J. M. Lenssinck

482 total citations
10 papers, 375 citations indexed

About

J. M. Lenssinck is a scholar working on Atomic and Molecular Physics, and Optics, Structural Biology and Surfaces, Coatings and Films. According to data from OpenAlex, J. M. Lenssinck has authored 10 papers receiving a total of 375 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Atomic and Molecular Physics, and Optics, 5 papers in Structural Biology and 3 papers in Surfaces, Coatings and Films. Recurrent topics in J. M. Lenssinck's work include Surface and Thin Film Phenomena (8 papers), Force Microscopy Techniques and Applications (5 papers) and Advanced Electron Microscopy Techniques and Applications (5 papers). J. M. Lenssinck is often cited by papers focused on Surface and Thin Film Phenomena (8 papers), Force Microscopy Techniques and Applications (5 papers) and Advanced Electron Microscopy Techniques and Applications (5 papers). J. M. Lenssinck collaborates with scholars based in Netherlands. J. M. Lenssinck's co-authors include A. J. Hoeven, D. Dijkkamp, E. J. van Loenen, J. Dieleman and R. W. J. Hollering and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Thin Solid Films.

In The Last Decade

J. M. Lenssinck

10 papers receiving 357 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. M. Lenssinck Netherlands	9	309	130	103	82	54	10	375
S. L. Skala United States	8	302 1.0×	157 1.2×	80 0.8×	99 1.2×	40 0.7×	17	371
Paul S. Ho United States	8	330 1.1×	216 1.7×	57 0.6×	103 1.3×	29 0.5×	11	404
Hong-Shi Kuo Taiwan	9	185 0.6×	74 0.6×	144 1.4×	85 1.0×	56 1.0×	11	311
Sang-Il Park United States	7	408 1.3×	130 1.0×	93 0.9×	79 1.0×	111 2.1×	12	479
Uwe Scheithauer Germany	5	189 0.6×	120 0.9×	53 0.5×	113 1.4×	103 1.9×	18	350
D. Loretto United States	10	283 0.9×	233 1.8×	43 0.4×	92 1.1×	96 1.8×	22	383
S. Marklund Sweden	10	235 0.8×	175 1.3×	38 0.4×	115 1.4×	23 0.4×	16	307
Z. Liliental United States	8	192 0.6×	411 3.2×	83 0.8×	124 1.5×	50 0.9×	17	525
S. A. Teys Russia	14	547 1.8×	277 2.1×	123 1.2×	239 2.9×	67 1.2×	62	647
Masafumi Tanimoto Japan	9	284 0.9×	188 1.4×	115 1.1×	70 0.9×	11 0.2×	19	344

Countries citing papers authored by J. M. Lenssinck

Since Specialization

Citations

This map shows the geographic impact of J. M. Lenssinck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. M. Lenssinck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. M. Lenssinck more than expected).

Fields of papers citing papers by J. M. Lenssinck

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. M. Lenssinck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. M. Lenssinck. The network helps show where J. M. Lenssinck may publish in the future.

Co-authorship network of co-authors of J. M. Lenssinck

This figure shows the co-authorship network connecting the top 25 collaborators of J. M. Lenssinck. A scholar is included among the top collaborators of J. M. Lenssinck based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. M. Lenssinck. J. M. Lenssinck is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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10 of 10 papers shown

Lenssinck, J. M., A. J. Hoeven, E. J. van Loenen, & D. Dijkkamp. (1991). Carbon removal from as-received Si samples in ultrahigh vacuum using ultraviolet light and an ozone beam. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(4). 1963–1966. 4 indexed citations

Loenen, E. J. van, D. Dijkkamp, A. J. Hoeven, J. M. Lenssinck, & J. Dieleman. (1990). Nanometer scale structuring of silicon by direct indentation. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(1). 574–576. 22 indexed citations

Dijkkamp, D., A. J. Hoeven, E. J. van Loenen, J. M. Lenssinck, & J. Dieleman. (1990). Morphology and distribution of atomic steps on Si (001) studied with scanning tunneling microscopy. Applied Physics Letters. 56(1). 39–41. 41 indexed citations

Hollering, R. W. J., A. J. Hoeven, & J. M. Lenssinck. (1990). Optical second-harmonic generation study of Si and Ge deposition on Si(001). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(4). 3194–3197. 18 indexed citations

Hoeven, A. J., D. Dijkkamp, E. J. van Loenen, J. M. Lenssinck, & J. Dieleman. (1990). Island and step structures on molecular beam epitaxy grown Si(001) surfaces. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(1). 207–209. 42 indexed citations

Loenen, E. J. van, D. Dijkkamp, A. J. Hoeven, J. M. Lenssinck, & J. Dieleman. (1990). Evidence for tip imaging in scanning tunneling microscopy. Applied Physics Letters. 56(18). 1755–1757. 23 indexed citations

Hoeven, A. J., D. Dijkkamp, J. M. Lenssinck, & E. J. van Loenen. (1990). Scanning tunneling microscopy study of initial stages of silicon molecular beam epitaxy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(5). 3657–3661. 16 indexed citations

Hoeven, A. J., E. J. van Loenen, D. Dijkkamp, J. M. Lenssinck, & J. Dieleman. (1989). Reflection high energy electron diffraction and scanning tunnelling microscopy study of single-domain growth during silicon molecular beam epitaxy on Si(001). Thin Solid Films. 183(1-2). 263–271. 25 indexed citations

Loenen, E. J. van, D. Dijkkamp, A. J. Hoeven, J. M. Lenssinck, & J. Dieleman. (1989). Direct writing in Si with a scanning tunneling microscope. Applied Physics Letters. 55(13). 1312–1314. 57 indexed citations

10.

Hoeven, A. J., J. M. Lenssinck, D. Dijkkamp, E. J. van Loenen, & J. Dieleman. (1989). Scanning-tunneling-microscopy study of single-domain Si(001) surfaces grown by molecular-beam epitaxy. Physical Review Letters. 63(17). 1830–1832. 127 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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