Zaid Al-Ars
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing 47
- Parallel Computing and Optimization Techniques 39
- Embedded Systems Design Techniques 21
- Artificial Intelligence top 2%
- Algorithms and Data Compression 38
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- Integrated Circuits and Semiconductor Failure Analysis 40
- Radiation Effects in Electronics 29
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- Advanced Data Storage Technologies 18
- Software top 10%
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- Genomics and Phylogenetic Studies 35
- Co-authors
- A.J. van de GoorKoen BertelsSaid HamdiouiVlad-Mihai SimaShanshan RenH. Peter HofsteeNauman AhmedM. Rodgers
- Partner nations
- NetherlandsUnited StatesGermany
In The Last Decade
Zaid Al-Ars
157 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 112
- Hardware and Architecture 842
- Artificial Intelligence 492
- Electrical and Electronic Engineering 853
- Computer Networks and Communications 293
- Software 35
Countries citing papers authored by Zaid Al-Ars
This map shows the geographic impact of Zaid Al-Ars's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Zaid Al-Ars with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Zaid Al-Ars more than expected).
Fields of papers citing papers by Zaid Al-Ars
This network shows the impact of papers produced by Zaid Al-Ars. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Zaid Al-Ars. The network helps show where Zaid Al-Ars may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Zaid Al-Ars, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2023 | 9 | |
| 3 | 2023 | 3 | |
| 4 | 2023 | 2 | |
| 5 | 2021 | 26 | |
| 6 | 2020 | 5 | |
| 7 | 2019 | 3 | |
| 8 | 2018 | 4 | |
| 9 | 2018 | 6 | |
| 10 | 2015 | 7 | |
| 11 | 2015 | 23 | |
| 12 | 2015 | 42 | |
| 13 | 2013 | 11 | |
| 14 | 2011 | 7 | |
| 15 | 2009 | 17 | |
| 16 | DRAM fault analysis and test generation | 2005 | 26 |
| 17 | 2004 | 3 | |
| 18 | 2003 | 1 | |
| 19 | 2002 | 2 | |
| 20 | 2001 | 61 |
About Zaid Al-Ars
Zaid Al-Ars is a scholar working on Hardware and Architecture, Computer Networks and Communications and Artificial Intelligence, having authored 168 papers that have together received 1.8k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (47 papers), Integrated Circuits and Semiconductor Failure Analysis (40 papers), Parallel Computing and Optimization Techniques (39 papers), Algorithms and Data Compression (38 papers), Genomics and Phylogenetic Studies (35 papers), Radiation Effects in Electronics (29 papers), Embedded Systems Design Techniques (21 papers) and Advanced Data Storage Technologies (18 papers). The work is most often cited by research in Hardware and Architecture (842 citations), Artificial Intelligence (492 citations) and Electrical and Electronic Engineering (853 citations). Zaid Al-Ars has collaborated with scholars based in Netherlands, United States and Germany. Frequent co-authors include A.J. van de Goor, Koen Bertels, Said Hamdioui, Vlad-Mihai Sima, Shanshan Ren, H. Peter Hofstee, Nauman Ahmed, M. Rodgers, Jianyu Chen and Georgi Gaydadjiev. Their work appears in journals such as Bioinformatics, PLoS ONE and Genome biology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.