Yonghyun Park
- Control and Systems Engineering top 1%
- Mechanical Engineering top 5%
- Electrical and Electronic Engineering top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Mechanics of Materials top 10%
- Co-authors
- Sang Bin LeeFernando BrizDaniel FernándezDavid ReigosaJae‐Hoon ShinKonstantinos N. GyftakisChanseung YangSuneel Kumar Kommuri
- Topics
- Machine Fault Diagnosis Techniques (27 papers)Non-Destructive Testing Techniques (22 papers)Electric Motor Design and Analysis (10 papers)
- Cited by
- Control and Systems EngineeringElectronic, Optical and Magnetic MaterialsMechanical Engineering
- Journals
- IEEE Transactions on Industrial ElectronicsLab on a ChipIEEE Transactions on Industry Applications
- Partner nations
- South KoreaSpainUnited Kingdom
In The Last Decade
Yonghyun Park
40 papers receiving 953 citations
Peers
Comparison fields: 5 of 52
- Control and Systems Engineering 704
- Mechanical Engineering 487
- Electrical and Electronic Engineering 487
- Electronic, Optical and Magnetic Materials 244
- Mechanics of Materials 120
Countries citing papers authored by Yonghyun Park
This map shows the geographic impact of Yonghyun Park's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yonghyun Park with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yonghyun Park more than expected).
Fields of papers citing papers by Yonghyun Park
This network shows the impact of papers produced by Yonghyun Park. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yonghyun Park. The network helps show where Yonghyun Park may publish in the future.
Co-authorship network of co-authors of Yonghyun Park
This figure shows the co-authorship network connecting the top 25 collaborators of Yonghyun Park. A scholar is included among the top collaborators of Yonghyun Park based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yonghyun Park. Yonghyun Park is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 10 | |
| 3 | 1 | |
| 4 | 49 | |
| 5 | 46 | |
| 6 | 42 | |
| 7 | 11 | |
| 8 | 33 | |
| 9 | 8 | |
| 10 | 14 | |
| 11 | 11 | |
| 12 | 28 | |
| 13 | 24 | |
| 14 | 40 | |
| 15 | 2 | |
| 16 | 77 | |
| 17 | 52 | |
| 18 | 11 | |
| 19 | 8 | |
| 20 | 2 |
About Yonghyun Park
Yonghyun Park is a scholar working on Control and Systems Engineering, General Engineering and Mechanical Engineering, having authored 41 papers that have together received 973 indexed citations. Recurring topics across this work include Machine Fault Diagnosis Techniques (27 papers), Non-Destructive Testing Techniques (22 papers) and Electric Motor Design and Analysis (10 papers). The work is most often cited by research in Control and Systems Engineering (704 citations), Electronic, Optical and Magnetic Materials (244 citations) and Mechanical Engineering (487 citations). Yonghyun Park has collaborated with scholars based in South Korea, Spain and United Kingdom. Frequent co-authors include Sang Bin Lee, Fernando Briz, Daniel Fernández, David Reigosa, Jae‐Hoon Shin, Konstantinos N. Gyftakis, Chanseung Yang, Suneel Kumar Kommuri, Doosoo Hyun and Muhammad Saad Rafaq. Their work appears in journals such as IEEE Transactions on Industrial Electronics, Lab on a Chip and IEEE Transactions on Industry Applications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.