Yeahia Sarker

18 papers receiving 495 citations

Peers

Yeahia Sarker
Comparison fields: 5 of 106
  • Control and Systems Engineering 205
  • Media Technology 38
  • Safety, Risk, Reliability and Quality 34
  • Electrical and Electronic Engineering 184
  • Artificial Intelligence 90
Replace Lei Ye with:
Lei Ye China
T. J. Mateo Sanguino Spain
Yuanyuan Hu China
Magali Rezende Gouvêa Meireles Brazil
M. Arun India
Debasish Jana India
Salman Ali Pakistan
Andreza Sartori Brazil
Chunyu Hu China
A. B. M. Alim Al Islam Bangladesh
Yeahia Sarker relative to Lei Ye China Lei Ye's profile →
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Citations per year

Countries citing papers authored by Yeahia Sarker

Since Specialization
Citations

This map shows the geographic impact of Yeahia Sarker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yeahia Sarker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yeahia Sarker more than expected).

Fields of papers citing papers by Yeahia Sarker

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yeahia Sarker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yeahia Sarker. The network helps show where Yeahia Sarker may publish in the future.

Co-authors

The 25 scholars most cited alongside Yeahia Sarker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Yeahia Sarker Line = papers co-authored together Yeahia Sarker links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 2021150
2 2020138
3 202180
4 201935
5 202021
6 201913
7 201913
8 202011
9 202010
10 20208
11 20218
12 20237
13 20204
14 20214
15 20193
16 20213
17 20252
18 20211
19 20250

About Yeahia Sarker

Yeahia Sarker is a scholar working on Media Technology, Control and Systems Engineering, Electrical and Electronic Engineering, Atmospheric Science and Computer Vision and Pattern Recognition, having authored 19 papers that have together received 511 indexed citations. Recurring topics across this work include Remote-Sensing Image Classification (5 papers), Remote Sensing and Land Use (4 papers), Power Systems Fault Detection (4 papers), Power System Reliability and Maintenance (3 papers), Silicon Carbide Semiconductor Technologies (2 papers), Photovoltaic System Optimization Techniques (2 papers), Machine Fault Diagnosis Techniques (2 papers) and Power Transformer Diagnostics and Insulation (2 papers). The work is most often cited by research in Control and Systems Engineering (205 citations), Media Technology (38 citations), Safety, Risk, Reliability and Quality (34 citations), Electrical and Electronic Engineering (184 citations) and Artificial Intelligence (90 citations). Yeahia Sarker has collaborated with scholars based in Bangladesh, Australia and United States. Frequent co-authors include Sajal K. Das, Shahriar Rahman Fahim, Subrata K. Sarker, Md. Rafiqul Islam Sheikh, Faisal R. Badal, Md. Hafiz Ahamed, Zinat Tasneem, Michael J. Ryan, Ripon K. Chakrabortty and Dip Kumar Saha. Their work appears in journals such as IEEE Access, Electric Power Systems Research, Education and Information Technologies, International Journal of Remote Sensing and Scientific Reports.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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