Immediate Impact
2 standout
Citing Papers
Silicon quantum electronics
2013 Standout
The 2012 Plasma Roadmap
2012 Standout
Works of Yao-Ching Ku being referenced
An experimentally validated analytical model for gate line-edge roughness (LER) effects on technology scaling
2001
Author Peers
| Author | Last Decade | Papers | Cites | ||||
|---|---|---|---|---|---|---|---|
| Yao-Ching Ku | 97 | 15 | 24 | 16 | 6 | 107 | |
| Erin Mclellan | 83 | 42 | 50 | 20 | 8 | 114 | |
| Prasanna Khare | 69 | 9 | 15 | 6 | 8 | 94 | |
| A.R. Papazian | 70 | 25 | 20 | 9 | 5 | 90 | |
| J. Simon | 113 | 6 | 40 | 12 | 8 | 128 | |
| R. Cartuyvels | 76 | 9 | 39 | 9 | 5 | 119 | |
| P. Brun | 55 | 8 | 14 | 5 | 6 | 65 | |
| Oleg Gluschenkov | 191 | 5 | 40 | 8 | 9 | 211 | |
| Edward D. Cohen | 52 | 5 | 16 | 13 | 4 | 74 | |
| Saksham Sharma | 28 | 12 | 50 | 19 | 8 | 102 | |
| J.T. Clemens | 82 | 8 | 32 | 10 | 9 | 101 |
All Works
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