Y. Komem

2.5k total citations · 1 hit paper
84 papers, 2.1k citations indexed

About

Y. Komem is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Y. Komem has authored 84 papers receiving a total of 2.1k indexed citations (citations by other indexed papers that have themselves been cited), including 50 papers in Electrical and Electronic Engineering, 47 papers in Materials Chemistry and 26 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Y. Komem's work include Thin-Film Transistor Technologies (21 papers), Semiconductor materials and interfaces (20 papers) and Silicon Nanostructures and Photoluminescence (19 papers). Y. Komem is often cited by papers focused on Thin-Film Transistor Technologies (21 papers), Semiconductor materials and interfaces (20 papers) and Silicon Nanostructures and Photoluminescence (19 papers). Y. Komem collaborates with scholars based in Israel, United States and Germany. Y. Komem's co-authors include Avner Rothschild, R. W. Balluffi, T. Schober, F. Edelman, F. Cosandey, M. Eizenberg, A. Lahav, Nurit Ashkenasy, I. A. Blech and M. Arienzo and has published in prestigious journals such as Advanced Materials, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

Y. Komem

83 papers receiving 2.0k citations

Hit Papers

The effect of grain size on the sensitivity of nanocrysta... 2004 2026 2011 2018 2004 100 200 300 400 500

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Y. Komem Israel 22 1.4k 1.0k 570 471 382 84 2.1k
Yasushiro Nishioka Japan 28 2.3k 1.7× 806 0.8× 456 0.8× 91 0.2× 575 1.5× 197 2.7k
S. Amirthapandian India 26 898 0.6× 1.5k 1.4× 366 0.6× 118 0.3× 121 0.3× 153 2.1k
P. Kúš Slovakia 20 540 0.4× 908 0.9× 269 0.5× 195 0.4× 102 0.3× 119 1.6k
Dilip S. Joag India 30 1.5k 1.1× 2.6k 2.5× 620 1.1× 77 0.2× 235 0.6× 113 3.1k
J. L. Davidson United States 23 597 0.4× 1.2k 1.1× 438 0.8× 111 0.2× 394 1.0× 106 1.6k
F. Cosandey United States 28 1.8k 1.3× 1.2k 1.1× 165 0.3× 54 0.1× 278 0.7× 92 3.0k
A. L. Dawar India 16 1.6k 1.1× 1.4k 1.4× 280 0.5× 63 0.1× 288 0.8× 113 2.0k
Mitsuhiro Katayama Japan 22 706 0.5× 1.1k 1.1× 434 0.8× 117 0.2× 495 1.3× 131 1.7k
J.A. Schaefer Germany 27 1.2k 0.8× 942 0.9× 694 1.2× 39 0.1× 802 2.1× 100 2.3k
Kanji Yasui Japan 21 1.0k 0.7× 1.1k 1.1× 297 0.5× 47 0.1× 199 0.5× 125 1.8k

Countries citing papers authored by Y. Komem

Since Specialization
Citations

This map shows the geographic impact of Y. Komem's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Komem with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Komem more than expected).

Fields of papers citing papers by Y. Komem

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Komem. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Komem. The network helps show where Y. Komem may publish in the future.

Co-authorship network of co-authors of Y. Komem

This figure shows the co-authorship network connecting the top 25 collaborators of Y. Komem. A scholar is included among the top collaborators of Y. Komem based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Komem. Y. Komem is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ankonina, Guy, et al.. (2011). Resolving Bulk and Grain Boundary Transport Properties of TiO2 Thin Films Enabled by Laser‐Induced Anisotropic Morphology. Advanced Materials. 23(29). 3266–3271. 5 indexed citations
2.
Rothschild, Avner, et al.. (2003). Electronic and transport properties of reduced and oxidized nanocrystalline TiO2 films. Applied Physics Letters. 82(4). 574–576. 62 indexed citations
3.
Rothschild, Avner, Y. Komem, & Nurit Ashkenasy. (2002). Quantitative evaluation of chemisorption processes on semiconductors. Journal of Applied Physics. 92(12). 7090–7097. 55 indexed citations
4.
Edelman, F., M. Stölzer, Tal Raz, et al.. (2002). Structure and transport properties of microcrystalline SiGe films. 232–235. 2 indexed citations
5.
Zolotoyabko, E., et al.. (1999). Thickness effect in the atomic ordering of strainedGaxIn1xPlayers. Physical review. B, Condensed matter. 60(15). 11014–11025. 10 indexed citations
6.
Sander, B., E. Zolotoyabko, & Y. Komem. (1995). The dynamics of rocking curves in strained (001) Si crystals undergoing ultrasonic excitation. Journal of Physics D Applied Physics. 28(4A). A287–A290. 8 indexed citations
7.
Zolotoyabko, E., et al.. (1993). Improved strain analysis in semiconductor crystals by x-ray diffractometry enhanced with ultrasound. Applied Physics Letters. 63(11). 1540–1542. 5 indexed citations
8.
Komem, Y., et al.. (1989). Metal/Al/Si contacts formed by eutectic rapid thermal melting. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(3). 1484–1487. 2 indexed citations
9.
Katz, Amnon & Y. Komem. (1988). On the Contacts Formed in Ni-Al-Si System Due to Localized Melting by Means of Rapid Thermal Processing. MRS Proceedings. 100. 1 indexed citations
10.
Komem, Y. & H.B. Harrison. (1987). Effect of heat treatments on the electrical resistivity of polycrystalline silicon films implanted with antimony. Applied Physics Letters. 50(21). 1524–1526. 1 indexed citations
11.
Ganin, E., Y. Komem, & B. Z. Weiss. (1986). The structure of joint zone in an explosively bonded -2Be system. Acta Metallurgica. 34(1). 147–158. 13 indexed citations
12.
Ganin, E., B. Z. Weiss, & Y. Komem. (1986). Martensitic transformation in Cu-2be alloys induced by explosive cladding. Metallurgical Transactions A. 17(11). 1885–1890. 1 indexed citations
13.
Lahav, A., M. Eizenberg, & Y. Komem. (1984). Epitaxial Phases Formation Due to Interaction Between Ni Thin Films and GaAs. MRS Proceedings. 37. 25 indexed citations
14.
Komem, Y. & I. W. Hall. (1981). The effect of germanium ion implantation dose on the amorphization and recrystallization of polycrystalline silicon films. Journal of Applied Physics. 52(11). 6655–6658. 14 indexed citations
15.
Weiss, B. Z., et al.. (1979). Explosive cladding of Cu/Cu systems: An electron microscopy study and a thermomechanical model. Acta Metallurgica. 27(9). 1417–1429. 25 indexed citations
16.
Cosandey, F., Y. Komem, & C. Bauer. (1978). Characterization of [001] tilt boundaries produced by epitaxial growth on bicrystalline substrates of NaCl. physica status solidi (a). 48(2). 555–563. 13 indexed citations
17.
Ganin, E., Y. Komem, & A. Rosen. (1978). Shock induced hardness in α-Iron. Materials Science and Engineering. 33(1). 1–4. 45 indexed citations
18.
Komem, Y.. (1977). An electron microscopy study of arsenic segregation in silicon. Acta Metallurgica. 25(7). 809–814. 3 indexed citations
19.
Balluffi, R. W., Y. Komem, & T. Schober. (1972). Electron microscope studies of grain boundary dislocation behavior. Surface Science. 31. 68–103. 176 indexed citations
20.
Komem, Y., D. G. Brandon, & Michael Rosenbaum. (1969). A versatile uniaxial tensile testing machine. Journal of Physics E Scientific Instruments. 2(9). 823–825. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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