Yunhui Yan
- Industrial and Manufacturing Engineering top 0.05%
- Computer Vision and Pattern Recognition top 0.2%
- Mechanical Engineering top 1%
- Civil and Structural Engineering top 1%
- Computational Mechanics top 1%
- Topics
- Industrial Vision Systems and Defect Detection (52 papers)Advanced Neural Network Applications (27 papers)Infrastructure Maintenance and Monitoring (26 papers)
- Cited by
- Industrial and Manufacturing EngineeringComputer Vision and Pattern RecognitionMedia Technology
- Journals
- Journal of Computational PhysicsIEEE Transactions on Industrial ElectronicsIEEE Transactions on Geoscience and Remote Sensing
- Partner nations
- ChinaUnited KingdomUnited States
In The Last Decade
Yunhui Yan
154 papers receiving 5.2k citations
Hit Papers
Peers
Comparison fields: 5 of 123
- Industrial and Manufacturing Engineering 3.1k
- Computer Vision and Pattern Recognition 2.7k
- Mechanical Engineering 1.3k
- Civil and Structural Engineering 1.2k
- Computational Mechanics 1.1k
Countries citing papers authored by Yunhui Yan
This map shows the geographic impact of Yunhui Yan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yunhui Yan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yunhui Yan more than expected).
Fields of papers citing papers by Yunhui Yan
This network shows the impact of papers produced by Yunhui Yan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yunhui Yan. The network helps show where Yunhui Yan may publish in the future.
Co-authorship network of co-authors of Yunhui Yan
This figure shows the co-authorship network connecting the top 25 collaborators of Yunhui Yan. A scholar is included among the top collaborators of Yunhui Yan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yunhui Yan. Yunhui Yan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 2 | |
| 3 | 8 | |
| 4 | 5 | |
| 5 | 6 | |
| 6 | 18 | |
| 7 | 10 | |
| 8 | 7 | |
| 9 | 15 | |
| 10 | 18 | |
| 11 | 3 | |
| 12 | 38 | |
| 13 | 10 | |
| 14 | 12 | |
| 15 | 25 | |
| 16 | 5 | |
| 17 | 65 | |
| 18 | 65 | |
| 19 | 46 | |
| 20 | 20 |
About Yunhui Yan
Yunhui Yan is a scholar working on Industrial and Manufacturing Engineering, Computer Vision and Pattern Recognition and Media Technology, having authored 164 papers that have together received 5.3k indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (52 papers), Advanced Neural Network Applications (27 papers) and Infrastructure Maintenance and Monitoring (26 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (3.1k citations), Computer Vision and Pattern Recognition (2.7k citations) and Media Technology (585 citations). Yunhui Yan has collaborated with scholars based in China, United Kingdom and United States. Frequent co-authors include Kechen Song, Yu He, Qinggang Meng, Hongwen Dong, Liming Huang, Jing Xu, Menghui Niu, Yanqi Bao, Yanyan Wang and Jie Wang. Their work appears in journals such as Journal of Computational Physics, IEEE Transactions on Industrial Electronics and IEEE Transactions on Geoscience and Remote Sensing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.