Ye Tan

438 total citations
8 papers, 360 citations indexed

About

Ye Tan is a scholar working on Biomedical Engineering, Radiology, Nuclear Medicine and Imaging and Statistics, Probability and Uncertainty. According to data from OpenAlex, Ye Tan has authored 8 papers receiving a total of 360 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Biomedical Engineering, 6 papers in Radiology, Nuclear Medicine and Imaging and 2 papers in Statistics, Probability and Uncertainty. Recurrent topics in Ye Tan's work include Advanced X-ray and CT Imaging (7 papers), Medical Imaging Techniques and Applications (4 papers) and Radiation Dose and Imaging (4 papers). Ye Tan is often cited by papers focused on Advanced X-ray and CT Imaging (7 papers), Medical Imaging Techniques and Applications (4 papers) and Radiation Dose and Imaging (4 papers). Ye Tan collaborates with scholars based in Belgium, China and Denmark. Ye Tan's co-authors include Wim Dewulf, Kim Kiekens, Frank Welkenhuyzen, Jean‐Pierre Kruth, Philip Bleys, André Voet, Leonardo De Chiffre, Jian Zhou and Fuchu Dai and has published in prestigious journals such as CIRP Annals, Applied Sciences and Measurement Science and Technology.

In The Last Decade

Ye Tan

8 papers receiving 339 citations

Peers

Ye Tan
Kim Kiekens Belgium
Ye Tan
Citations per year, relative to Ye Tan Ye Tan (= 1×) peers Kim Kiekens

Countries citing papers authored by Ye Tan

Since Specialization
Citations

This map shows the geographic impact of Ye Tan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ye Tan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ye Tan more than expected).

Fields of papers citing papers by Ye Tan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ye Tan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ye Tan. The network helps show where Ye Tan may publish in the future.

Co-authorship network of co-authors of Ye Tan

This figure shows the co-authorship network connecting the top 25 collaborators of Ye Tan. A scholar is included among the top collaborators of Ye Tan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ye Tan. Ye Tan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

8 of 8 papers shown
1.
Tan, Ye, et al.. (2024). Analysis of Soil–Water Characteristic Curve and Microstructure of Undisturbed Loess. Applied Sciences. 14(8). 3329–3329. 4 indexed citations
2.
Tan, Ye, Kim Kiekens, Frank Welkenhuyzen, et al.. (2014). Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology. Measurement Science and Technology. 25(6). 64014–64014. 22 indexed citations
3.
Welkenhuyzen, Frank, et al.. (2014). Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications. 217–225. 2 indexed citations
4.
Dewulf, Wim, Kim Kiekens, Ye Tan, Frank Welkenhuyzen, & Jean‐Pierre Kruth. (2013). Uncertainty determination and quantification for dimensional measurements with industrial computed tomography. CIRP Annals. 62(1). 535–538. 52 indexed citations
5.
Tan, Ye, Kim Kiekens, Frank Welkenhuyzen, Jean‐Pierre Kruth, & Wim Dewulf. (2012). Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications. Lirias (KU Leuven). 15 indexed citations
6.
Dewulf, Wim, Ye Tan, & Kim Kiekens. (2012). Sense and non-sense of beam hardening correction in CT metrology. CIRP Annals. 61(1). 495–498. 52 indexed citations
7.
Kiekens, Kim, Ye Tan, Frank Welkenhuyzen, Jean‐Pierre Kruth, & Wim Dewulf. (2012). Uncertainty Determination for Dimensional Measurements with Computed Tomography. 6 indexed citations
8.
Kiekens, Kim, Frank Welkenhuyzen, Ye Tan, et al.. (2011). A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology. 22(1). 1–7. 207 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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