.7× 114 0.7× 68 0.4× 237 2.8× 50 404
Janusz Bogdanowicz Belgium 12 197 1.0× 144 0.8× 144 0.8× 51 0.3× 191 2.2× 42 360
Oleg Kononchuk France 13 401 2.0× 145 0.8× 126 0.7× 111 0.7× 68 0.8× 75 490
В. В. Наумов Russia 10 245 1.2× 95 0.5× 134 0.8× 31 0.2× 64 0.7× 92 339
S. Akiyama Japan 11 300 1.5× 189 1.1× 73 0.4× 20 0.1× 54 0.6× 26 420
O. Yavaş Japan 12 141 0.7× 31 0.2× 116 0.7× 264 1.6× 140 1.6× 18 387
Stefan Kontermann Germany 12 420 2.1× 136 0.8× 278 1.6× 145 0.9× 246 2.9× 39 557

Countries citing papers authored by Б. Е. Умирзаков

Since Specialization
Citations

This map shows the geographic impact of Б. Е. Умирзаков's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Б. Е. Умирзаков with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Б. Е. Умирзаков more than expected).

Fields of papers citing papers by Б. Е. Умирзаков

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Б. Е. Умирзаков. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Б. Е. Умирзаков. The network helps show where Б. Е. Умирзаков may publish in the future.

Co-authorship network of co-authors of Б. Е. Умирзаков

This figure shows the co-authorship network connecting the top 25 collaborators of Б. Е. Умирзаков. A scholar is included among the top collaborators of Б. Е. Умирзаков based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Б. Е. Умирзаков. Б. Е. Умирзаков is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Умирзаков, Б. Е., et al.. (2025). Influence of Implantation of Active Metal Ions on the Composition, Emission and Optical Properties of MgO Films. East European Journal of Physics. 260–264.
2.
Умирзаков, Б. Е., et al.. (2024). Influence of implantation of O2+ ions on the composition and electronic structure of the W(111) surface. Micro and Nano Systems Letters. 12(1).
3.
Imanova, Gunel, S. H. Jabarov, Б. Е. Умирзаков, et al.. (2024). The solid-phase ion-plasma method and thermoelectric properties of thin CrSi2 films. Journal of Materials Science Materials in Electronics. 35(20). 4 indexed citations
4.
Умирзаков, Б. Е., et al.. (2024). Obtaining and studying the composition, structure and properties of nanophases and nanolayers of CoSi 2. Materials Research Innovations. 28(7). 509–520. 2 indexed citations
5.
Imanova, Gunel, et al.. (2024). Formation of thin Crsi 2 films by the solid-phase ion-plasma method and their thermoelectric properties. Materials Research Innovations. 28(4). 221–228. 6 indexed citations
6.
Умирзаков, Б. Е., et al.. (2024). Effect of Low-Energy Implantation of In+ Ions on the Composition and Electronic Structure of Single-Crystal GaP(111). Coatings. 14(10). 1231–1231.
7.
Умирзаков, Б. Е., et al.. (2024). Theoretical and experimental study of plasmon oscillation dispersion in Si and Ge crystals. Optical Materials X. 24. 100354–100354. 2 indexed citations
8.
Умирзаков, Б. Е., et al.. (2023). Study of the dependence of the degree of disordering of the surface layers of Si(111) and Ge(111) single crystals upon bombardment with low-energy ions. SHILAP Revista de lepidopterología. 7(4). 249–255. 2 indexed citations
9.
Умирзаков, Б. Е., et al.. (2023). Obtaining of thin films of manganese silicides on a Si surface by the method of solid-phase deposition and investigation of their electronic structure. Modern Physics Letters B. 37(24). 16 indexed citations
10.
Умирзаков, Б. Е., et al.. (2023). Determination of the Kinetic Characteristics of the Thermal Desorption and Heterogeneous Reaction of Dissociation of Morphine Molecules on the Surface of Oxidized Tungsten. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 17(3). 542–547.
11.
Умирзаков, Б. Е., et al.. (2022). Effect of Deposition of Submonolayer Cs Coatings on the Density of Electronic States and Energy Band Parameters of CoSi2/Si(111). Journal of Nano- and Electronic Physics. 14(2). 2026–1. 11 indexed citations
12.
Умирзаков, Б. Е., et al.. (2022). Composition and Morphology of A Si(111) Surface with a SiO2 Surface Film of Different Thicknesses. Semiconductors. 56(4). 266–268. 1 indexed citations
13.
Умирзаков, Б. Е., et al.. (2020). Effect of the Ba+ Ion Implantation on the Composition and Electronic Properties of MoO3/Mo(111) Films. Technical Physics. 65(5). 795–798. 2 indexed citations
14.
Умирзаков, Б. Е., et al.. (2020). Crystal Structure and Band Gap of Nanoscale Phases of Si Formed at Various Depths of the Near-Surface Region of SiO2. Technical Physics Letters. 46(10). 972–975. 1 indexed citations
15.
Умирзаков, Б. Е., et al.. (2019). Formation of Nanodimensional SiO2 Films on the Surface of a Free Si/Cu Film System by $${\text{O}}_{2}^{ + }$$ Ion Implantation. Technical Physics. 64(6). 881–883. 1 indexed citations
16.
Умирзаков, Б. Е., et al.. (2019). Electronic and Optical Properties of GaAlAs/GaAs Thin Films. Technical Physics. 64(10). 1506–1508. 8 indexed citations
17.
Умирзаков, Б. Е., et al.. (2018). Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 12(5). 902–905. 1 indexed citations
18.
19.
Умирзаков, Б. Е., et al.. (2017). On the creation of ordered nuclei by ion bombardment for obtaining nanoscale si structures on the surface of CaF2 films. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 11(4). 746–748. 16 indexed citations
20.
Умирзаков, Б. Е., et al.. (2015). Effect of Ar+-ion bombardment on the composition and structure of the surface of CoSi2/Si(111) nanofilms. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 9(2). 406–409. 18 indexed citations

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