А. Е. Dolbak

422 citations

26 papers · 349 · h-index 11

Impact in

Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Atomic and Molecular Physics, and Optics top 10%
- Surface and Thin Film Phenomena
- Semiconductor materials and interfaces
- Semiconductor Quantum Structures and Devices

Papers in

Atomic and Molecular Physics, and Optics 22
- Semiconductor materials and interfaces 19
- Surface and Thin Film Phenomena 17
Electrical and Electronic Engineering 16
- Silicon and Solar Cell Technologies 10
- Semiconductor materials and devices 6
- Silicon Carbide Semiconductor Technologies 1

Co-authors: B.Z. Olshanetsky (13 shared papers)S. A. Teys (5 shared papers)R. A. Zhachuk (11 shared papers)Т. А. Гаврилова (3 shared papers)S. I. Stenin (3 shared papers)Timofey V. Perevalov (1 shared paper)V. A. Gritsenko (1 shared paper)O. P. Pchelyakov (3 shared papers)
Journals: Surface Science (6 papers)Journal of Experimental and Theoretical Physics Letters (2 papers)Physical review. B. (1 paper)Journal of Experimental and Theoretical Physics (4 papers)Open Physics (4 papers)
Partner nations: Russia Portugal Germany

In The Last Decade

А. Е. Dolbak

25 papers receiving 343 citations

Peers

Countries citing papers authored by А. Е. Dolbak

Since Specialization

Citations

This map shows the geographic impact of А. Е. Dolbak's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by А. Е. Dolbak with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites А. Е. Dolbak more than expected).

Fields of papers citing papers by А. Е. Dolbak

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by А. Е. Dolbak. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by А. Е. Dolbak. The network helps show where А. Е. Dolbak may publish in the future.

Co-authors

The 19 scholars most cited alongside А. Е. Dolbak, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with А. Е. Dolbak Line = papers co-authored together А. Е. Dolbak links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Effect of nickel on clean silicon surfaces: Transport and structure Surface Science ·А. Е. Dolbak, B.Z. Olshanetsky, S. I. Stenin, S. A. Teys, Т. А. Гаврилова	1989	52
2	Effect of nickel on clean silicon surfaces: Transport and structure Surface Science Letters ·А. Е. Dolbak, B.Z. Olshanetsky, S. I. Stenin, S. A. Teys, Т. А. Гаврилова	1989	39
3	Formation of ordered arrays of Ag nanowires and nanodots on Si(557) surface Surface Science ·R. A. Zhachuk, S. A. Teys, А. Е. Dolbak, B.Z. Olshanetsky	2004	35
4	Co interaction with clean silicon surfaces Surface Science ·А. Е. Dolbak, B.Z. Olshanetsky, S. A. Teys	1997	33
5	The initial stages of NiSi2 epitaxy on clean Si(111), Si(100) and Si(110) surfaces Surface Science ·А. Е. Dolbak, B.Z. Olshanetsky, S. I. Stenin, S. A. Teys, Т. А. Гаврилова	1991	27
6	Structures of clean and nickel-containing high Miller index surfaces of silicon Surface Science ·B.Z. Olshanetsky, A.E. Solovyov, А. Е. Dolbak, А. А. Maslov	1994	21
7	Effect of adsorbed Sn on Ge diffusivity on Si(111) surface Open Physics ·А. Е. Dolbak, B.Z. Olshanetsky	2008	19
8	Atomic and electronic structure of gadolinium oxide The European Physical Journal Applied Physics ·Timofey V. Perevalov, А. Е. Dolbak, Vasilii Aleksandrovich Shvets, V. A. Gritsenko, Tatijana Ivanovna Asanova, С. Б. Эренбург	2013	18
9	Ge diffusion on Si surfaces Open Physics ·А. Е. Dolbak, B.Z. Olshanetsky	2006	16
10	Surface diffusion of Pb on clean Si surfaces Open Physics ·А. Е. Dolbak, R. A. Zhachuk, B.Z. Olshanetsky	2004	11
11	Reflection electron-energy-loss spectroscopy of Fe x Si1 − x thin films Technical Physics Letters ·А. С. Паршин, G.A. Alexandrova, А. Е. Dolbak, O. P. Pchelyakov, B. Z. Ol’shanetskiĭ, С. Г. Овчинников, С. А. Кущенков	2008	11
12	Mechanism of Cu transport along clean Si surfaces Open Physics ·А. Е. Dolbak, R. A. Zhachuk, B.Z. Olshanetsky	2003	10
13	Si(111) strained layers on Ge(111): Evidence for c(2×4) domains Physical review. B. ·R. A. Zhachuk, J. Coutinho, А. Е. Dolbak, Vasily Cherepanov, Bert Voigtländer	2017	10
14	Diffusion of Cu over a clean Si(111) surface Semiconductors ·А. Е. Dolbak, R. A. Zhachuk, B.Z. Olshanetsky	2001	6
15	Diffusion of silver over atomically clean silicon surfaces Journal of Experimental and Theoretical Physics ·А. Е. Dolbak, B. Z. Ol’shanetskiĭ	2013	6
16	Diffusion of tin over clean silicon surfaces Physics of the Solid State ·А. Е. Dolbak, B.Z. Olshanetsky	2010	6
17	Mechanism of copper diffusion over the Si(110) surface Semiconductors ·А. Е. Dolbak, R. A. Zhachuk, B.Z. Olshanetsky	2002	6
18	Reflection electron energy loss spectroscopy in Mn x Si1 − x composite structures Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ·А. С. Паршин, O. P. Pchelyakov, А. Е. Dolbak, B. Z. Ol’shanetskiĭ	2013	5
19	Change in the nature of the Ni diffusion mechanism on the Si(111) surface with adsorption of Co atoms Journal of Experimental and Theoretical Physics Letters ·А. Е. Dolbak, B. Z. Ol’shanetskiĭ, С. А. Тийс, R. A. Zhachuk	1997	4
20	Atomic structure of high Miller index Si(47 35 7) surface Surface Science ·R. A. Zhachuk, А. Е. Dolbak, A. A. Shklyaev	2019	4

About А. Е. Dolbak

А. Е. Dolbak is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering and Materials Chemistry, having authored 26 papers that have together received 349 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (19 papers), Surface and Thin Film Phenomena (17 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Silicon and Solar Cell Technologies (10 papers), Semiconductor materials and devices (6 papers), Nanowire Synthesis and Applications (2 papers), Silicon Nanostructures and Photoluminescence (1 paper) and Silicon Carbide Semiconductor Technologies (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (96 citations), Atomic and Molecular Physics, and Optics (268 citations), Structural Biology (11 citations), Electrical and Electronic Engineering (164 citations) and Materials Chemistry (88 citations). А. Е. Dolbak has collaborated with scholars based in Russia, Portugal and Germany. Frequent co-authors include B.Z. Olshanetsky, S. A. Teys, R. A. Zhachuk, Т. А. Гаврилова, S. I. Stenin, Timofey V. Perevalov, V. A. Gritsenko, O. P. Pchelyakov, С. Б. Эренбург and Bert Voigtländer. Their work appears in journals such as Surface Science, Journal of Experimental and Theoretical Physics Letters, Physical review. B., Journal of Experimental and Theoretical Physics and Open Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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А. Е. Dolbak

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