Immediate Impact

4 standout
Sub-graph 1 of 2

Citing Papers

Stability, Reliability, and Robustness of GaN Power Devices: A Review
2023 Standout
GaN-based power devices: Physics, reliability, and perspectives
2021 Standout
1 intermediate paper

Works of D. Eng being referenced

Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting
2004

Author Peers

Author Last Decade Papers Cites
D. Eng 93 34 66 11 104
D. Leung 90 33 66 11 101
B. Chu-Kung 64 40 39 7 73
K. A. Jones 42 34 39 12 69
Maurizio Moschetti 72 27 69 7 82
R. Modica 103 20 58 20 121
K. Sakuno 106 21 54 14 127
M. Hattendorf 83 53 43 7 91
Zhicheng Wu 146 32 98 16 181
Sheng Jiang 93 23 109 13 123
Timothy Boles 99 28 110 13 133

All Works

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Rankless by CCL
2026