Immediate Impact
4 standout
Citing Papers
Stability, Reliability, and Robustness of GaN Power Devices: A Review
2023 Standout
GaN-based power devices: Physics, reliability, and perspectives
2021 Standout
Works of D. Eng being referenced
Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting
2004
Author Peers
| Author | Last Decade | Papers | Cites | |||
|---|---|---|---|---|---|---|
| D. Eng | 93 | 34 | 66 | 11 | 104 | |
| D. Leung | 90 | 33 | 66 | 11 | 101 | |
| B. Chu-Kung | 64 | 40 | 39 | 7 | 73 | |
| K. A. Jones | 42 | 34 | 39 | 12 | 69 | |
| Maurizio Moschetti | 72 | 27 | 69 | 7 | 82 | |
| R. Modica | 103 | 20 | 58 | 20 | 121 | |
| K. Sakuno | 106 | 21 | 54 | 14 | 127 | |
| M. Hattendorf | 83 | 53 | 43 | 7 | 91 | |
| Zhicheng Wu | 146 | 32 | 98 | 16 | 181 | |
| Sheng Jiang | 93 | 23 | 109 | 13 | 123 | |
| Timothy Boles | 99 | 28 | 110 | 13 | 133 |
All Works
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